Temperature Measurement Using the Wedge Method: Comparison and Application to Emissivity Estimation and Compensation

Temperature measurement based on infrared radiation depends on correctly adjusted emissivity. However, emissivity configuration is complex as emissivity is not normally known with precision; it is influenced by radiation reflections and can also vary with the temperature. The wedge method is a tempe...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on instrumentation and measurement 2011-05, Vol.60 (5), p.1768-1778
Hauptverfasser: Usamentiaga, Rubén, García, Daniel F, Molleda, Julio, Bulnes, Francisco G, Pérez, Jesus M
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1778
container_issue 5
container_start_page 1768
container_title IEEE transactions on instrumentation and measurement
container_volume 60
creator Usamentiaga, Rubén
García, Daniel F
Molleda, Julio
Bulnes, Francisco G
Pérez, Jesus M
description Temperature measurement based on infrared radiation depends on correctly adjusted emissivity. However, emissivity configuration is complex as emissivity is not normally known with precision; it is influenced by radiation reflections and can also vary with the temperature. The wedge method is a temperature measurement method which assures the selection of the correct emissivity configuration using an infrared camera to take images of a wedge region. Within the wedge, a virtually closed cavity for radiation is created. Although this method outperforms traditional infrared measurement, no comparison has yet been carried out under real industrial conditions which would provide information about emissivity variations. This paper proposes a method to measure temperature using the wedge method in industrial environments and compares the results with the temperature measurement acquired from a calibrated infrared line scanner. Using the wedge method, it is possible to accurately estimate emissivity profiles under real working conditions. A method to apply these profiles for emissivity compensation is also proposed in this paper. Conclusions give the analysis of the strengths and weaknesses of the two methods and provide recommendations and guidelines for technicians interested in temperature measurement and emissivity estimation and compensation.
doi_str_mv 10.1109/TIM.2010.2089894
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_875084182</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5643925</ieee_id><sourcerecordid>875084182</sourcerecordid><originalsourceid>FETCH-LOGICAL-c322t-4f99bf1bbece9d57f33a0e514fc221e6e6a0ec9f3a748c852dab630a2f7217d63</originalsourceid><addsrcrecordid>eNpdkctLAzEQxoMoWB93wUvw4mk1j83LWyn1AYqXiseQ7s62ke7DJBX8783a4sHT8M38vmGGD6ELSm4oJeZ28fRyw0hWjGijTXmAJlQIVRgp2SGaEEJ1YUohj9FJjB-EECVLNUFpAe0AwaVtAPwCLubaQpfwW_TdCqc14HeoV-Msrfv6Ds_6dnDBx77DrqvxdBg2vnLJZ516PG99jP7Lp288j8m3u8EIjj7o4m_jDB01bhPhfF9P0dv9fDF7LJ5fH55m0-ei4oylomyMWTZ0uYQKTC1Uw7kjIGjZVIxRkCCzrEzDnSp1pQWr3VJy4lijGFW15Kfoerd3CP3nFmKy-bwKNhvXQb-NVitBdEk1y-TVP_Kj34YuH2e1JFwoqnWGyA6qQh9jgMYOIb8Yvi0ldgzB5hDsGILdh5AtlzuLB4A_XMiSGyb4D76NhPQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>860357188</pqid></control><display><type>article</type><title>Temperature Measurement Using the Wedge Method: Comparison and Application to Emissivity Estimation and Compensation</title><source>IEEE Electronic Library (IEL)</source><creator>Usamentiaga, Rubén ; García, Daniel F ; Molleda, Julio ; Bulnes, Francisco G ; Pérez, Jesus M</creator><creatorcontrib>Usamentiaga, Rubén ; García, Daniel F ; Molleda, Julio ; Bulnes, Francisco G ; Pérez, Jesus M</creatorcontrib><description>Temperature measurement based on infrared radiation depends on correctly adjusted emissivity. However, emissivity configuration is complex as emissivity is not normally known with precision; it is influenced by radiation reflections and can also vary with the temperature. The wedge method is a temperature measurement method which assures the selection of the correct emissivity configuration using an infrared camera to take images of a wedge region. Within the wedge, a virtually closed cavity for radiation is created. Although this method outperforms traditional infrared measurement, no comparison has yet been carried out under real industrial conditions which would provide information about emissivity variations. This paper proposes a method to measure temperature using the wedge method in industrial environments and compares the results with the temperature measurement acquired from a calibrated infrared line scanner. Using the wedge method, it is possible to accurately estimate emissivity profiles under real working conditions. A method to apply these profiles for emissivity compensation is also proposed in this paper. Conclusions give the analysis of the strengths and weaknesses of the two methods and provide recommendations and guidelines for technicians interested in temperature measurement and emissivity estimation and compensation.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.2010.2089894</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Calibration ; Cameras ; Compensation ; Emissivity ; Emissivity compensation ; Estimation ; Guidelines ; Infrared ; Infrared radiation ; Materials ; Noise ; Steel ; Strips ; Temperature measurement ; wedge method ; Wedges ; Working conditions</subject><ispartof>IEEE transactions on instrumentation and measurement, 2011-05, Vol.60 (5), p.1768-1778</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) May 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c322t-4f99bf1bbece9d57f33a0e514fc221e6e6a0ec9f3a748c852dab630a2f7217d63</citedby><cites>FETCH-LOGICAL-c322t-4f99bf1bbece9d57f33a0e514fc221e6e6a0ec9f3a748c852dab630a2f7217d63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5643925$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5643925$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Usamentiaga, Rubén</creatorcontrib><creatorcontrib>García, Daniel F</creatorcontrib><creatorcontrib>Molleda, Julio</creatorcontrib><creatorcontrib>Bulnes, Francisco G</creatorcontrib><creatorcontrib>Pérez, Jesus M</creatorcontrib><title>Temperature Measurement Using the Wedge Method: Comparison and Application to Emissivity Estimation and Compensation</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>Temperature measurement based on infrared radiation depends on correctly adjusted emissivity. However, emissivity configuration is complex as emissivity is not normally known with precision; it is influenced by radiation reflections and can also vary with the temperature. The wedge method is a temperature measurement method which assures the selection of the correct emissivity configuration using an infrared camera to take images of a wedge region. Within the wedge, a virtually closed cavity for radiation is created. Although this method outperforms traditional infrared measurement, no comparison has yet been carried out under real industrial conditions which would provide information about emissivity variations. This paper proposes a method to measure temperature using the wedge method in industrial environments and compares the results with the temperature measurement acquired from a calibrated infrared line scanner. Using the wedge method, it is possible to accurately estimate emissivity profiles under real working conditions. A method to apply these profiles for emissivity compensation is also proposed in this paper. Conclusions give the analysis of the strengths and weaknesses of the two methods and provide recommendations and guidelines for technicians interested in temperature measurement and emissivity estimation and compensation.</description><subject>Calibration</subject><subject>Cameras</subject><subject>Compensation</subject><subject>Emissivity</subject><subject>Emissivity compensation</subject><subject>Estimation</subject><subject>Guidelines</subject><subject>Infrared</subject><subject>Infrared radiation</subject><subject>Materials</subject><subject>Noise</subject><subject>Steel</subject><subject>Strips</subject><subject>Temperature measurement</subject><subject>wedge method</subject><subject>Wedges</subject><subject>Working conditions</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkctLAzEQxoMoWB93wUvw4mk1j83LWyn1AYqXiseQ7s62ke7DJBX8783a4sHT8M38vmGGD6ELSm4oJeZ28fRyw0hWjGijTXmAJlQIVRgp2SGaEEJ1YUohj9FJjB-EECVLNUFpAe0AwaVtAPwCLubaQpfwW_TdCqc14HeoV-Msrfv6Ds_6dnDBx77DrqvxdBg2vnLJZ516PG99jP7Lp288j8m3u8EIjj7o4m_jDB01bhPhfF9P0dv9fDF7LJ5fH55m0-ei4oylomyMWTZ0uYQKTC1Uw7kjIGjZVIxRkCCzrEzDnSp1pQWr3VJy4lijGFW15Kfoerd3CP3nFmKy-bwKNhvXQb-NVitBdEk1y-TVP_Kj34YuH2e1JFwoqnWGyA6qQh9jgMYOIb8Yvi0ldgzB5hDsGILdh5AtlzuLB4A_XMiSGyb4D76NhPQ</recordid><startdate>201105</startdate><enddate>201105</enddate><creator>Usamentiaga, Rubén</creator><creator>García, Daniel F</creator><creator>Molleda, Julio</creator><creator>Bulnes, Francisco G</creator><creator>Pérez, Jesus M</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>201105</creationdate><title>Temperature Measurement Using the Wedge Method: Comparison and Application to Emissivity Estimation and Compensation</title><author>Usamentiaga, Rubén ; García, Daniel F ; Molleda, Julio ; Bulnes, Francisco G ; Pérez, Jesus M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c322t-4f99bf1bbece9d57f33a0e514fc221e6e6a0ec9f3a748c852dab630a2f7217d63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Calibration</topic><topic>Cameras</topic><topic>Compensation</topic><topic>Emissivity</topic><topic>Emissivity compensation</topic><topic>Estimation</topic><topic>Guidelines</topic><topic>Infrared</topic><topic>Infrared radiation</topic><topic>Materials</topic><topic>Noise</topic><topic>Steel</topic><topic>Strips</topic><topic>Temperature measurement</topic><topic>wedge method</topic><topic>Wedges</topic><topic>Working conditions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Usamentiaga, Rubén</creatorcontrib><creatorcontrib>García, Daniel F</creatorcontrib><creatorcontrib>Molleda, Julio</creatorcontrib><creatorcontrib>Bulnes, Francisco G</creatorcontrib><creatorcontrib>Pérez, Jesus M</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Usamentiaga, Rubén</au><au>García, Daniel F</au><au>Molleda, Julio</au><au>Bulnes, Francisco G</au><au>Pérez, Jesus M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Temperature Measurement Using the Wedge Method: Comparison and Application to Emissivity Estimation and Compensation</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2011-05</date><risdate>2011</risdate><volume>60</volume><issue>5</issue><spage>1768</spage><epage>1778</epage><pages>1768-1778</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>Temperature measurement based on infrared radiation depends on correctly adjusted emissivity. However, emissivity configuration is complex as emissivity is not normally known with precision; it is influenced by radiation reflections and can also vary with the temperature. The wedge method is a temperature measurement method which assures the selection of the correct emissivity configuration using an infrared camera to take images of a wedge region. Within the wedge, a virtually closed cavity for radiation is created. Although this method outperforms traditional infrared measurement, no comparison has yet been carried out under real industrial conditions which would provide information about emissivity variations. This paper proposes a method to measure temperature using the wedge method in industrial environments and compares the results with the temperature measurement acquired from a calibrated infrared line scanner. Using the wedge method, it is possible to accurately estimate emissivity profiles under real working conditions. A method to apply these profiles for emissivity compensation is also proposed in this paper. Conclusions give the analysis of the strengths and weaknesses of the two methods and provide recommendations and guidelines for technicians interested in temperature measurement and emissivity estimation and compensation.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIM.2010.2089894</doi><tpages>11</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9456
ispartof IEEE transactions on instrumentation and measurement, 2011-05, Vol.60 (5), p.1768-1778
issn 0018-9456
1557-9662
language eng
recordid cdi_proquest_miscellaneous_875084182
source IEEE Electronic Library (IEL)
subjects Calibration
Cameras
Compensation
Emissivity
Emissivity compensation
Estimation
Guidelines
Infrared
Infrared radiation
Materials
Noise
Steel
Strips
Temperature measurement
wedge method
Wedges
Working conditions
title Temperature Measurement Using the Wedge Method: Comparison and Application to Emissivity Estimation and Compensation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-21T13%3A11%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Temperature%20Measurement%20Using%20the%20Wedge%20Method:%20Comparison%20and%20Application%20to%20Emissivity%20Estimation%20and%20Compensation&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Usamentiaga,%20Rube%CC%81n&rft.date=2011-05&rft.volume=60&rft.issue=5&rft.spage=1768&rft.epage=1778&rft.pages=1768-1778&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/TIM.2010.2089894&rft_dat=%3Cproquest_RIE%3E875084182%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=860357188&rft_id=info:pmid/&rft_ieee_id=5643925&rfr_iscdi=true