The imaging mechanism, imaging depth, and parameters influencing the visibility of carbon nanotubes in a polymer matrix using an SEM

Visualization of embedded carbon nanotubes (CNTs) in polymer using a scanning electron microscope (SEM) has been established as a convenient technique to evaluate CNT dispersion. This technique is known as voltage contrast imaging and is different from material contrast and topographic contrast imag...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Carbon (New York) 2011-05, Vol.49 (6), p.1955-1964
Hauptverfasser: Li, Wenjing, Buschhorn, Samuel T., Schulte, Karl, Bauhofer, Wolfgang
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1964
container_issue 6
container_start_page 1955
container_title Carbon (New York)
container_volume 49
creator Li, Wenjing
Buschhorn, Samuel T.
Schulte, Karl
Bauhofer, Wolfgang
description Visualization of embedded carbon nanotubes (CNTs) in polymer using a scanning electron microscope (SEM) has been established as a convenient technique to evaluate CNT dispersion. This technique is known as voltage contrast imaging and is different from material contrast and topographic contrast imaging. By investigating CNT/epoxy composites the voltage contrast imaging theory is further understood. Trapping of electrons at the CNT/epoxy interface induces a local potential difference which enhances the image contrast. By coating the composite with a polymer film of different thicknesses the imaging depth (i.e. from how deep the CNTs can be seen) is determined to be up to 250 nm, and is a function of the accelerating voltage of the SEM. Visibility of CNTs is found to be sensitive to the CNT dispersion and concentration, as well as to the accelerating voltage.
doi_str_mv 10.1016/j.carbon.2010.12.069
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_864437510</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0008622311000388</els_id><sourcerecordid>864437510</sourcerecordid><originalsourceid>FETCH-LOGICAL-c368t-f2abeb265563845fb140deee6f4041ab596ed8f98e950769aa98e6c6af1771af3</originalsourceid><addsrcrecordid>eNp9kE1v3CAQhlHVSt2m-Qc9cKl6ibdgMLYvlaooH5VS9dDkjMZ4yLKysQs46t77w4PlKMeegNHzzjAPIZ8423PG1dfj3kDoJr8v2Voq90y1b8iON7UoRNPyt2THGGsKVZbiPfkQ4zE_ZcPljvy7PyB1Izw6_0hHNAfwLo4Xr6Ue53S4oOB7OkOAEROGSJ23w4LerETKDZ5cdJ0bXDrRydLtM9SDn9LS4YpToPM0nEYMdIQU3F-6xDUMnv6--vmRvLMwRDx_Oc_Iw_XV_eVtcffr5sfl97vCCNWkwpbQYVeqqlKikZXtuGQ9IiormeTQVa3CvrFtg23FatUC5KsyCiyvaw5WnJEvW985TH8WjEmPLhocBvA4LVE3SkpRV5xlUm6kCVOMAa2eQ1YSTpozvTrXR72tqVfnmpc6O8-xzy8DIBoYbIDsKL5mS9EKIVSZuW8bh3nbJ4dBR-OyT-xdQJN0P7n_D3oGTACbbw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>864437510</pqid></control><display><type>article</type><title>The imaging mechanism, imaging depth, and parameters influencing the visibility of carbon nanotubes in a polymer matrix using an SEM</title><source>Elsevier ScienceDirect Journals</source><creator>Li, Wenjing ; Buschhorn, Samuel T. ; Schulte, Karl ; Bauhofer, Wolfgang</creator><creatorcontrib>Li, Wenjing ; Buschhorn, Samuel T. ; Schulte, Karl ; Bauhofer, Wolfgang</creatorcontrib><description>Visualization of embedded carbon nanotubes (CNTs) in polymer using a scanning electron microscope (SEM) has been established as a convenient technique to evaluate CNT dispersion. This technique is known as voltage contrast imaging and is different from material contrast and topographic contrast imaging. By investigating CNT/epoxy composites the voltage contrast imaging theory is further understood. Trapping of electrons at the CNT/epoxy interface induces a local potential difference which enhances the image contrast. By coating the composite with a polymer film of different thicknesses the imaging depth (i.e. from how deep the CNTs can be seen) is determined to be up to 250 nm, and is a function of the accelerating voltage of the SEM. Visibility of CNTs is found to be sensitive to the CNT dispersion and concentration, as well as to the accelerating voltage.</description><identifier>ISSN: 0008-6223</identifier><identifier>EISSN: 1873-3891</identifier><identifier>DOI: 10.1016/j.carbon.2010.12.069</identifier><identifier>CODEN: CRBNAH</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Carbon ; Carbon nanotubes ; Chemistry ; Cross-disciplinary physics: materials science; rheology ; Dispersions ; Electric potential ; Exact sciences and technology ; Fullerenes and related materials; diamonds, graphite ; General and physical chemistry ; Imaging ; Materials science ; Physics ; Polymer matrix composites ; Scanning electron microscopy ; Specific materials ; Surface physical chemistry ; Visibility ; Voltage</subject><ispartof>Carbon (New York), 2011-05, Vol.49 (6), p.1955-1964</ispartof><rights>2011 Elsevier Ltd</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c368t-f2abeb265563845fb140deee6f4041ab596ed8f98e950769aa98e6c6af1771af3</citedby><cites>FETCH-LOGICAL-c368t-f2abeb265563845fb140deee6f4041ab596ed8f98e950769aa98e6c6af1771af3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0008622311000388$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=23933362$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Li, Wenjing</creatorcontrib><creatorcontrib>Buschhorn, Samuel T.</creatorcontrib><creatorcontrib>Schulte, Karl</creatorcontrib><creatorcontrib>Bauhofer, Wolfgang</creatorcontrib><title>The imaging mechanism, imaging depth, and parameters influencing the visibility of carbon nanotubes in a polymer matrix using an SEM</title><title>Carbon (New York)</title><description>Visualization of embedded carbon nanotubes (CNTs) in polymer using a scanning electron microscope (SEM) has been established as a convenient technique to evaluate CNT dispersion. This technique is known as voltage contrast imaging and is different from material contrast and topographic contrast imaging. By investigating CNT/epoxy composites the voltage contrast imaging theory is further understood. Trapping of electrons at the CNT/epoxy interface induces a local potential difference which enhances the image contrast. By coating the composite with a polymer film of different thicknesses the imaging depth (i.e. from how deep the CNTs can be seen) is determined to be up to 250 nm, and is a function of the accelerating voltage of the SEM. Visibility of CNTs is found to be sensitive to the CNT dispersion and concentration, as well as to the accelerating voltage.</description><subject>Carbon</subject><subject>Carbon nanotubes</subject><subject>Chemistry</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Dispersions</subject><subject>Electric potential</subject><subject>Exact sciences and technology</subject><subject>Fullerenes and related materials; diamonds, graphite</subject><subject>General and physical chemistry</subject><subject>Imaging</subject><subject>Materials science</subject><subject>Physics</subject><subject>Polymer matrix composites</subject><subject>Scanning electron microscopy</subject><subject>Specific materials</subject><subject>Surface physical chemistry</subject><subject>Visibility</subject><subject>Voltage</subject><issn>0008-6223</issn><issn>1873-3891</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp9kE1v3CAQhlHVSt2m-Qc9cKl6ibdgMLYvlaooH5VS9dDkjMZ4yLKysQs46t77w4PlKMeegNHzzjAPIZ8423PG1dfj3kDoJr8v2Voq90y1b8iON7UoRNPyt2THGGsKVZbiPfkQ4zE_ZcPljvy7PyB1Izw6_0hHNAfwLo4Xr6Ue53S4oOB7OkOAEROGSJ23w4LerETKDZ5cdJ0bXDrRydLtM9SDn9LS4YpToPM0nEYMdIQU3F-6xDUMnv6--vmRvLMwRDx_Oc_Iw_XV_eVtcffr5sfl97vCCNWkwpbQYVeqqlKikZXtuGQ9IiormeTQVa3CvrFtg23FatUC5KsyCiyvaw5WnJEvW985TH8WjEmPLhocBvA4LVE3SkpRV5xlUm6kCVOMAa2eQ1YSTpozvTrXR72tqVfnmpc6O8-xzy8DIBoYbIDsKL5mS9EKIVSZuW8bh3nbJ4dBR-OyT-xdQJN0P7n_D3oGTACbbw</recordid><startdate>20110501</startdate><enddate>20110501</enddate><creator>Li, Wenjing</creator><creator>Buschhorn, Samuel T.</creator><creator>Schulte, Karl</creator><creator>Bauhofer, Wolfgang</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20110501</creationdate><title>The imaging mechanism, imaging depth, and parameters influencing the visibility of carbon nanotubes in a polymer matrix using an SEM</title><author>Li, Wenjing ; Buschhorn, Samuel T. ; Schulte, Karl ; Bauhofer, Wolfgang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c368t-f2abeb265563845fb140deee6f4041ab596ed8f98e950769aa98e6c6af1771af3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Carbon</topic><topic>Carbon nanotubes</topic><topic>Chemistry</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Dispersions</topic><topic>Electric potential</topic><topic>Exact sciences and technology</topic><topic>Fullerenes and related materials; diamonds, graphite</topic><topic>General and physical chemistry</topic><topic>Imaging</topic><topic>Materials science</topic><topic>Physics</topic><topic>Polymer matrix composites</topic><topic>Scanning electron microscopy</topic><topic>Specific materials</topic><topic>Surface physical chemistry</topic><topic>Visibility</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, Wenjing</creatorcontrib><creatorcontrib>Buschhorn, Samuel T.</creatorcontrib><creatorcontrib>Schulte, Karl</creatorcontrib><creatorcontrib>Bauhofer, Wolfgang</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Carbon (New York)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Li, Wenjing</au><au>Buschhorn, Samuel T.</au><au>Schulte, Karl</au><au>Bauhofer, Wolfgang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The imaging mechanism, imaging depth, and parameters influencing the visibility of carbon nanotubes in a polymer matrix using an SEM</atitle><jtitle>Carbon (New York)</jtitle><date>2011-05-01</date><risdate>2011</risdate><volume>49</volume><issue>6</issue><spage>1955</spage><epage>1964</epage><pages>1955-1964</pages><issn>0008-6223</issn><eissn>1873-3891</eissn><coden>CRBNAH</coden><abstract>Visualization of embedded carbon nanotubes (CNTs) in polymer using a scanning electron microscope (SEM) has been established as a convenient technique to evaluate CNT dispersion. This technique is known as voltage contrast imaging and is different from material contrast and topographic contrast imaging. By investigating CNT/epoxy composites the voltage contrast imaging theory is further understood. Trapping of electrons at the CNT/epoxy interface induces a local potential difference which enhances the image contrast. By coating the composite with a polymer film of different thicknesses the imaging depth (i.e. from how deep the CNTs can be seen) is determined to be up to 250 nm, and is a function of the accelerating voltage of the SEM. Visibility of CNTs is found to be sensitive to the CNT dispersion and concentration, as well as to the accelerating voltage.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.carbon.2010.12.069</doi><tpages>10</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0008-6223
ispartof Carbon (New York), 2011-05, Vol.49 (6), p.1955-1964
issn 0008-6223
1873-3891
language eng
recordid cdi_proquest_miscellaneous_864437510
source Elsevier ScienceDirect Journals
subjects Carbon
Carbon nanotubes
Chemistry
Cross-disciplinary physics: materials science
rheology
Dispersions
Electric potential
Exact sciences and technology
Fullerenes and related materials
diamonds, graphite
General and physical chemistry
Imaging
Materials science
Physics
Polymer matrix composites
Scanning electron microscopy
Specific materials
Surface physical chemistry
Visibility
Voltage
title The imaging mechanism, imaging depth, and parameters influencing the visibility of carbon nanotubes in a polymer matrix using an SEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T10%3A53%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20imaging%20mechanism,%20imaging%20depth,%20and%20parameters%20influencing%20the%20visibility%20of%20carbon%20nanotubes%20in%20a%20polymer%20matrix%20using%20an%20SEM&rft.jtitle=Carbon%20(New%20York)&rft.au=Li,%20Wenjing&rft.date=2011-05-01&rft.volume=49&rft.issue=6&rft.spage=1955&rft.epage=1964&rft.pages=1955-1964&rft.issn=0008-6223&rft.eissn=1873-3891&rft.coden=CRBNAH&rft_id=info:doi/10.1016/j.carbon.2010.12.069&rft_dat=%3Cproquest_cross%3E864437510%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=864437510&rft_id=info:pmid/&rft_els_id=S0008622311000388&rfr_iscdi=true