Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements

The interface-wave impedance and ellipticity are wave attributes that interrelate the full waveforms as observed in different components. For each of the fluid/elastic-solid interface waves, i.e., the pseudo-Rayleigh ( pR ) and Stoneley ( St ) waves, the impedance and ellipticity are found to have d...

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Veröffentlicht in:The Journal of the Acoustical Society of America 2011-09, Vol.130 (3), p.1299-1312
Hauptverfasser: van Dalen, K. N., Drijkoningen, G. G., Smeulders, D. M. J., Heller, H. K. J., Glorieux, C., Sarens, B., Verstraeten, B.
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container_issue 3
container_start_page 1299
container_title The Journal of the Acoustical Society of America
container_volume 130
creator van Dalen, K. N.
Drijkoningen, G. G.
Smeulders, D. M. J.
Heller, H. K. J.
Glorieux, C.
Sarens, B.
Verstraeten, B.
description The interface-wave impedance and ellipticity are wave attributes that interrelate the full waveforms as observed in different components. For each of the fluid/elastic-solid interface waves, i.e., the pseudo-Rayleigh ( pR ) and Stoneley ( St ) waves, the impedance and ellipticity are found to have different functional dependencies on Young's modulus and Poisson's ratio. By combining the attributes in a cost function, unique and stable estimates of these parameters can be obtained, particularly when using the St wave. In a validation experiment, the impedance of the laser-excited pR wave is successfully extracted from simultaneous measurements of the normal particle displacement and the fluid pressure at a water/aluminum interface. The displacement is measured using a laser Doppler vibrometer (LDV) and the pressure with a needle hydrophone. Any LDV measurement is perturbed by refractive-index changes along the LDV beam once acoustic waves interfere with the beam. Using a model that accounts for these perturbations, an impedance decrease of 28% with respect to the plane wave impedance of the pR wave is predicted for the water/aluminum configuration. Although this deviation is different for the experimentally extracted impedance, there is excellent agreement between the observed and predicted pR waveforms in both the particle displacement and fluid pressure.
doi_str_mv 10.1121/1.3605537
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_888090749</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1038282757</sourcerecordid><originalsourceid>FETCH-LOGICAL-c437t-926681a88f7e6c9bbc6a75839581c2448e5835d5b599453f993e32921ec2a93b3</originalsourceid><addsrcrecordid>eNp9kctu1jAQhS3Uiv4tLHgB5E0FLFJ8iWN7g4QqblIrNrCOHGcCruIkeJKisuHVcZofUBftajT25zM-cwh5xtkZ54K_5meyYkpJ_YjsuBKsMEqUB2THGONFaavqiBwjXuVWGWkfkyPBjVVMix35fQltWCL1311yfoYUfrk5jAPt0hhpGPJJ5zwUP9010BAnaN3ggbqhpdD3YZqDD_MNXTAM3yiGuPSzG2BckLYBpz4_jTDMt_yUAHFJQCO4ta4X-IQcdq5HeLqvJ-Tr-3dfzj8WF58_fDp_e1H4Uuq5sKKqDHfGdBoqb5vGV06vZpThXpSlgdyoVjXK2lLJzloJUljBwQtnZSNPyItNd0rjjwVwrmNAny1sv62NMcwyXdpMvnyQ5EwaYYRWOqOvNtSnETFBV08pRJduMlSvydS83ieT2ed72aWJ0P4j_0aRgdM94NC7vkt50QH_c9mWlHoVerNxmDd_m9X9U7dw6zvhyj8Y6KzE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1038282757</pqid></control><display><type>article</type><title>Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements</title><source>MEDLINE</source><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><source>AIP Acoustical Society of America</source><creator>van Dalen, K. N. ; Drijkoningen, G. G. ; Smeulders, D. M. J. ; Heller, H. K. J. ; Glorieux, C. ; Sarens, B. ; Verstraeten, B.</creator><creatorcontrib>van Dalen, K. N. ; Drijkoningen, G. G. ; Smeulders, D. M. J. ; Heller, H. K. J. ; Glorieux, C. ; Sarens, B. ; Verstraeten, B.</creatorcontrib><description>The interface-wave impedance and ellipticity are wave attributes that interrelate the full waveforms as observed in different components. For each of the fluid/elastic-solid interface waves, i.e., the pseudo-Rayleigh ( pR ) and Stoneley ( St ) waves, the impedance and ellipticity are found to have different functional dependencies on Young's modulus and Poisson's ratio. By combining the attributes in a cost function, unique and stable estimates of these parameters can be obtained, particularly when using the St wave. In a validation experiment, the impedance of the laser-excited pR wave is successfully extracted from simultaneous measurements of the normal particle displacement and the fluid pressure at a water/aluminum interface. The displacement is measured using a laser Doppler vibrometer (LDV) and the pressure with a needle hydrophone. Any LDV measurement is perturbed by refractive-index changes along the LDV beam once acoustic waves interfere with the beam. Using a model that accounts for these perturbations, an impedance decrease of 28% with respect to the plane wave impedance of the pR wave is predicted for the water/aluminum configuration. Although this deviation is different for the experimentally extracted impedance, there is excellent agreement between the observed and predicted pR waveforms in both the particle displacement and fluid pressure.</description><identifier>ISSN: 0001-4966</identifier><identifier>EISSN: 1520-8524</identifier><identifier>DOI: 10.1121/1.3605537</identifier><identifier>PMID: 21895072</identifier><identifier>CODEN: JASMAN</identifier><language>eng</language><publisher>Melville, NY: Acoustical Society of America</publisher><subject>Acoustical measurements and instrumentation ; Acoustics ; Aluminum ; Beams (radiation) ; Computer Simulation ; Cross-disciplinary physics: materials science; rheology ; Displacement ; Doppler Effect ; Elastic Modulus ; Ellipticity ; Exact sciences and technology ; Feasibility Studies ; Fluid pressure ; Fourier Analysis ; Fundamental areas of phenomenology (including applications) ; Impedance ; Lasers ; Materials science ; Materials testing ; Mathematical models ; Models, Theoretical ; Motion ; Numerical Analysis, Computer-Assisted ; Physics ; Pressure ; Reproducibility of Results ; Sound ; Structural acoustics and vibration ; Time Factors ; Ultrasonics - instrumentation ; Vibration ; Waveforms</subject><ispartof>The Journal of the Acoustical Society of America, 2011-09, Vol.130 (3), p.1299-1312</ispartof><rights>2011 Acoustical Society of America</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c437t-926681a88f7e6c9bbc6a75839581c2448e5835d5b599453f993e32921ec2a93b3</citedby><cites>FETCH-LOGICAL-c437t-926681a88f7e6c9bbc6a75839581c2448e5835d5b599453f993e32921ec2a93b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jasa/article-lookup/doi/10.1121/1.3605537$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>207,208,314,776,780,790,1559,4498,27901,27902,76127</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=24533377$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/21895072$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>van Dalen, K. N.</creatorcontrib><creatorcontrib>Drijkoningen, G. G.</creatorcontrib><creatorcontrib>Smeulders, D. M. J.</creatorcontrib><creatorcontrib>Heller, H. K. J.</creatorcontrib><creatorcontrib>Glorieux, C.</creatorcontrib><creatorcontrib>Sarens, B.</creatorcontrib><creatorcontrib>Verstraeten, B.</creatorcontrib><title>Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements</title><title>The Journal of the Acoustical Society of America</title><addtitle>J Acoust Soc Am</addtitle><description>The interface-wave impedance and ellipticity are wave attributes that interrelate the full waveforms as observed in different components. For each of the fluid/elastic-solid interface waves, i.e., the pseudo-Rayleigh ( pR ) and Stoneley ( St ) waves, the impedance and ellipticity are found to have different functional dependencies on Young's modulus and Poisson's ratio. By combining the attributes in a cost function, unique and stable estimates of these parameters can be obtained, particularly when using the St wave. In a validation experiment, the impedance of the laser-excited pR wave is successfully extracted from simultaneous measurements of the normal particle displacement and the fluid pressure at a water/aluminum interface. The displacement is measured using a laser Doppler vibrometer (LDV) and the pressure with a needle hydrophone. Any LDV measurement is perturbed by refractive-index changes along the LDV beam once acoustic waves interfere with the beam. Using a model that accounts for these perturbations, an impedance decrease of 28% with respect to the plane wave impedance of the pR wave is predicted for the water/aluminum configuration. Although this deviation is different for the experimentally extracted impedance, there is excellent agreement between the observed and predicted pR waveforms in both the particle displacement and fluid pressure.</description><subject>Acoustical measurements and instrumentation</subject><subject>Acoustics</subject><subject>Aluminum</subject><subject>Beams (radiation)</subject><subject>Computer Simulation</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Displacement</subject><subject>Doppler Effect</subject><subject>Elastic Modulus</subject><subject>Ellipticity</subject><subject>Exact sciences and technology</subject><subject>Feasibility Studies</subject><subject>Fluid pressure</subject><subject>Fourier Analysis</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Impedance</subject><subject>Lasers</subject><subject>Materials science</subject><subject>Materials testing</subject><subject>Mathematical models</subject><subject>Models, Theoretical</subject><subject>Motion</subject><subject>Numerical Analysis, Computer-Assisted</subject><subject>Physics</subject><subject>Pressure</subject><subject>Reproducibility of Results</subject><subject>Sound</subject><subject>Structural acoustics and vibration</subject><subject>Time Factors</subject><subject>Ultrasonics - instrumentation</subject><subject>Vibration</subject><subject>Waveforms</subject><issn>0001-4966</issn><issn>1520-8524</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNp9kctu1jAQhS3Uiv4tLHgB5E0FLFJ8iWN7g4QqblIrNrCOHGcCruIkeJKisuHVcZofUBftajT25zM-cwh5xtkZ54K_5meyYkpJ_YjsuBKsMEqUB2THGONFaavqiBwjXuVWGWkfkyPBjVVMix35fQltWCL1311yfoYUfrk5jAPt0hhpGPJJ5zwUP9010BAnaN3ggbqhpdD3YZqDD_MNXTAM3yiGuPSzG2BckLYBpz4_jTDMt_yUAHFJQCO4ta4X-IQcdq5HeLqvJ-Tr-3dfzj8WF58_fDp_e1H4Uuq5sKKqDHfGdBoqb5vGV06vZpThXpSlgdyoVjXK2lLJzloJUljBwQtnZSNPyItNd0rjjwVwrmNAny1sv62NMcwyXdpMvnyQ5EwaYYRWOqOvNtSnETFBV08pRJduMlSvydS83ieT2ed72aWJ0P4j_0aRgdM94NC7vkt50QH_c9mWlHoVerNxmDd_m9X9U7dw6zvhyj8Y6KzE</recordid><startdate>20110901</startdate><enddate>20110901</enddate><creator>van Dalen, K. N.</creator><creator>Drijkoningen, G. G.</creator><creator>Smeulders, D. M. J.</creator><creator>Heller, H. K. J.</creator><creator>Glorieux, C.</creator><creator>Sarens, B.</creator><creator>Verstraeten, B.</creator><general>Acoustical Society of America</general><general>American Institute of Physics</general><scope>IQODW</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>JG9</scope><scope>L7M</scope><scope>7X8</scope></search><sort><creationdate>20110901</creationdate><title>Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements</title><author>van Dalen, K. N. ; Drijkoningen, G. G. ; Smeulders, D. M. J. ; Heller, H. K. J. ; Glorieux, C. ; Sarens, B. ; Verstraeten, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c437t-926681a88f7e6c9bbc6a75839581c2448e5835d5b599453f993e32921ec2a93b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Acoustical measurements and instrumentation</topic><topic>Acoustics</topic><topic>Aluminum</topic><topic>Beams (radiation)</topic><topic>Computer Simulation</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Displacement</topic><topic>Doppler Effect</topic><topic>Elastic Modulus</topic><topic>Ellipticity</topic><topic>Exact sciences and technology</topic><topic>Feasibility Studies</topic><topic>Fluid pressure</topic><topic>Fourier Analysis</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Impedance</topic><topic>Lasers</topic><topic>Materials science</topic><topic>Materials testing</topic><topic>Mathematical models</topic><topic>Models, Theoretical</topic><topic>Motion</topic><topic>Numerical Analysis, Computer-Assisted</topic><topic>Physics</topic><topic>Pressure</topic><topic>Reproducibility of Results</topic><topic>Sound</topic><topic>Structural acoustics and vibration</topic><topic>Time Factors</topic><topic>Ultrasonics - instrumentation</topic><topic>Vibration</topic><topic>Waveforms</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>van Dalen, K. N.</creatorcontrib><creatorcontrib>Drijkoningen, G. G.</creatorcontrib><creatorcontrib>Smeulders, D. M. J.</creatorcontrib><creatorcontrib>Heller, H. K. J.</creatorcontrib><creatorcontrib>Glorieux, C.</creatorcontrib><creatorcontrib>Sarens, B.</creatorcontrib><creatorcontrib>Verstraeten, B.</creatorcontrib><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>The Journal of the Acoustical Society of America</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>van Dalen, K. N.</au><au>Drijkoningen, G. G.</au><au>Smeulders, D. M. J.</au><au>Heller, H. K. J.</au><au>Glorieux, C.</au><au>Sarens, B.</au><au>Verstraeten, B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements</atitle><jtitle>The Journal of the Acoustical Society of America</jtitle><addtitle>J Acoust Soc Am</addtitle><date>2011-09-01</date><risdate>2011</risdate><volume>130</volume><issue>3</issue><spage>1299</spage><epage>1312</epage><pages>1299-1312</pages><issn>0001-4966</issn><eissn>1520-8524</eissn><coden>JASMAN</coden><abstract>The interface-wave impedance and ellipticity are wave attributes that interrelate the full waveforms as observed in different components. For each of the fluid/elastic-solid interface waves, i.e., the pseudo-Rayleigh ( pR ) and Stoneley ( St ) waves, the impedance and ellipticity are found to have different functional dependencies on Young's modulus and Poisson's ratio. By combining the attributes in a cost function, unique and stable estimates of these parameters can be obtained, particularly when using the St wave. In a validation experiment, the impedance of the laser-excited pR wave is successfully extracted from simultaneous measurements of the normal particle displacement and the fluid pressure at a water/aluminum interface. The displacement is measured using a laser Doppler vibrometer (LDV) and the pressure with a needle hydrophone. Any LDV measurement is perturbed by refractive-index changes along the LDV beam once acoustic waves interfere with the beam. Using a model that accounts for these perturbations, an impedance decrease of 28% with respect to the plane wave impedance of the pR wave is predicted for the water/aluminum configuration. Although this deviation is different for the experimentally extracted impedance, there is excellent agreement between the observed and predicted pR waveforms in both the particle displacement and fluid pressure.</abstract><cop>Melville, NY</cop><pub>Acoustical Society of America</pub><pmid>21895072</pmid><doi>10.1121/1.3605537</doi><tpages>14</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0001-4966
ispartof The Journal of the Acoustical Society of America, 2011-09, Vol.130 (3), p.1299-1312
issn 0001-4966
1520-8524
language eng
recordid cdi_proquest_miscellaneous_888090749
source MEDLINE; AIP Journals Complete; Alma/SFX Local Collection; AIP Acoustical Society of America
subjects Acoustical measurements and instrumentation
Acoustics
Aluminum
Beams (radiation)
Computer Simulation
Cross-disciplinary physics: materials science
rheology
Displacement
Doppler Effect
Elastic Modulus
Ellipticity
Exact sciences and technology
Feasibility Studies
Fluid pressure
Fourier Analysis
Fundamental areas of phenomenology (including applications)
Impedance
Lasers
Materials science
Materials testing
Mathematical models
Models, Theoretical
Motion
Numerical Analysis, Computer-Assisted
Physics
Pressure
Reproducibility of Results
Sound
Structural acoustics and vibration
Time Factors
Ultrasonics - instrumentation
Vibration
Waveforms
title Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T19%3A14%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Medium%20characterization%20from%20interface-wave%20impedance%20and%20ellipticity%20using%20simultaneous%20displacement%20and%20pressure%20measurements&rft.jtitle=The%20Journal%20of%20the%20Acoustical%20Society%20of%20America&rft.au=van%20Dalen,%20K.%20N.&rft.date=2011-09-01&rft.volume=130&rft.issue=3&rft.spage=1299&rft.epage=1312&rft.pages=1299-1312&rft.issn=0001-4966&rft.eissn=1520-8524&rft.coden=JASMAN&rft_id=info:doi/10.1121/1.3605537&rft_dat=%3Cproquest_cross%3E1038282757%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1038282757&rft_id=info:pmid/21895072&rfr_iscdi=true