Slew-Rate-Controlled Output Driver Having Constant Transition Time Over Process, Voltage, Temperature, and Output Load Variations
A slew-rate-controlled output driver having a constant transition time irrespective of environmental variations is described in this brief. The proposed output driver employs a capacitive feedback between the output and input of the driver to allow its transition time independent of process, voltage...
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| Veröffentlicht in: | IEEE transactions on circuits and systems. 2, Analog and digital signal processing Analog and digital signal processing, 2007-07, Vol.54 (7), p.601-605 |
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| container_end_page | 605 |
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| container_title | IEEE transactions on circuits and systems. 2, Analog and digital signal processing |
| container_volume | 54 |
| creator | Shin, Soon-Kyun Yu, Wang Jun, Young-Hyun Kim, Jae-Whui Kong, Bai-Sun Lee, Chil-Gee |
| description | A slew-rate-controlled output driver having a constant transition time irrespective of environmental variations is described in this brief. The proposed output driver employs a capacitive feedback between the output and input of the driver to allow its transition time independent of process, voltage, temperature and output load variations. The proposed output driver was designed and fabricated using a 0.13-mum CMOS process. According to our experimental results, the normalized variation on transition time of the proposed output driver due to PVT variations was improved by 74%-80% as compared to the conventional output driver. The comparison result also indicates that the normalized variation on transition time due to output load change from 10 to 100 pF (10 times variation) in typical process, voltage and temperature corners was improved by up to 66%. |
| doi_str_mv | 10.1109/TCSII.2007.895314 |
| format | Article |
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The proposed output driver employs a capacitive feedback between the output and input of the driver to allow its transition time independent of process, voltage, temperature and output load variations. The proposed output driver was designed and fabricated using a 0.13-mum CMOS process. According to our experimental results, the normalized variation on transition time of the proposed output driver due to PVT variations was improved by 74%-80% as compared to the conventional output driver. The comparison result also indicates that the normalized variation on transition time due to output load change from 10 to 100 pF (10 times variation) in typical process, voltage and temperature corners was improved by up to 66%.</description><identifier>ISSN: 1549-7747</identifier><identifier>ISSN: 1057-7130</identifier><identifier>EISSN: 1558-3791</identifier><identifier>DOI: 10.1109/TCSII.2007.895314</identifier><identifier>CODEN: ICSPE5</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Capacitive feedback ; Circuits ; CMOS ; constant transition time ; Corners ; Crosstalk ; Driver circuits ; Drivers ; Electric potential ; Feedback ; Impedance ; Load management ; output driver ; Output feedback ; Resistors ; Semiconductor device noise ; slew-rate control ; Temperature ; Universal Serial Bus ; Voltage</subject><ispartof>IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 2007-07, Vol.54 (7), p.601-605</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-ef5c9435a17c23ddfc4830a4a28fda79541e6632e6cb18a07a5ba3021adaabda3</citedby><cites>FETCH-LOGICAL-c355t-ef5c9435a17c23ddfc4830a4a28fda79541e6632e6cb18a07a5ba3021adaabda3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4273649$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4273649$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Shin, Soon-Kyun</creatorcontrib><creatorcontrib>Yu, Wang</creatorcontrib><creatorcontrib>Jun, Young-Hyun</creatorcontrib><creatorcontrib>Kim, Jae-Whui</creatorcontrib><creatorcontrib>Kong, Bai-Sun</creatorcontrib><creatorcontrib>Lee, Chil-Gee</creatorcontrib><title>Slew-Rate-Controlled Output Driver Having Constant Transition Time Over Process, Voltage, Temperature, and Output Load Variations</title><title>IEEE transactions on circuits and systems. 2, Analog and digital signal processing</title><addtitle>TCSII</addtitle><description>A slew-rate-controlled output driver having a constant transition time irrespective of environmental variations is described in this brief. The proposed output driver employs a capacitive feedback between the output and input of the driver to allow its transition time independent of process, voltage, temperature and output load variations. The proposed output driver was designed and fabricated using a 0.13-mum CMOS process. According to our experimental results, the normalized variation on transition time of the proposed output driver due to PVT variations was improved by 74%-80% as compared to the conventional output driver. The comparison result also indicates that the normalized variation on transition time due to output load change from 10 to 100 pF (10 times variation) in typical process, voltage and temperature corners was improved by up to 66%.</description><subject>Capacitive feedback</subject><subject>Circuits</subject><subject>CMOS</subject><subject>constant transition time</subject><subject>Corners</subject><subject>Crosstalk</subject><subject>Driver circuits</subject><subject>Drivers</subject><subject>Electric potential</subject><subject>Feedback</subject><subject>Impedance</subject><subject>Load management</subject><subject>output driver</subject><subject>Output feedback</subject><subject>Resistors</subject><subject>Semiconductor device noise</subject><subject>slew-rate control</subject><subject>Temperature</subject><subject>Universal Serial Bus</subject><subject>Voltage</subject><issn>1549-7747</issn><issn>1057-7130</issn><issn>1558-3791</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kU1r20AQhkVJofnoDyi9LDm0l8jZT632WNx8GAwuserrMpZGYYOsdXZXCT3mn0eqSw495DQzzDMvDE-WfWF0xhg1l9V8vVjMOKV6VholmPyQHTOlylxow46mXppca6k_ZScxPlDKDRX8OHtZd_ic30HCfO77FHzXYUNWQ9oPifwM7gkDuYUn19-TcR8T9IlUAfrokvM9qdwOyWqCfgVfY4wXZOO7BPd4QSrc7TFAGsI4QP-WuvTQkA0EB1NEPMs-ttBF_Pyvnma_r6-q-W2-XN0s5j-WeS2USjm2qjZSKGC65qJp2lqWgoIEXrYNaKMkw6IQHIt6y0qgGtQWBOUMGoBtA-I0-37I3Qf_OGBMdudijV0HPfoh2tIUnBpt9Eh-e5cUUnHDSzWC5_-BD34I_fiFNYxzoUpdjBA7QHXwMQZs7T64HYQ_llE7ubN_3dnJnT24G2--Hm4cIr7xkmtRSCNeAWptlxE</recordid><startdate>20070701</startdate><enddate>20070701</enddate><creator>Shin, Soon-Kyun</creator><creator>Yu, Wang</creator><creator>Jun, Young-Hyun</creator><creator>Kim, Jae-Whui</creator><creator>Kong, Bai-Sun</creator><creator>Lee, Chil-Gee</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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The proposed output driver employs a capacitive feedback between the output and input of the driver to allow its transition time independent of process, voltage, temperature and output load variations. The proposed output driver was designed and fabricated using a 0.13-mum CMOS process. According to our experimental results, the normalized variation on transition time of the proposed output driver due to PVT variations was improved by 74%-80% as compared to the conventional output driver. The comparison result also indicates that the normalized variation on transition time due to output load change from 10 to 100 pF (10 times variation) in typical process, voltage and temperature corners was improved by up to 66%.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSII.2007.895314</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 1549-7747 |
| ispartof | IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 2007-07, Vol.54 (7), p.601-605 |
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| subjects | Capacitive feedback Circuits CMOS constant transition time Corners Crosstalk Driver circuits Drivers Electric potential Feedback Impedance Load management output driver Output feedback Resistors Semiconductor device noise slew-rate control Temperature Universal Serial Bus Voltage |
| title | Slew-Rate-Controlled Output Driver Having Constant Transition Time Over Process, Voltage, Temperature, and Output Load Variations |
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