Detection of Discharge Activities During Pulsed-Electric-Field Food Processing
This paper presents a wavelet-based technique for monitoring food treatment process using pulsed electric field (PEF). The changes in the features of the applied pulses are extracted and used to monitor transient changes like internal arcing inside the processed food and/or the external arcing in th...
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| Veröffentlicht in: | IEEE transactions on industry applications 2010-01, Vol.46 (1), p.16-22 |
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| creator | Gaouda, A.M. El-Hag, A.H. Jayaram, S.H. |
| description | This paper presents a wavelet-based technique for monitoring food treatment process using pulsed electric field (PEF). The changes in the features of the applied pulses are extracted and used to monitor transient changes like internal arcing inside the processed food and/or the external arcing in the high-voltage pulse power supply. Compared to the classical fast Fourier transform, direct application of wavelet transform can be used effectively to predict the closeness of an arcing event and distinguish between internal and external arcing activities. This technique can be used as an integral part to monitor the quality control of the PEF process. |
| doi_str_mv | 10.1109/TIA.2009.2036516 |
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This technique can be used as an integral part to monitor the quality control of the PEF process.</description><identifier>ISSN: 0093-9994</identifier><identifier>EISSN: 1939-9367</identifier><identifier>DOI: 10.1109/TIA.2009.2036516</identifier><identifier>CODEN: ITIACR</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Cells (biology) ; Electrodes ; Fast Fourier transforms ; Food processing ; Foods ; Fourier transforms ; Heat treatment ; Industry Applications Society ; Integrals ; Kaiser's window ; Microorganisms ; Monitoring ; Monitors ; multiresolution analysis ; Power supplies ; pulsed electric field (PEF) ; Pulsed power supplies ; Space vector pulse width modulation ; wavelet transform ; Wavelet transforms</subject><ispartof>IEEE transactions on industry applications, 2010-01, Vol.46 (1), p.16-22</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c354t-d8cafa5a16a4dbcf7b556f563a525e9e62a4140a8b90c4f2f1a9adf12645634f3</citedby><cites>FETCH-LOGICAL-c354t-d8cafa5a16a4dbcf7b556f563a525e9e62a4140a8b90c4f2f1a9adf12645634f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5337941$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,4022,27922,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5337941$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gaouda, A.M.</creatorcontrib><creatorcontrib>El-Hag, A.H.</creatorcontrib><creatorcontrib>Jayaram, S.H.</creatorcontrib><title>Detection of Discharge Activities During Pulsed-Electric-Field Food Processing</title><title>IEEE transactions on industry applications</title><addtitle>TIA</addtitle><description>This paper presents a wavelet-based technique for monitoring food treatment process using pulsed electric field (PEF). The changes in the features of the applied pulses are extracted and used to monitor transient changes like internal arcing inside the processed food and/or the external arcing in the high-voltage pulse power supply. Compared to the classical fast Fourier transform, direct application of wavelet transform can be used effectively to predict the closeness of an arcing event and distinguish between internal and external arcing activities. This technique can be used as an integral part to monitor the quality control of the PEF process.</description><subject>Cells (biology)</subject><subject>Electrodes</subject><subject>Fast Fourier transforms</subject><subject>Food processing</subject><subject>Foods</subject><subject>Fourier transforms</subject><subject>Heat treatment</subject><subject>Industry Applications Society</subject><subject>Integrals</subject><subject>Kaiser's window</subject><subject>Microorganisms</subject><subject>Monitoring</subject><subject>Monitors</subject><subject>multiresolution analysis</subject><subject>Power supplies</subject><subject>pulsed electric field (PEF)</subject><subject>Pulsed power supplies</subject><subject>Space vector pulse width modulation</subject><subject>wavelet transform</subject><subject>Wavelet transforms</subject><issn>0093-9994</issn><issn>1939-9367</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqF0U1LAzEQBuAgCtbqXfCyePG0Ndl87OZY-qGFoj3Uc0izk5qy3dRkV_Dfm1Lx4MVLAskzwwwvQrcEjwjB8nG9GI8KjGU6qOBEnKEBkVTmkoryHA3SD82llOwSXcW4w5gwTtgAvUyhA9M532beZlMXzbsOW8jG6e3TdQ5iNu2Da7fZqm8i1PmsSTw4k88dNHU2977OVsEbiDGpa3RhdXI3P_cQvc1n68lzvnx9WkzGy9xQzrq8roy2mmsiNKs3xpYbzoXlgmpecJAgCs0Iw7raSGyYLSzRUteWFIIlxCwdoodT30PwHz3ETu3T6NA0ugXfR1WVHJecl-xfmQiXuJIkyfs_cuf70KY1VMWFIJKXMiF8Qib4GANYdQhur8OXIlgdg1ApCHUMQv0EkUruTiUOAH45p7SUjNBvw0ODTQ</recordid><startdate>201001</startdate><enddate>201001</enddate><creator>Gaouda, A.M.</creator><creator>El-Hag, A.H.</creator><creator>Jayaram, S.H.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| source | IEEE Electronic Library (IEL) |
| subjects | Cells (biology) Electrodes Fast Fourier transforms Food processing Foods Fourier transforms Heat treatment Industry Applications Society Integrals Kaiser's window Microorganisms Monitoring Monitors multiresolution analysis Power supplies pulsed electric field (PEF) Pulsed power supplies Space vector pulse width modulation wavelet transform Wavelet transforms |
| title | Detection of Discharge Activities During Pulsed-Electric-Field Food Processing |
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