In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase
In the paper we report on a new methodology, which allows measuring in-situ heterogeneous growth rates of hydride phase in films during metal-hydride phase transformation. This optical method is based on infrared imaging of a wedge-shaped thin film during hydrogen loading. In the paper the method is...
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| Veröffentlicht in: | International journal of hydrogen energy 2010-02, Vol.35 (3), p.1296-1299 |
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| container_title | International journal of hydrogen energy |
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| creator | Oguchi, H. Tan, Z. Heilweil, E.J. Bendersky, L.A. |
| description | In the paper we report on a new methodology, which allows measuring in-situ heterogeneous growth rates of hydride phase in films during metal-hydride phase transformation. This optical method is based on infrared imaging of a wedge-shaped thin film during hydrogen loading. In the paper the method is demonstrated for Mg
98.4Ti
1.6 wedge-shaped thin film and main conclusions are supported by results of transmission electron microscopy. The methodology combined with the structural characterizations verified fast formation of MgH
2 layer on top followed by drastically slower growth of the MgH
2 phase. The initial averaged growth rate of the MgH
2 phase was estimated as ∼1.3 nm/s, and as ∼0.03 nm/s subsequently. |
| doi_str_mv | 10.1016/j.ijhydene.2009.11.037 |
| format | Article |
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98.4Ti
1.6 wedge-shaped thin film and main conclusions are supported by results of transmission electron microscopy. The methodology combined with the structural characterizations verified fast formation of MgH
2 layer on top followed by drastically slower growth of the MgH
2 phase. The initial averaged growth rate of the MgH
2 phase was estimated as ∼1.3 nm/s, and as ∼0.03 nm/s subsequently.</description><identifier>ISSN: 0360-3199</identifier><identifier>EISSN: 1879-3487</identifier><identifier>DOI: 10.1016/j.ijhydene.2009.11.037</identifier><identifier>CODEN: IJHEDX</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Alternative fuels. Production and utilization ; Applied sciences ; Electron microscopy ; Energy ; Exact sciences and technology ; Fuels ; Heterogeneous growth ; Hydrides ; Hydrogen ; Hydrogen storage ; In-situ infrared imaging ; Infrared imaging ; Methodology ; Phase transformations ; Thickness gradient thin film ; Thin films</subject><ispartof>International journal of hydrogen energy, 2010-02, Vol.35 (3), p.1296-1299</ispartof><rights>2009 Professor T. Nejat Veziroglu</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c440t-d17ad0424ef302a6cce98dc04ab6da5ab23041e83fd9bdd467fd230cbda996793</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.ijhydene.2009.11.037$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,781,785,3551,27929,27930,46000</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22436697$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Oguchi, H.</creatorcontrib><creatorcontrib>Tan, Z.</creatorcontrib><creatorcontrib>Heilweil, E.J.</creatorcontrib><creatorcontrib>Bendersky, L.A.</creatorcontrib><title>In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase</title><title>International journal of hydrogen energy</title><description>In the paper we report on a new methodology, which allows measuring in-situ heterogeneous growth rates of hydride phase in films during metal-hydride phase transformation. This optical method is based on infrared imaging of a wedge-shaped thin film during hydrogen loading. In the paper the method is demonstrated for Mg
98.4Ti
1.6 wedge-shaped thin film and main conclusions are supported by results of transmission electron microscopy. The methodology combined with the structural characterizations verified fast formation of MgH
2 layer on top followed by drastically slower growth of the MgH
2 phase. The initial averaged growth rate of the MgH
2 phase was estimated as ∼1.3 nm/s, and as ∼0.03 nm/s subsequently.</description><subject>Alternative fuels. Production and utilization</subject><subject>Applied sciences</subject><subject>Electron microscopy</subject><subject>Energy</subject><subject>Exact sciences and technology</subject><subject>Fuels</subject><subject>Heterogeneous growth</subject><subject>Hydrides</subject><subject>Hydrogen</subject><subject>Hydrogen storage</subject><subject>In-situ infrared imaging</subject><subject>Infrared imaging</subject><subject>Methodology</subject><subject>Phase transformations</subject><subject>Thickness gradient thin film</subject><subject>Thin films</subject><issn>0360-3199</issn><issn>1879-3487</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqFkE1PxCAQhonRxPXjLxguxlPrUJAuN43xKzHxomdCYdqy6ZYVupr997KuevVEhnln3nceQs4YlAyYvFyUftFvHI5YVgCqZKwEXu-RGZvXquBiXu-TGXAJBWdKHZKjlBYArAahZqR5GovkpzX1YxtNREf90nR-7OgSpz64MIRuQ9sQc23SOm47PU4YQ5cNwzrRLobPqaerGCymRENLDc1xondIV71JeEIOWjMkPP15j8nb_d3r7WPx_PLwdHvzXFghYCocq40DUQlsOVRGWotq7iwI00hnrkxTcRAM57x1qnFOyLp1-cs2zigla8WPycVub47yvsY06aVPFofBfAfVKsOqAcRVVsqd0saQUsRWr2I-O240A71lqhf6l6neMtWM6cw0D57_WJhkzZCJjdanv-mqElxKtdVd73SY7_3wGHWyHkeLzke0k3bB_2f1BbwXkw8</recordid><startdate>20100201</startdate><enddate>20100201</enddate><creator>Oguchi, H.</creator><creator>Tan, Z.</creator><creator>Heilweil, E.J.</creator><creator>Bendersky, L.A.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20100201</creationdate><title>In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase</title><author>Oguchi, H. ; Tan, Z. ; Heilweil, E.J. ; Bendersky, L.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c440t-d17ad0424ef302a6cce98dc04ab6da5ab23041e83fd9bdd467fd230cbda996793</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Alternative fuels. Production and utilization</topic><topic>Applied sciences</topic><topic>Electron microscopy</topic><topic>Energy</topic><topic>Exact sciences and technology</topic><topic>Fuels</topic><topic>Heterogeneous growth</topic><topic>Hydrides</topic><topic>Hydrogen</topic><topic>Hydrogen storage</topic><topic>In-situ infrared imaging</topic><topic>Infrared imaging</topic><topic>Methodology</topic><topic>Phase transformations</topic><topic>Thickness gradient thin film</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oguchi, H.</creatorcontrib><creatorcontrib>Tan, Z.</creatorcontrib><creatorcontrib>Heilweil, E.J.</creatorcontrib><creatorcontrib>Bendersky, L.A.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>International journal of hydrogen energy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oguchi, H.</au><au>Tan, Z.</au><au>Heilweil, E.J.</au><au>Bendersky, L.A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase</atitle><jtitle>International journal of hydrogen energy</jtitle><date>2010-02-01</date><risdate>2010</risdate><volume>35</volume><issue>3</issue><spage>1296</spage><epage>1299</epage><pages>1296-1299</pages><issn>0360-3199</issn><eissn>1879-3487</eissn><coden>IJHEDX</coden><abstract>In the paper we report on a new methodology, which allows measuring in-situ heterogeneous growth rates of hydride phase in films during metal-hydride phase transformation. This optical method is based on infrared imaging of a wedge-shaped thin film during hydrogen loading. In the paper the method is demonstrated for Mg
98.4Ti
1.6 wedge-shaped thin film and main conclusions are supported by results of transmission electron microscopy. The methodology combined with the structural characterizations verified fast formation of MgH
2 layer on top followed by drastically slower growth of the MgH
2 phase. The initial averaged growth rate of the MgH
2 phase was estimated as ∼1.3 nm/s, and as ∼0.03 nm/s subsequently.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.ijhydene.2009.11.037</doi><tpages>4</tpages></addata></record> |
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| ispartof | International journal of hydrogen energy, 2010-02, Vol.35 (3), p.1296-1299 |
| issn | 0360-3199 1879-3487 |
| language | eng |
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| subjects | Alternative fuels. Production and utilization Applied sciences Electron microscopy Energy Exact sciences and technology Fuels Heterogeneous growth Hydrides Hydrogen Hydrogen storage In-situ infrared imaging Infrared imaging Methodology Phase transformations Thickness gradient thin film Thin films |
| title | In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase |
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