Testability Analysis and Scalable Test Generation for High-Speed Floating-Point Units

High-speed datapaths in microprocessors and embedded processors contain complex floating-point (FP) arithmetic units which have a critical role in the processor's performance. Although the FP units' complex structure consists of classic integer arithmetic components, the embedded component...

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Veröffentlicht in:	IEEE transactions on computers 2006-11, Vol.55 (11), p.1449-1457
Hauptverfasser:	Xenoulis, G., Psarakis, M., Gizopoulos, D., Paschalis, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Arithmetic datapath testing Faults Filled plastics Floating point arithmetic floating-point unit testing High speed Integers Microprocessors processor testing Test generation Testability testability conditions
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