Low propagation loss silicon-on-sapphire waveguides for the mid-infrared
We report record low loss silicon-on-sapphire nanowires for applications to mid infrared optics. We achieve propagation losses as low as 0.8 dB/cm at λ = 1550 nm, ~1.1 to 1.4 dB/cm at λ = 2080 nm and < 2dB/cm at λ = 5.18 μm.
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| Veröffentlicht in: | Optics express 2011-08, Vol.19 (16), p.15212-15220 |
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| container_end_page | 15220 |
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| container_issue | 16 |
| container_start_page | 15212 |
| container_title | Optics express |
| container_volume | 19 |
| creator | Li, Fangxin Jackson, Stuart D Grillet, Christian Magi, Eric Hudson, Darren Madden, Steven J Moghe, Yashodhan O'Brien, Christopher Read, Andrew Duvall, Steven G Atanackovic, Peter Eggleton, Benjamin J Moss, David J |
| description | We report record low loss silicon-on-sapphire nanowires for applications to mid infrared optics. We achieve propagation losses as low as 0.8 dB/cm at λ = 1550 nm, ~1.1 to 1.4 dB/cm at λ = 2080 nm and < 2dB/cm at λ = 5.18 μm. |
| doi_str_mv | 10.1364/OE.19.015212 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 1094-4087 |
| ispartof | Optics express, 2011-08, Vol.19 (16), p.15212-15220 |
| issn | 1094-4087 1094-4087 |
| language | eng |
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| source | MEDLINE; DOAJ Directory of Open Access Journals; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Alma/SFX Local Collection |
| subjects | Aluminum Oxide - chemistry Crystallization Equipment Design Microscopy, Electron, Scanning - methods Nanowires - chemistry Optics and Photonics Photons Refractometry - methods Silicon - chemistry Spectrophotometry - methods Spectrophotometry, Infrared - methods |
| title | Low propagation loss silicon-on-sapphire waveguides for the mid-infrared |
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