$X-ray diffraction studies of Al sub(x)Ga sub(1-x)N (0 less than or equal to x less than or equal to 1) ternary alloys grown on sapphire substrate$

X-ray diffraction studies of Al sub(x)Ga sub(1-x)N (0 less than or equal to x less than or equal to 1) ternary alloys grown on sapphire substrate

Purpose - The purpose of this paper is to report the structural properties of Al sub(x)a sub(1-x)N (0 less than or equal to x less than or equal to 1) grown on sapphire substrate by means of X-ray diffraction (XRD) technique. The main purpose of this work was to investigate the effects of Al(x) comp...

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Veröffentlicht in:	Microelectronics international 2011-01, Vol.28 (2), p.44-48
Hauptverfasser:	Shiong, Ng Sha, Guan, Ching Chin, Hassan, Zainuriah, Hassan, Haslan Abu
Format:	Artikel
Sprache:	eng
Schlagworte:	Alloy systems Aluminum Crystal structure Devices Diffraction Disorders Reinforced concrete X-rays
Online-Zugang:	Volltext
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