In Situ Emission Microscopy of Scandium/Scandium-Oxide and Barium/Barium-Oxide Thin Films on Tungsten
The effect of a thin Sc/Sc-oxide base layer on Ba/Ba-oxide electron emission, surface diffusion, adsorption, and desorption on W is studied using photoelectron emission microscopy and thermionic emission microscopy. A barium-on-scandium structure enhances both photo- and thermionic electron emission...
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| Veröffentlicht in: | IEEE transactions on electron devices 2009-05, Vol.56 (5), p.794-798 |
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| container_end_page | 798 |
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| container_issue | 5 |
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| container_title | IEEE transactions on electron devices |
| container_volume | 56 |
| creator | Vaughn, J.M. Jamison, K.D. Kordesch, M.E. |
| description | The effect of a thin Sc/Sc-oxide base layer on Ba/Ba-oxide electron emission, surface diffusion, adsorption, and desorption on W is studied using photoelectron emission microscopy and thermionic emission microscopy. A barium-on-scandium structure enhances both photo- and thermionic electron emission. |
| doi_str_mv | 10.1109/TED.2009.2015410 |
| format | Article |
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A barium-on-scandium structure enhances both photo- and thermionic electron emission.</description><subject>Barium</subject><subject>Cathodes</subject><subject>Desorption</subject><subject>Electron emission</subject><subject>Emission microscopy</subject><subject>Heating</subject><subject>Metals</subject><subject>Microscopy</subject><subject>Photoelectron emission microscopy (PEEM)</subject><subject>scandate cathode</subject><subject>Scandium</subject><subject>Surface chemistry</subject><subject>thermionic cathode</subject><subject>thermionic emission microscopy (ThEEM)</subject><subject>Thermionics</subject><subject>Thin films</subject><subject>Titanium</subject><subject>Tungsten</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkLFOwzAQQC0EEqWwI7FYLExpbcd27BFKC5WKOjTMVppcwFXilDiR6N_jKoWBxec7vzv5HkK3lEwoJXqazp8njBAdDio4JWdoRIVIIi25PEcjQqiKdKziS3Tl_S6kknM2QrB0eGO7Hs9r671tHH6zedv4vNkfcFPiTZ65wvb19PcSrb9tATgk-Clrjy9DONXTT-vwwla1x2FW2rsP34G7RhdlVnm4OcUxel_M09lrtFq_LGePqyiPpe4iTakSec4gKfKSQwZMhhUEIaRIslJoKLXQWRJKjGgFBWclVxAnW6m3CRc6HqOHYe6-bb568J0JW-VQVZmDpvdGSa04o0wG8v4fuWv61oXPGSWkZirWNEBkgI5GfAul2be2ztqDocQcrZtg3Rytm5P10HI3tFgA-MO5IpKIOP4BNfB8sQ</recordid><startdate>20090501</startdate><enddate>20090501</enddate><creator>Vaughn, J.M.</creator><creator>Jamison, K.D.</creator><creator>Kordesch, M.E.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| identifier | ISSN: 0018-9383 |
| ispartof | IEEE transactions on electron devices, 2009-05, Vol.56 (5), p.794-798 |
| issn | 0018-9383 1557-9646 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Barium Cathodes Desorption Electron emission Emission microscopy Heating Metals Microscopy Photoelectron emission microscopy (PEEM) scandate cathode Scandium Surface chemistry thermionic cathode thermionic emission microscopy (ThEEM) Thermionics Thin films Titanium Tungsten |
| title | In Situ Emission Microscopy of Scandium/Scandium-Oxide and Barium/Barium-Oxide Thin Films on Tungsten |
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