Preparation and characterization of p-type hydrogenated amorphous silicon oxide film and its application to solar cell

Thin film wide band gap p-type hydrogenated amorphous silicon (a-Si) oxide (p-a-SiOx:H) materials were prepared at 175°C substrate temperature in a radio frequency plasma enhanced chemical vapor deposition (RF-PECVD) and applied to the window layer of a-Si solar cell. We used nitrous oxide (N2O), hy...

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Veröffentlicht in:Journal of non-crystalline solids 2011-07, Vol.357 (15), p.2826-2832
Hauptverfasser: Yoon, Kichan, Kim, Youngkuk, Park, JinJoo, Shin, Chong Hoon, Baek, Seungshin, Jang, Juyeun, Iftiquar, S.M., Yi, Junsin
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Sprache:eng
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