Application of the Sensitivity Analysis to the Optimal Design of the Microstrip Low-Pass Filter With Defected Ground Structure
This paper shows applied sensitivity analysis for easier design and practical application of a planar half-wavelength low-pass filter (LPF) using defected ground structure (DGS). Typically, it is difficult to deploy planar half-wavelength low-pass filters when high power durability is required becau...
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Veröffentlicht in: | IEEE transactions on magnetics 2009-03, Vol.45 (3), p.1462-1465 |
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creator | BYUN, Jin-Kyu KO, Jae-Hyeong LEE, Hyang-Beom PARK, Jun-Seok KIM, Hyeong-Seok |
description | This paper shows applied sensitivity analysis for easier design and practical application of a planar half-wavelength low-pass filter (LPF) using defected ground structure (DGS). Typically, it is difficult to deploy planar half-wavelength low-pass filters when high power durability is required because of the very narrow line-widths of high impedance transmission line. Here, we propose a new configuration for the high impedance microstrip line using DGS structure to allow broader line width and high power handling capability. The sensitivity of the scattering parameters was calculated using the self-adjoint sensitivity formula in order to determine the proposed filter's dimension. The paper also highlights the validity of the proposed LPF optimization with its measured performance. |
doi_str_mv | 10.1109/TMAG.2009.2012680 |
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Typically, it is difficult to deploy planar half-wavelength low-pass filters when high power durability is required because of the very narrow line-widths of high impedance transmission line. Here, we propose a new configuration for the high impedance microstrip line using DGS structure to allow broader line width and high power handling capability. The sensitivity of the scattering parameters was calculated using the self-adjoint sensitivity formula in order to determine the proposed filter's dimension. The paper also highlights the validity of the proposed LPF optimization with its measured performance.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.2009.2012680</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Circuit analysis ; Cross-disciplinary physics: materials science; rheology ; Defected ground structure (DGS) ; Design engineering ; Design methodology ; Exact sciences and technology ; Grounds ; High impedance ; Impedance ; Low pass filters ; low-pass filter (LPF) ; Magnetism ; Materials science ; Mathematical analysis ; Microstrip filters ; Microstrip lines ; Optimization ; Other topics in materials science ; Periodic structures ; Physics ; Power harmonic filters ; Scattering ; Scattering parameters ; self-adjoint method ; Sensitivity analysis ; Voltage-controlled oscillators</subject><ispartof>IEEE transactions on magnetics, 2009-03, Vol.45 (3), p.1462-1465</ispartof><rights>2009 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Typically, it is difficult to deploy planar half-wavelength low-pass filters when high power durability is required because of the very narrow line-widths of high impedance transmission line. Here, we propose a new configuration for the high impedance microstrip line using DGS structure to allow broader line width and high power handling capability. The sensitivity of the scattering parameters was calculated using the self-adjoint sensitivity formula in order to determine the proposed filter's dimension. The paper also highlights the validity of the proposed LPF optimization with its measured performance.</description><subject>Circuit analysis</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Defected ground structure (DGS)</subject><subject>Design engineering</subject><subject>Design methodology</subject><subject>Exact sciences and technology</subject><subject>Grounds</subject><subject>High impedance</subject><subject>Impedance</subject><subject>Low pass filters</subject><subject>low-pass filter (LPF)</subject><subject>Magnetism</subject><subject>Materials science</subject><subject>Mathematical analysis</subject><subject>Microstrip filters</subject><subject>Microstrip lines</subject><subject>Optimization</subject><subject>Other topics in materials science</subject><subject>Periodic structures</subject><subject>Physics</subject><subject>Power harmonic filters</subject><subject>Scattering</subject><subject>Scattering parameters</subject><subject>self-adjoint method</subject><subject>Sensitivity analysis</subject><subject>Voltage-controlled oscillators</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kc1u1DAUhS0EEkPhARAbCwlYpdjxT-zlqLQD0lRFahHLyL25oa7SONgOaDZ9dhxmNAsWyJJ9rfudsziHkNecnXLO7Meby_XmtGbMlovX2rAnZMWt5BVj2j4lK8a4qazU8jl5kdJ9-UrF2Yo8rqdp8OCyDyMNPc13SK9xTD77Xz7v6Hp0wy75RHP4u7uasn9wA_2Eyf84Ki49xJBy9BPdht_VV5cSvfBDxki_-3xX6B4hY0c3McxjR69znCHPEV-SZ70bEr46vCfk28X5zdnnanu1-XK23lYgjMqV7jh0ojfCqXKg1lYKY2xnwWCjmQEA5LcGdH3LgYGTGoAxAKtANGUUJ-TD3neK4eeMKbcPPgEOgxsxzKk12hopuRaFfP9fUkhVGyWaAr79B7wPcyxxFTelbS2ZNAXie2jJJ0Xs2ymW_OKu5axdimuX4tqluPZQXNG8Oxi7BG7ooxvBp6Ow5lo1Vizcmz3nEfG4lo1phBLiD3VtokE</recordid><startdate>20090301</startdate><enddate>20090301</enddate><creator>BYUN, Jin-Kyu</creator><creator>KO, Jae-Hyeong</creator><creator>LEE, Hyang-Beom</creator><creator>PARK, Jun-Seok</creator><creator>KIM, Hyeong-Seok</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Typically, it is difficult to deploy planar half-wavelength low-pass filters when high power durability is required because of the very narrow line-widths of high impedance transmission line. Here, we propose a new configuration for the high impedance microstrip line using DGS structure to allow broader line width and high power handling capability. The sensitivity of the scattering parameters was calculated using the self-adjoint sensitivity formula in order to determine the proposed filter's dimension. The paper also highlights the validity of the proposed LPF optimization with its measured performance.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMAG.2009.2012680</doi><tpages>4</tpages></addata></record> |
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subjects | Circuit analysis Cross-disciplinary physics: materials science rheology Defected ground structure (DGS) Design engineering Design methodology Exact sciences and technology Grounds High impedance Impedance Low pass filters low-pass filter (LPF) Magnetism Materials science Mathematical analysis Microstrip filters Microstrip lines Optimization Other topics in materials science Periodic structures Physics Power harmonic filters Scattering Scattering parameters self-adjoint method Sensitivity analysis Voltage-controlled oscillators |
title | Application of the Sensitivity Analysis to the Optimal Design of the Microstrip Low-Pass Filter With Defected Ground Structure |
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