Fabrication, thermal and electrical properties of polyphenylene sulphide/copper composites
► Polyphenylene sulphide/copper composites show a low percolation threshold, i.e., about 6 vol% Cu. ► Both pre- and post- glass transition coefficient of thermal expansion (CTE) of composites decreased significantly. ► The microhardness was increased by more than 50% compared to pure PPS matrix. ► T...
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Veröffentlicht in: | Materials chemistry and physics 2011-07, Vol.128 (1), p.114-120 |
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Sprache: | eng |
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Zusammenfassung: | ► Polyphenylene sulphide/copper composites show a low percolation threshold, i.e., about 6 vol% Cu. ► Both pre- and post- glass transition coefficient of thermal expansion (CTE) of composites decreased significantly. ► The microhardness was increased by more than 50% compared to pure PPS matrix. ► The electrical conductivity was increased by about eight orders of magnitude for 18 vol% Cu composite. ► Dielectric constant and dissipation factor of composites measured at MHz was increased to about 6-fold and 70-fold compared to PPS matrix.
The thermal and electrical properties of high performance poly(phenylene sulphide) (PPS) composites reinforced up to 31
vol% Cu particles were investigated to be used as materials for electronic applications. The thermal stability and char yield of the composites increased significantly. Both pre- and post- glass transition coefficient of thermal expansion (CTE) of composites decreased significantly. The microhardness was increased by more than 50% compared to pure PPS matrix. Microhardness and CTE of composites correlated well with the rule of mixtures. A percolation threshold about 6
vol% Cu was obtained. The electrical conductivity was increased by about eight orders of magnitude for 18
vol% composite. Dielectric constant and dissipation factor of composites at 1
MHz was increased by about 6-fold and 70-fold compared to matrix, respectively. They decreased gradually with increasing frequency up to 1
MHz and thereafter, there was insignificant change. The scanning electron microscope showed almost uniform distribution of Cu particles in the matrix. Owing to better dimensional stability and good electrical properties, these composites are very promising for electronic applications. |
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ISSN: | 0254-0584 1879-3312 |
DOI: | 10.1016/j.matchemphys.2011.02.065 |