Toward wafer-scale patterning of freestanding intermetallic nanowires

Individual metal alloy nanowires of constant diameter and high aspect ratio have previously been self-assembled at selected locations on atomic force microscope (AFM) probes by the method reported in Yazdanpanah et al (2005 J. Appl. Phys. 98 073510). This process relies on the room temperature cryst...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Nanotechnology 2011-07, Vol.22 (29), p.295601-295601
Hauptverfasser:	Jalilian, Romaneh, Rivera, Jose, Askari, Davood, Arva, Sreenath, Rathfon, Jeremy M, Cohn, Robert W, Yazdanpanah, Mehdi M
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!