Experiments Using Continuous Fabrication of IBAD-MgO Based Coated Conductors
The reel-to-reel coated conductor facilities at Los Alamos National Laboratory enable electropolishing, ion-beam assist deposited (IBAD) MgO texturing, buffer layer deposition, REBaCuO pulsed laser deposition and position dependent critical current measurements, all in a continuous fashion. These sy...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2007-06, Vol.17 (2), p.3263-3265 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Matias, V. Gibbons, B.J. Hanisch, J. Steenwelle, R.J.A. Dowden, P. Rowley, J. Coulter, J.Y. Peterson, D. |
| description | The reel-to-reel coated conductor facilities at Los Alamos National Laboratory enable electropolishing, ion-beam assist deposited (IBAD) MgO texturing, buffer layer deposition, REBaCuO pulsed laser deposition and position dependent critical current measurements, all in a continuous fashion. These systems allow development of long-length coated conductors as well as high-throughput experimentation by linear combinatorial design. We discuss how we utilize the deposition systems to obtain thickness profiles and study the properties of the films as a function of thickness. In particular we demonstrate that texture improves with thickness of epitaxial layers, whether homoepitaxial MgO or heteroepitaxial YBCO. |
| doi_str_mv | 10.1109/TASC.2007.899357 |
| format | Article |
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These systems allow development of long-length coated conductors as well as high-throughput experimentation by linear combinatorial design. We discuss how we utilize the deposition systems to obtain thickness profiles and study the properties of the films as a function of thickness. In particular we demonstrate that texture improves with thickness of epitaxial layers, whether homoepitaxial MgO or heteroepitaxial YBCO.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2007.899357</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Buffer layers ; COATINGS ; Combinatorial analysis ; Conductors ; Critical current ; CRYSTAL GROWTH ; Current measurement ; DEPOSITION ; Electric connection. Cables. Wiring ; ELECTRICAL CONDUCTORS ; Electrical engineering. Electrical power engineering ; Electronics ; ELECTROPOLISHING ; Epitaxial layers ; EPITAXY ; Exact sciences and technology ; FABRICATION ; High-temperature superconductors ; Laboratories ; MAGNESIUM OXIDE ; Materials ; MATHEMATICAL ANALYSIS ; Microelectronic fabrication (materials and surfaces technology) ; Optical device fabrication ; Optical pulses ; Position measurement ; Pulse measurements ; Pulsed laser deposition ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Superconducting devices ; superconducting filaments and wires ; superconducting films ; Surface layer ; Texture ; TEXTURES ; Various equipment and components</subject><ispartof>IEEE transactions on applied superconductivity, 2007-06, Vol.17 (2), p.3263-3265</ispartof><rights>2007 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c418t-629745231c050372ebd4a90b069bed33f7d35a355afb46ce4a942e69137cd14b3</citedby><cites>FETCH-LOGICAL-c418t-629745231c050372ebd4a90b069bed33f7d35a355afb46ce4a942e69137cd14b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4278195$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>310,311,315,781,785,790,791,797,23935,23936,25145,27929,27930,54763</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4278195$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19016998$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Matias, V.</creatorcontrib><creatorcontrib>Gibbons, B.J.</creatorcontrib><creatorcontrib>Hanisch, J.</creatorcontrib><creatorcontrib>Steenwelle, R.J.A.</creatorcontrib><creatorcontrib>Dowden, P.</creatorcontrib><creatorcontrib>Rowley, J.</creatorcontrib><creatorcontrib>Coulter, J.Y.</creatorcontrib><creatorcontrib>Peterson, D.</creatorcontrib><title>Experiments Using Continuous Fabrication of IBAD-MgO Based Coated Conductors</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>The reel-to-reel coated conductor facilities at Los Alamos National Laboratory enable electropolishing, ion-beam assist deposited (IBAD) MgO texturing, buffer layer deposition, REBaCuO pulsed laser deposition and position dependent critical current measurements, all in a continuous fashion. 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Electrical power engineering</subject><subject>Electronics</subject><subject>ELECTROPOLISHING</subject><subject>Epitaxial layers</subject><subject>EPITAXY</subject><subject>Exact sciences and technology</subject><subject>FABRICATION</subject><subject>High-temperature superconductors</subject><subject>Laboratories</subject><subject>MAGNESIUM OXIDE</subject><subject>Materials</subject><subject>MATHEMATICAL ANALYSIS</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>Optical device fabrication</subject><subject>Optical pulses</subject><subject>Position measurement</subject><subject>Pulse measurements</subject><subject>Pulsed laser deposition</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Superconducting devices</subject><subject>superconducting filaments and wires</subject><subject>superconducting films</subject><subject>Surface layer</subject><subject>Texture</subject><subject>TEXTURES</subject><subject>Various equipment and components</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkM9LwzAYhoMoOKd3wUsRxFNnfjbJcaubDiY7uJ1DmqajY0tn0oL-92Z2KHj6Pvie7-XlAeAWwRFCUD6txu_5CEPIR0JKwvgZGCDGRIoZYudxhwylAmNyCa5C2EKIqKBsABbTz4P19d66NiTrULtNkjeurV3XdCGZ6cLXRrd145KmSuaT8XP6tlkmEx1sGUHd_gxXdqZtfLgGF5XeBXtzmkOwnk1X-Wu6WL7M8_EiNRSJNs2w5JRhggxkkHBsi5JqCQuYycKWhFS8JEwTxnRV0MzYeKTYZhIRbkpECzIEj33uwTcfnQ2t2tfB2N1OOxtrKyEk4UKyLJL3_8ht03kXyymJMMY0wyhCsIeMb0LwtlKHaET7L4WgOspVR7nqKFf1cuPLwylXB6N3ldfO1OHvT0KUSSkid9dztbX290wxF0gy8g20w4CF</recordid><startdate>20070601</startdate><enddate>20070601</enddate><creator>Matias, V.</creator><creator>Gibbons, B.J.</creator><creator>Hanisch, J.</creator><creator>Steenwelle, R.J.A.</creator><creator>Dowden, P.</creator><creator>Rowley, J.</creator><creator>Coulter, J.Y.</creator><creator>Peterson, D.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Cables. Wiring</topic><topic>ELECTRICAL CONDUCTORS</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electronics</topic><topic>ELECTROPOLISHING</topic><topic>Epitaxial layers</topic><topic>EPITAXY</topic><topic>Exact sciences and technology</topic><topic>FABRICATION</topic><topic>High-temperature superconductors</topic><topic>Laboratories</topic><topic>MAGNESIUM OXIDE</topic><topic>Materials</topic><topic>MATHEMATICAL ANALYSIS</topic><topic>Microelectronic fabrication (materials and surfaces technology)</topic><topic>Optical device fabrication</topic><topic>Optical pulses</topic><topic>Position measurement</topic><topic>Pulse measurements</topic><topic>Pulsed laser deposition</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. 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These systems allow development of long-length coated conductors as well as high-throughput experimentation by linear combinatorial design. We discuss how we utilize the deposition systems to obtain thickness profiles and study the properties of the films as a function of thickness. In particular we demonstrate that texture improves with thickness of epitaxial layers, whether homoepitaxial MgO or heteroepitaxial YBCO.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TASC.2007.899357</doi><tpages>3</tpages></addata></record> |
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| subjects | Applied sciences Buffer layers COATINGS Combinatorial analysis Conductors Critical current CRYSTAL GROWTH Current measurement DEPOSITION Electric connection. Cables. Wiring ELECTRICAL CONDUCTORS Electrical engineering. Electrical power engineering Electronics ELECTROPOLISHING Epitaxial layers EPITAXY Exact sciences and technology FABRICATION High-temperature superconductors Laboratories MAGNESIUM OXIDE Materials MATHEMATICAL ANALYSIS Microelectronic fabrication (materials and surfaces technology) Optical device fabrication Optical pulses Position measurement Pulse measurements Pulsed laser deposition Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Superconducting devices superconducting filaments and wires superconducting films Surface layer Texture TEXTURES Various equipment and components |
| title | Experiments Using Continuous Fabrication of IBAD-MgO Based Coated Conductors |
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