Thermal conductivity of PVD TiAlN films using pulsed photothermal reflectance technique

In the present work, we have measured thermal-conductivity of industrial thin film TiAlN with a thickness of around 3 μm. These films are used in machining industry for cutting tools in order to increase their service life. A series of TiAlN coating with a different Al/Ti atomic ratio were deposited...

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Veröffentlicht in:	Applied physics. A, Materials science & processing Materials science & processing, 2010-11, Vol.101 (3), p.573-577
Hauptverfasser:	Ding, Xing-Zhao, Samani, M. K., Chen, George
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum Austenitic stainless steels Characterization and Evaluation of Materials Coating Condensed Matter Physics Heat transfer Machines Manufacturing Nanotechnology Optical and Electronic Materials Physics Physics and Astronomy Processes Reflectance Reflectivity Surfaces and Interfaces Thermal conductivity Thin Films Titanium Titanium aluminum nitride
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