Electrical properties and tracer diffusion of oxygen in some Bi-based lead-free piezoelectric ceramics

The relationship between electrical properties and oxygen tracer diffusion was focused for Bi based piezoelectric ceramics including typical perovskite ferroelectrics, (Bi1/2Na1/2)TiO3 (BNT), and Bi layer-structured ferroelectrics, Bi4Ti3O12 (BIT). The oxygen tracer diffusion was investigated by sec...

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Veröffentlicht in:	Journal of the Ceramic Society of Japan 2008, Vol.116(1350), pp.271-277
1. Verfasser:	NAGATA, Hajime
Format:	Artikel
Sprache:	eng
Schlagworte:	Bismuth sodium titanate bismuth titanate Ceramics Diffusion coefficient Electrical properties Ferroelectric materials Lead-free Oxygen vacancy Piezoelectric ceramics Piezoelectric property Secondary ion mass spectrometry Tracer diffusion Vacancies
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container_title	Journal of the Ceramic Society of Japan
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creator	NAGATA, Hajime
description	The relationship between electrical properties and oxygen tracer diffusion was focused for Bi based piezoelectric ceramics including typical perovskite ferroelectrics, (Bi1/2Na1/2)TiO3 (BNT), and Bi layer-structured ferroelectrics, Bi4Ti3O12 (BIT). The oxygen tracer diffusion was investigated by secondary ion mass spectrometry, SIMS. Volume diffusion coefficients, Dv, of 18O in Bi excess BNT (BNT+Bi2O3 0.3 mass%, BNT-0.3) and V-substituted BIT (Bi4Ti3-xVxO12, BITV-x) ceramics were dramatically decreased as compared with those in non-doped ceramics. These results suggest that the concentration of oxygen vacancies decreased. On the other hand, electromechanical coupling factor, k33, for BNT-0.3 and BITV-0.02 ceramics are 0.47 and 0.25, respectively, which are the largest in each system.
doi_str_mv	10.2109/jcersj2.116.271
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The oxygen tracer diffusion was investigated by secondary ion mass spectrometry, SIMS. Volume diffusion coefficients, Dv, of 18O in Bi excess BNT (BNT+Bi2O3 0.3 mass%, BNT-0.3) and V-substituted BIT (Bi4Ti3-xVxO12, BITV-x) ceramics were dramatically decreased as compared with those in non-doped ceramics. These results suggest that the concentration of oxygen vacancies decreased. 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subjects	Bismuth sodium titanate bismuth titanate Ceramics Diffusion coefficient Electrical properties Ferroelectric materials Lead-free Oxygen vacancy Piezoelectric ceramics Piezoelectric property Secondary ion mass spectrometry Tracer diffusion Vacancies
title	Electrical properties and tracer diffusion of oxygen in some Bi-based lead-free piezoelectric ceramics
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