Reactive-monolayer-assisted Thermal Nanoimprint Lithography with a Benzophenone-containing Trimethoxysilane Derivative for patterning Thin Chromium and Copper Films
Reactive-monolayer-assisted thermal nanoimprint lithography was applied for patterning thin films of chromium (Cr) and copper (Cu). The metal surfaces with the oxide layer were modified with a benzophenone-containing trimethoxysilane derivative to induce a surface graft reaction of the benzophenone...
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Veröffentlicht in: | Journal of Photopolymer Science and Technology 2010/06/22, Vol.23(1), pp.83-86 |
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creator | Kubo, Shoichi Ohtake, Tomoyuki Kang, Eui-Chul Nakagawa, Masaru |
description | Reactive-monolayer-assisted thermal nanoimprint lithography was applied for patterning thin films of chromium (Cr) and copper (Cu). The metal surfaces with the oxide layer were modified with a benzophenone-containing trimethoxysilane derivative to induce a surface graft reaction of the benzophenone moiety with poly(styrene) (PS) used for a resist polymer. A thin PS film was successfully prepared as a resist layer for wet etching on the modified metal surfaces by spin-coating, followed by exposure to ultraviolet light and annealing without dewetting the resist layer. The thin PS film could be patterned by thermal nanoimprinting involving a removal of the residual layer by exposure to UV/ozone. The patterned PS film worked as a resist mask for acidic aqueous wet etchants for Cr and Cu. We demonstrated that thin patterned films of Cr and Cu on micrometer scales could be fabricated by simple wet etching. |
doi_str_mv | 10.2494/photopolymer.23.83 |
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The metal surfaces with the oxide layer were modified with a benzophenone-containing trimethoxysilane derivative to induce a surface graft reaction of the benzophenone moiety with poly(styrene) (PS) used for a resist polymer. A thin PS film was successfully prepared as a resist layer for wet etching on the modified metal surfaces by spin-coating, followed by exposure to ultraviolet light and annealing without dewetting the resist layer. The thin PS film could be patterned by thermal nanoimprinting involving a removal of the residual layer by exposure to UV/ozone. The patterned PS film worked as a resist mask for acidic aqueous wet etchants for Cr and Cu. We demonstrated that thin patterned films of Cr and Cu on micrometer scales could be fabricated by simple wet etching.</description><identifier>ISSN: 0914-9244</identifier><identifier>ISSN: 1349-6336</identifier><identifier>EISSN: 1349-6336</identifier><identifier>DOI: 10.2494/photopolymer.23.83</identifier><language>eng</language><publisher>Hiratsuka: The Society of Photopolymer Science and Technology(SPST)</publisher><subject>benzophenone-containing trimethoxysilane ; Chromium ; Copper ; Lithography ; Nanocomposites ; Nanomaterials ; Nanostructure ; patterned metal film ; Polystyrene resins ; reactive-monolayer-assisted thermal nanoimprint lithography ; Resists ; Thin films ; wet etching</subject><ispartof>Journal of Photopolymer Science and Technology, 2010/06/22, Vol.23(1), pp.83-86</ispartof><rights>2010 The Society of Photopolymer Science and Technology (SPST)</rights><rights>Copyright Japan Science and Technology Agency 2010</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c481t-b07cfbf34d9bb363ff2a5269f22813fbd320ca8b3b611113078a9e7531e192cd3</citedby><cites>FETCH-LOGICAL-c481t-b07cfbf34d9bb363ff2a5269f22813fbd320ca8b3b611113078a9e7531e192cd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,1877,27901,27902</link.rule.ids></links><search><creatorcontrib>Kubo, Shoichi</creatorcontrib><creatorcontrib>Ohtake, Tomoyuki</creatorcontrib><creatorcontrib>Kang, Eui-Chul</creatorcontrib><creatorcontrib>Nakagawa, Masaru</creatorcontrib><title>Reactive-monolayer-assisted Thermal Nanoimprint Lithography with a Benzophenone-containing Trimethoxysilane Derivative for patterning Thin Chromium and Copper Films</title><title>Journal of Photopolymer Science and Technology</title><addtitle>J. Photopol. Sci. Technol.</addtitle><description>Reactive-monolayer-assisted thermal nanoimprint lithography was applied for patterning thin films of chromium (Cr) and copper (Cu). The metal surfaces with the oxide layer were modified with a benzophenone-containing trimethoxysilane derivative to induce a surface graft reaction of the benzophenone moiety with poly(styrene) (PS) used for a resist polymer. A thin PS film was successfully prepared as a resist layer for wet etching on the modified metal surfaces by spin-coating, followed by exposure to ultraviolet light and annealing without dewetting the resist layer. The thin PS film could be patterned by thermal nanoimprinting involving a removal of the residual layer by exposure to UV/ozone. The patterned PS film worked as a resist mask for acidic aqueous wet etchants for Cr and Cu. We demonstrated that thin patterned films of Cr and Cu on micrometer scales could be fabricated by simple wet etching.</description><subject>benzophenone-containing trimethoxysilane</subject><subject>Chromium</subject><subject>Copper</subject><subject>Lithography</subject><subject>Nanocomposites</subject><subject>Nanomaterials</subject><subject>Nanostructure</subject><subject>patterned metal film</subject><subject>Polystyrene resins</subject><subject>reactive-monolayer-assisted thermal nanoimprint lithography</subject><subject>Resists</subject><subject>Thin films</subject><subject>wet etching</subject><issn>0914-9244</issn><issn>1349-6336</issn><issn>1349-6336</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNplkU2P1DAMhisEEsPCH-AUiQOnDvnqR44wsAvSCCQ0nCs3dacZNUlJMruU37M_dDsqWiHwwfbhee1Xdpa9ZnTLpZLvpsEnP_lxthi2XGxr8STbMCFVXgpRPs02VDGZKy7l8-xFjCdKhSgKtcnuvyPoZG4xt975EWYMOcRoYsKOHAYMFkbyFZw3dgrGJbI3afDHANMwk7ulJ0A-oPvtpwGdd5hr7xIYZ9yRHIKxuNC_5mhGcEg-YjC3cNlGeh_IBClhWNHBOLIbgrfmbAm4juz8NGEg12a08WX2rIcx4qs_9Sr7cf3psPuc77_dfNm93-da1izlLa103_ZCdqptRSn6nkPBS9VzXjPRt53gVEPdirZkSwha1aCwKgRDprjuxFX2dp07Bf_zjDE11kSN48W8P8emLlWlKlrShXzzD3ny5-AWcw2TUpYFp3WxUHyldPAxBuyb5YYWwtww2lz-1vz9t4aLphaL6GYVnWKCIz5KICSjR_xPwtZUi0dCDxAadOIBUKSvVA</recordid><startdate>20100101</startdate><enddate>20100101</enddate><creator>Kubo, Shoichi</creator><creator>Ohtake, Tomoyuki</creator><creator>Kang, Eui-Chul</creator><creator>Nakagawa, Masaru</creator><general>The Society of Photopolymer Science and Technology(SPST)</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20100101</creationdate><title>Reactive-monolayer-assisted Thermal Nanoimprint Lithography with a Benzophenone-containing Trimethoxysilane Derivative for patterning Thin Chromium and Copper Films</title><author>Kubo, Shoichi ; Ohtake, Tomoyuki ; Kang, Eui-Chul ; Nakagawa, Masaru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c481t-b07cfbf34d9bb363ff2a5269f22813fbd320ca8b3b611113078a9e7531e192cd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>benzophenone-containing trimethoxysilane</topic><topic>Chromium</topic><topic>Copper</topic><topic>Lithography</topic><topic>Nanocomposites</topic><topic>Nanomaterials</topic><topic>Nanostructure</topic><topic>patterned metal film</topic><topic>Polystyrene resins</topic><topic>reactive-monolayer-assisted thermal nanoimprint lithography</topic><topic>Resists</topic><topic>Thin films</topic><topic>wet etching</topic><toplevel>online_resources</toplevel><creatorcontrib>Kubo, Shoichi</creatorcontrib><creatorcontrib>Ohtake, Tomoyuki</creatorcontrib><creatorcontrib>Kang, Eui-Chul</creatorcontrib><creatorcontrib>Nakagawa, Masaru</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of Photopolymer Science and Technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kubo, Shoichi</au><au>Ohtake, Tomoyuki</au><au>Kang, Eui-Chul</au><au>Nakagawa, Masaru</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reactive-monolayer-assisted Thermal Nanoimprint Lithography with a Benzophenone-containing Trimethoxysilane Derivative for patterning Thin Chromium and Copper Films</atitle><jtitle>Journal of Photopolymer Science and Technology</jtitle><addtitle>J. Photopol. Sci. Technol.</addtitle><date>2010-01-01</date><risdate>2010</risdate><volume>23</volume><issue>1</issue><spage>83</spage><epage>86</epage><pages>83-86</pages><issn>0914-9244</issn><issn>1349-6336</issn><eissn>1349-6336</eissn><abstract>Reactive-monolayer-assisted thermal nanoimprint lithography was applied for patterning thin films of chromium (Cr) and copper (Cu). The metal surfaces with the oxide layer were modified with a benzophenone-containing trimethoxysilane derivative to induce a surface graft reaction of the benzophenone moiety with poly(styrene) (PS) used for a resist polymer. A thin PS film was successfully prepared as a resist layer for wet etching on the modified metal surfaces by spin-coating, followed by exposure to ultraviolet light and annealing without dewetting the resist layer. The thin PS film could be patterned by thermal nanoimprinting involving a removal of the residual layer by exposure to UV/ozone. The patterned PS film worked as a resist mask for acidic aqueous wet etchants for Cr and Cu. We demonstrated that thin patterned films of Cr and Cu on micrometer scales could be fabricated by simple wet etching.</abstract><cop>Hiratsuka</cop><pub>The Society of Photopolymer Science and Technology(SPST)</pub><doi>10.2494/photopolymer.23.83</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
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subjects | benzophenone-containing trimethoxysilane Chromium Copper Lithography Nanocomposites Nanomaterials Nanostructure patterned metal film Polystyrene resins reactive-monolayer-assisted thermal nanoimprint lithography Resists Thin films wet etching |
title | Reactive-monolayer-assisted Thermal Nanoimprint Lithography with a Benzophenone-containing Trimethoxysilane Derivative for patterning Thin Chromium and Copper Films |
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