One-Step Selective Chemistry for Silicon-on-Insulator Sensor Geometries
A one-step functionalization process has been developed for oxide-free channels of field effect transistor structures, enabling a self-selective grafting of receptor molecules on the device active area, while protecting the nonactive part from nonspecific attachment of target molecules. Characteriza...
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Veröffentlicht in: | Langmuir 2011-06, Vol.27 (12), p.7337-7340 |
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creator | Seitz, Oliver Fernandes, Poornika G Mahmud, Gazi A Wen, Huang-Chun Stiegler, Harvey J Chapman, Richard A Vogel, Eric M Chabal, Yves J |
description | A one-step functionalization process has been developed for oxide-free channels of field effect transistor structures, enabling a self-selective grafting of receptor molecules on the device active area, while protecting the nonactive part from nonspecific attachment of target molecules. Characterization of the self-organized chemical process is performed on both Si(100) and SiO2 surfaces by infrared and X-ray photoelectron spectroscopy, atomic force microscopy, and electrical measurements. This selective functionalization leads to structures with better chemical stability, reproducibility, and reliability than current SiO2-based devices using silane molecules. |
doi_str_mv | 10.1021/la200471b |
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This selective functionalization leads to structures with better chemical stability, reproducibility, and reliability than current SiO2-based devices using silane molecules.</description><subject>Chemistry</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>Microscopy, Atomic Force</subject><subject>Silicon - chemistry</subject><subject>Spectroscopy, Fourier Transform Infrared</subject><subject>Spectrum Analysis - methods</subject><subject>X-Rays</subject><issn>0743-7463</issn><issn>1520-5827</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNptkE1LAzEQhoMoWqsH_4D0IuJhNd_ZHKVoLRR6qJ6XbDLBLftRk12h_96U1npxGBgYHt4ZHoRuCH4kmJKn2lCMuSLlCRoRQXEmcqpO0QgrzjLFJbtAlzGuMcaacX2OLiiRVOFcjNBs2UK26mEzWUENtq--YTL9hKaKfdhOfBcmq6qubNdmqedtHGrT75bQxjRm0DXQhwriFTrzpo5wfZhj9PH68j59yxbL2Xz6vMgMJ7jPpCU-B-ysZVY4Q1JR5UrtHTeKWo2p1EQr5oWwsnSqFJ5JMNQxZ6SnhI3R_T53E7qvAWJfpFct1LVpoRtikSuipeAiT-TDnrShizGALzahakzYFgQXO23FUVtibw-pQ9mAO5K_nhJwdwBMtKb2wbS2in8cp0Lv7B45Y2Ox7obQJhn_HPwB5beAXg</recordid><startdate>20110621</startdate><enddate>20110621</enddate><creator>Seitz, Oliver</creator><creator>Fernandes, Poornika G</creator><creator>Mahmud, Gazi A</creator><creator>Wen, Huang-Chun</creator><creator>Stiegler, Harvey J</creator><creator>Chapman, Richard A</creator><creator>Vogel, Eric M</creator><creator>Chabal, Yves J</creator><general>American Chemical Society</general><scope>IQODW</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20110621</creationdate><title>One-Step Selective Chemistry for Silicon-on-Insulator Sensor Geometries</title><author>Seitz, Oliver ; Fernandes, Poornika G ; Mahmud, Gazi A ; Wen, Huang-Chun ; Stiegler, Harvey J ; Chapman, Richard A ; Vogel, Eric M ; Chabal, Yves J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a410t-6c1f8e0dcc3c5da111127db9fd4a72c902691973f55c6bd7b5f36ea2d3da6f213</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Chemistry</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>Microscopy, Atomic Force</topic><topic>Silicon - chemistry</topic><topic>Spectroscopy, Fourier Transform Infrared</topic><topic>Spectrum Analysis - methods</topic><topic>X-Rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Seitz, Oliver</creatorcontrib><creatorcontrib>Fernandes, Poornika G</creatorcontrib><creatorcontrib>Mahmud, Gazi A</creatorcontrib><creatorcontrib>Wen, Huang-Chun</creatorcontrib><creatorcontrib>Stiegler, Harvey J</creatorcontrib><creatorcontrib>Chapman, Richard A</creatorcontrib><creatorcontrib>Vogel, Eric M</creatorcontrib><creatorcontrib>Chabal, Yves J</creatorcontrib><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Langmuir</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Seitz, Oliver</au><au>Fernandes, Poornika G</au><au>Mahmud, Gazi A</au><au>Wen, Huang-Chun</au><au>Stiegler, Harvey J</au><au>Chapman, Richard A</au><au>Vogel, Eric M</au><au>Chabal, Yves J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>One-Step Selective Chemistry for Silicon-on-Insulator Sensor Geometries</atitle><jtitle>Langmuir</jtitle><addtitle>Langmuir</addtitle><date>2011-06-21</date><risdate>2011</risdate><volume>27</volume><issue>12</issue><spage>7337</spage><epage>7340</epage><pages>7337-7340</pages><issn>0743-7463</issn><eissn>1520-5827</eissn><coden>LANGD5</coden><abstract>A one-step functionalization process has been developed for oxide-free channels of field effect transistor structures, enabling a self-selective grafting of receptor molecules on the device active area, while protecting the nonactive part from nonspecific attachment of target molecules. 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subjects | Chemistry Exact sciences and technology General and physical chemistry Microscopy, Atomic Force Silicon - chemistry Spectroscopy, Fourier Transform Infrared Spectrum Analysis - methods X-Rays |
title | One-Step Selective Chemistry for Silicon-on-Insulator Sensor Geometries |
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