Dislocation reduction in GaN film using Ga-lean GaN buffer layer and migration enhanced epitaxy

A GaN buffer layer grown under Ga-lean conditions by plasma-assisted molecular beam epitaxy (PAMBE) was used to reduce the dislocation density in a GaN film grown on a sapphire substrate. The Ga-lean buffer, with inclined trench walls on its surface, provided an effective way to bend the propagation...

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Veröffentlicht in:Thin solid films 2011-07, Vol.519 (19), p.6208-6213
Hauptverfasser: Wong, Yuen-Yee, Chang, Edward Yi, Wu, Yue-Han, Hudait, Mantu K., Yang, Tsung-Hsi, Chang, Jet-Rung, Ku, Jui-Tai, Chou, Wu-Ching, Chen, Chiang-Yao, Maa, Jer-Shen, Lin, Yueh-Chin
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Sprache:eng
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