Seafloor Roughness Measured by a Laser Line Scanner and a Conductivity Probe

To support modeling acoustic backscatter from the seafloor, a conductivity probe and a laser line scanner were deployed jointly to measure bottom roughness during an experiment off the New Jersey coast in summer 2006. The conductivity probe in situ measurement of porosity (IMP2) is impervious to wat...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE journal of oceanic engineering 2009-10, Vol.34 (4), p.459-465
Hauptverfasser: Chau-Chang Wang, Chau-Chang Wang, Dajun Tang, Dajun Tang
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 465
container_issue 4
container_start_page 459
container_title IEEE journal of oceanic engineering
container_volume 34
creator Chau-Chang Wang, Chau-Chang Wang
Dajun Tang, Dajun Tang
description To support modeling acoustic backscatter from the seafloor, a conductivity probe and a laser line scanner were deployed jointly to measure bottom roughness during an experiment off the New Jersey coast in summer 2006. The conductivity probe in situ measurement of porosity (IMP2) is impervious to water turbidity and yields a 1-D profile with 10-mm horizontal spacing and 1-mm resolution in the vertical direction. The laser line scanner is limited by water visibility but it provides 2-D grid points with resolutions 0.3 mm across track, 0.5 mm along track, and 0.3 mm in the vertical direction. Two sets of data, suitable to model mid- to high-frequency acoustic backscatter, were collected from two sites 900 m apart on August 14 and 17, 2006. The roughness spectra obtained from the laser scanning were compared to those measured by the IMP2. The spectra from the two methods are consistent over wave number range 0.0188-3 rad/cm, which are the wave number range common to both methods. The efficacy of the laser scanner is also confirmed by showing the spectral line created by the IMP2's periodic probing marks. The 2-D spectra generated from the laser scan data show that the bottom roughness at these sites is azimuthally isotropic, but significant spatial heterogeneity is observed.
doi_str_mv 10.1109/JOE.2009.2026986
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_867747956</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5233843</ieee_id><sourcerecordid>867747956</sourcerecordid><originalsourceid>FETCH-LOGICAL-c431t-b75f573bad201301411d663c0b8ffe9bb6721ae9f9a9b8c857e3381a2310d00e3</originalsourceid><addsrcrecordid>eNqNkc1LxDAQxYMouK7eBS_Fg56qmaZJmqMs6xeVFVfPIW2n2qXbrEkr7H9vll08eBAvMwzzm-E9HiGnQK8AqLp-nE2vEkpVKIlQmdgjI-A8i0Eo2CcjykQaK8rVITnyfkEppKlUI5LP0dSttS56scP7R4feR09o_OCwiop1ZKLceHRR3nQYzUvTdWEwXRUWE9tVQ9k3X02_jp6dLfCYHNSm9Xiy62Pydjt9ndzH-ezuYXKTx2XKoI8LyWsuWWGqhAILSgAqIVhJi6yuURWFkAkYVLUyqsjKjEtkLAOTMKAVpcjG5HL7d-Xs54C-18vGl9i2pkM7eJ0JKYM7LgJ58SeZQMJ5Kui_QAYSAnj-C1zYwXXBrg5CUyaYlAGiW6h01nuHtV65ZmncWgPVm7h0iEtv4tK7uMLJ2fakQcQfnCfBecrYN-xQjlk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>857436377</pqid></control><display><type>article</type><title>Seafloor Roughness Measured by a Laser Line Scanner and a Conductivity Probe</title><source>IEEE Electronic Library (IEL)</source><creator>Chau-Chang Wang, Chau-Chang Wang ; Dajun Tang, Dajun Tang</creator><creatorcontrib>Chau-Chang Wang, Chau-Chang Wang ; Dajun Tang, Dajun Tang</creatorcontrib><description>To support modeling acoustic backscatter from the seafloor, a conductivity probe and a laser line scanner were deployed jointly to measure bottom roughness during an experiment off the New Jersey coast in summer 2006. The conductivity probe in situ measurement of porosity (IMP2) is impervious to water turbidity and yields a 1-D profile with 10-mm horizontal spacing and 1-mm resolution in the vertical direction. The laser line scanner is limited by water visibility but it provides 2-D grid points with resolutions 0.3 mm across track, 0.5 mm along track, and 0.3 mm in the vertical direction. Two sets of data, suitable to model mid- to high-frequency acoustic backscatter, were collected from two sites 900 m apart on August 14 and 17, 2006. The roughness spectra obtained from the laser scanning were compared to those measured by the IMP2. The spectra from the two methods are consistent over wave number range 0.0188-3 rad/cm, which are the wave number range common to both methods. The efficacy of the laser scanner is also confirmed by showing the spectral line created by the IMP2's periodic probing marks. The 2-D spectra generated from the laser scan data show that the bottom roughness at these sites is azimuthally isotropic, but significant spatial heterogeneity is observed.</description><identifier>ISSN: 0364-9059</identifier><identifier>EISSN: 1558-1691</identifier><identifier>DOI: 10.1109/JOE.2009.2026986</identifier><identifier>CODEN: IJOEDY</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acoustic measurements ; Acoustics ; Backscatter ; Conductivity measurement ; Conductivity probe ; laser line scanning ; Laser modes ; Laser sintering ; Lasers ; Marine ; Mathematical models ; Probes ; Roughness ; Scanners ; Sea beds ; Sea floor ; Sea floor roughness ; Sea measurements ; seafloor backscattering ; seafloor roughness ; Sediments ; Spectra ; Wavelengths</subject><ispartof>IEEE journal of oceanic engineering, 2009-10, Vol.34 (4), p.459-465</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c431t-b75f573bad201301411d663c0b8ffe9bb6721ae9f9a9b8c857e3381a2310d00e3</citedby><cites>FETCH-LOGICAL-c431t-b75f573bad201301411d663c0b8ffe9bb6721ae9f9a9b8c857e3381a2310d00e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5233843$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5233843$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chau-Chang Wang, Chau-Chang Wang</creatorcontrib><creatorcontrib>Dajun Tang, Dajun Tang</creatorcontrib><title>Seafloor Roughness Measured by a Laser Line Scanner and a Conductivity Probe</title><title>IEEE journal of oceanic engineering</title><addtitle>JOE</addtitle><description>To support modeling acoustic backscatter from the seafloor, a conductivity probe and a laser line scanner were deployed jointly to measure bottom roughness during an experiment off the New Jersey coast in summer 2006. The conductivity probe in situ measurement of porosity (IMP2) is impervious to water turbidity and yields a 1-D profile with 10-mm horizontal spacing and 1-mm resolution in the vertical direction. The laser line scanner is limited by water visibility but it provides 2-D grid points with resolutions 0.3 mm across track, 0.5 mm along track, and 0.3 mm in the vertical direction. Two sets of data, suitable to model mid- to high-frequency acoustic backscatter, were collected from two sites 900 m apart on August 14 and 17, 2006. The roughness spectra obtained from the laser scanning were compared to those measured by the IMP2. The spectra from the two methods are consistent over wave number range 0.0188-3 rad/cm, which are the wave number range common to both methods. The efficacy of the laser scanner is also confirmed by showing the spectral line created by the IMP2's periodic probing marks. The 2-D spectra generated from the laser scan data show that the bottom roughness at these sites is azimuthally isotropic, but significant spatial heterogeneity is observed.</description><subject>Acoustic measurements</subject><subject>Acoustics</subject><subject>Backscatter</subject><subject>Conductivity measurement</subject><subject>Conductivity probe</subject><subject>laser line scanning</subject><subject>Laser modes</subject><subject>Laser sintering</subject><subject>Lasers</subject><subject>Marine</subject><subject>Mathematical models</subject><subject>Probes</subject><subject>Roughness</subject><subject>Scanners</subject><subject>Sea beds</subject><subject>Sea floor</subject><subject>Sea floor roughness</subject><subject>Sea measurements</subject><subject>seafloor backscattering</subject><subject>seafloor roughness</subject><subject>Sediments</subject><subject>Spectra</subject><subject>Wavelengths</subject><issn>0364-9059</issn><issn>1558-1691</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqNkc1LxDAQxYMouK7eBS_Fg56qmaZJmqMs6xeVFVfPIW2n2qXbrEkr7H9vll08eBAvMwzzm-E9HiGnQK8AqLp-nE2vEkpVKIlQmdgjI-A8i0Eo2CcjykQaK8rVITnyfkEppKlUI5LP0dSttS56scP7R4feR09o_OCwiop1ZKLceHRR3nQYzUvTdWEwXRUWE9tVQ9k3X02_jp6dLfCYHNSm9Xiy62Pydjt9ndzH-ezuYXKTx2XKoI8LyWsuWWGqhAILSgAqIVhJi6yuURWFkAkYVLUyqsjKjEtkLAOTMKAVpcjG5HL7d-Xs54C-18vGl9i2pkM7eJ0JKYM7LgJ58SeZQMJ5Kui_QAYSAnj-C1zYwXXBrg5CUyaYlAGiW6h01nuHtV65ZmncWgPVm7h0iEtv4tK7uMLJ2fakQcQfnCfBecrYN-xQjlk</recordid><startdate>20091001</startdate><enddate>20091001</enddate><creator>Chau-Chang Wang, Chau-Chang Wang</creator><creator>Dajun Tang, Dajun Tang</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7TB</scope><scope>7TN</scope><scope>8FD</scope><scope>F1W</scope><scope>FR3</scope><scope>H96</scope><scope>JQ2</scope><scope>KR7</scope><scope>L.G</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>7TG</scope><scope>KL.</scope><scope>F28</scope><scope>H8D</scope></search><sort><creationdate>20091001</creationdate><title>Seafloor Roughness Measured by a Laser Line Scanner and a Conductivity Probe</title><author>Chau-Chang Wang, Chau-Chang Wang ; Dajun Tang, Dajun Tang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c431t-b75f573bad201301411d663c0b8ffe9bb6721ae9f9a9b8c857e3381a2310d00e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Acoustic measurements</topic><topic>Acoustics</topic><topic>Backscatter</topic><topic>Conductivity measurement</topic><topic>Conductivity probe</topic><topic>laser line scanning</topic><topic>Laser modes</topic><topic>Laser sintering</topic><topic>Lasers</topic><topic>Marine</topic><topic>Mathematical models</topic><topic>Probes</topic><topic>Roughness</topic><topic>Scanners</topic><topic>Sea beds</topic><topic>Sea floor</topic><topic>Sea floor roughness</topic><topic>Sea measurements</topic><topic>seafloor backscattering</topic><topic>seafloor roughness</topic><topic>Sediments</topic><topic>Spectra</topic><topic>Wavelengths</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chau-Chang Wang, Chau-Chang Wang</creatorcontrib><creatorcontrib>Dajun Tang, Dajun Tang</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Oceanic Abstracts</collection><collection>Technology Research Database</collection><collection>ASFA: Aquatic Sciences and Fisheries Abstracts</collection><collection>Engineering Research Database</collection><collection>Aquatic Science &amp; Fisheries Abstracts (ASFA) 2: Ocean Technology, Policy &amp; Non-Living Resources</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Aquatic Science &amp; Fisheries Abstracts (ASFA) Professional</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Meteorological &amp; Geoastrophysical Abstracts</collection><collection>Meteorological &amp; Geoastrophysical Abstracts - Academic</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Aerospace Database</collection><jtitle>IEEE journal of oceanic engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chau-Chang Wang, Chau-Chang Wang</au><au>Dajun Tang, Dajun Tang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Seafloor Roughness Measured by a Laser Line Scanner and a Conductivity Probe</atitle><jtitle>IEEE journal of oceanic engineering</jtitle><stitle>JOE</stitle><date>2009-10-01</date><risdate>2009</risdate><volume>34</volume><issue>4</issue><spage>459</spage><epage>465</epage><pages>459-465</pages><issn>0364-9059</issn><eissn>1558-1691</eissn><coden>IJOEDY</coden><abstract>To support modeling acoustic backscatter from the seafloor, a conductivity probe and a laser line scanner were deployed jointly to measure bottom roughness during an experiment off the New Jersey coast in summer 2006. The conductivity probe in situ measurement of porosity (IMP2) is impervious to water turbidity and yields a 1-D profile with 10-mm horizontal spacing and 1-mm resolution in the vertical direction. The laser line scanner is limited by water visibility but it provides 2-D grid points with resolutions 0.3 mm across track, 0.5 mm along track, and 0.3 mm in the vertical direction. Two sets of data, suitable to model mid- to high-frequency acoustic backscatter, were collected from two sites 900 m apart on August 14 and 17, 2006. The roughness spectra obtained from the laser scanning were compared to those measured by the IMP2. The spectra from the two methods are consistent over wave number range 0.0188-3 rad/cm, which are the wave number range common to both methods. The efficacy of the laser scanner is also confirmed by showing the spectral line created by the IMP2's periodic probing marks. The 2-D spectra generated from the laser scan data show that the bottom roughness at these sites is azimuthally isotropic, but significant spatial heterogeneity is observed.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JOE.2009.2026986</doi><tpages>7</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0364-9059
ispartof IEEE journal of oceanic engineering, 2009-10, Vol.34 (4), p.459-465
issn 0364-9059
1558-1691
language eng
recordid cdi_proquest_miscellaneous_867747956
source IEEE Electronic Library (IEL)
subjects Acoustic measurements
Acoustics
Backscatter
Conductivity measurement
Conductivity probe
laser line scanning
Laser modes
Laser sintering
Lasers
Marine
Mathematical models
Probes
Roughness
Scanners
Sea beds
Sea floor
Sea floor roughness
Sea measurements
seafloor backscattering
seafloor roughness
Sediments
Spectra
Wavelengths
title Seafloor Roughness Measured by a Laser Line Scanner and a Conductivity Probe
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T01%3A57%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Seafloor%20Roughness%20Measured%20by%20a%20Laser%20Line%20Scanner%20and%20a%20Conductivity%20Probe&rft.jtitle=IEEE%20journal%20of%20oceanic%20engineering&rft.au=Chau-Chang%20Wang,%20Chau-Chang%20Wang&rft.date=2009-10-01&rft.volume=34&rft.issue=4&rft.spage=459&rft.epage=465&rft.pages=459-465&rft.issn=0364-9059&rft.eissn=1558-1691&rft.coden=IJOEDY&rft_id=info:doi/10.1109/JOE.2009.2026986&rft_dat=%3Cproquest_RIE%3E867747956%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=857436377&rft_id=info:pmid/&rft_ieee_id=5233843&rfr_iscdi=true