Low-Cost Characterization and Calibration of RF Integrated Circuits through I- Q Data Analysis
Due to the increasing complexity of radio-frequency circuits, their testing becomes more challenging. A large number of performance parameters under several operation conditions are needed in order to ensure compliance to specifications. In this paper, we present a low-cost test methodology that det...
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| Veröffentlicht in: | IEEE transactions on computer-aided design of integrated circuits and systems 2009-07, Vol.28 (7), p.993-1005 |
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| container_title | IEEE transactions on computer-aided design of integrated circuits and systems |
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| creator | Acar, E. Ozev, S. |
| description | Due to the increasing complexity of radio-frequency circuits, their testing becomes more challenging. A large number of performance parameters under several operation conditions are needed in order to ensure compliance to specifications. In this paper, we present a low-cost test methodology that determines significant performance parameters, such as path gain IIP 3 , quadrature imbalances, noise, bit error rate, and error vector magnitude through a single test setup. The proposed test methodology is applicable for both single-carrier and multicarrier systems. Simulation and measurement results indicate that these performance parameters can be calculated and estimated accurately through a single test setup and using a shorter test sequence than required by traditional techniques. In addition, a calibration technique is presented for single-carrier systems to recover marginally failing devices through analytically correcting performance parameters. |
| doi_str_mv | 10.1109/TCAD.2009.2020718 |
| format | Article |
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| identifier | ISSN: 0278-0070 |
| ispartof | IEEE transactions on computer-aided design of integrated circuits and systems, 2009-07, Vol.28 (7), p.993-1005 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Bandwidth Bit error rate Calibration Circuit testing Computer aided design Computer simulation Costs Devices I - Q calibration Integrated circuits Mathematical analysis Methodology Performance analysis Performance gain Radio frequency radio-frequency (RF) testing Radiofrequency integrated circuits Specifications System testing WLAN testing |
| title | Low-Cost Characterization and Calibration of RF Integrated Circuits through I- Q Data Analysis |
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