Monte Carlo Simulation of Single Event Effects
In this paper, we describe a Monte Carlo approach for estimating the frequency and character of single event effects based on a combination of physical modeling of discrete radiation events, device simulations to estimate charge transport and collection, and circuit simulations to determine the effe...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2010-08, Vol.57 (4), p.1726-1746 |
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| container_end_page | 1746 |
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| container_issue | 4 |
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| container_title | IEEE transactions on nuclear science |
| container_volume | 57 |
| creator | Weller, Robert A Mendenhall, Marcus H Reed, Robert A Schrimpf, Ronald D Warren, Kevin M Sierawski, Brian D Massengill, Lloyd W |
| description | In this paper, we describe a Monte Carlo approach for estimating the frequency and character of single event effects based on a combination of physical modeling of discrete radiation events, device simulations to estimate charge transport and collection, and circuit simulations to determine the effect of the collected charge. A mathematical analysis of the procedure reveals it to be closely related to the rectangular parallelepiped (RPP) rate prediction method. The results of these simulations show that event-to-event variation may have a significant impact when predicting the single-event rate in advanced spacecraft electronics. Specific criteria for supplementing established RPP-based single event analysis with Monte Carlo computations are discussed. |
| doi_str_mv | 10.1109/TNS.2010.2044807 |
| format | Article |
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A mathematical analysis of the procedure reveals it to be closely related to the rectangular parallelepiped (RPP) rate prediction method. The results of these simulations show that event-to-event variation may have a significant impact when predicting the single-event rate in advanced spacecraft electronics. Specific criteria for supplementing established RPP-based single event analysis with Monte Carlo computations are discussed.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2010.2044807</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Aerospace electronics ; Charge transport ; Circuit simulation ; Computational modeling ; Computer simulation ; computing applications ; cosmic rays ; Discrete event simulation ; Electronics ; Frequency estimation ; GEANT ; Mathematical analysis ; Mathematical models ; Monte Carlo methods ; Monte Carlo simulation ; Prediction methods ; Predictive models ; radiation transport modeling ; Single Event Effects ; single event modeling ; single event rates ; software ; space radiation effects ; Space vehicles ; Spacecraft</subject><ispartof>IEEE transactions on nuclear science, 2010-08, Vol.57 (4), p.1726-1746</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c323t-a2c0a9028b831a0c95cc6b8df056eda317a1c9ba3ca2f4f398ce7e5758c567a63</citedby><cites>FETCH-LOGICAL-c323t-a2c0a9028b831a0c95cc6b8df056eda317a1c9ba3ca2f4f398ce7e5758c567a63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5550410$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5550410$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Weller, Robert A</creatorcontrib><creatorcontrib>Mendenhall, Marcus H</creatorcontrib><creatorcontrib>Reed, Robert A</creatorcontrib><creatorcontrib>Schrimpf, Ronald D</creatorcontrib><creatorcontrib>Warren, Kevin M</creatorcontrib><creatorcontrib>Sierawski, Brian D</creatorcontrib><creatorcontrib>Massengill, Lloyd W</creatorcontrib><title>Monte Carlo Simulation of Single Event Effects</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>In this paper, we describe a Monte Carlo approach for estimating the frequency and character of single event effects based on a combination of physical modeling of discrete radiation events, device simulations to estimate charge transport and collection, and circuit simulations to determine the effect of the collected charge. 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Specific criteria for supplementing established RPP-based single event analysis with Monte Carlo computations are discussed.</description><subject>Aerospace electronics</subject><subject>Charge transport</subject><subject>Circuit simulation</subject><subject>Computational modeling</subject><subject>Computer simulation</subject><subject>computing applications</subject><subject>cosmic rays</subject><subject>Discrete event simulation</subject><subject>Electronics</subject><subject>Frequency estimation</subject><subject>GEANT</subject><subject>Mathematical analysis</subject><subject>Mathematical models</subject><subject>Monte Carlo methods</subject><subject>Monte Carlo simulation</subject><subject>Prediction methods</subject><subject>Predictive models</subject><subject>radiation transport modeling</subject><subject>Single Event Effects</subject><subject>single event modeling</subject><subject>single event rates</subject><subject>software</subject><subject>space radiation effects</subject><subject>Space vehicles</subject><subject>Spacecraft</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQhoMoWKt3wcuCB09bJ5vMbnKUUj-g6qH1HNJ0Ilu2m7rZFfz3prR48DS88LzDzMPYNYcJ56Dvl2-LSQEpFSClguqEjTiiyjlW6pSNALjKtdT6nF3EuElRIuCITV5D21M2tV0TskW9HRrb16HNgk-p_Wwom31T22cz78n18ZKdedtEujrOMft4nC2nz_n8_ell-jDPnShEn9vCgdVQqJUS3ILT6Fy5UmsPWNLaCl5Z7vTKCmcLL73QylFFWKFyWFa2FGN2d9i768LXQLE32zo6ahrbUhiiUSVHKbWQibz9R27C0LXpOMNBpS-VlpAoOFCuCzF25M2uq7e2-0mQ2fszyZ_Z-zNHf6lyc6jURPSHIyJIDuIXNA5pxA</recordid><startdate>201008</startdate><enddate>201008</enddate><creator>Weller, Robert A</creator><creator>Mendenhall, Marcus H</creator><creator>Reed, Robert A</creator><creator>Schrimpf, Ronald D</creator><creator>Warren, Kevin M</creator><creator>Sierawski, Brian D</creator><creator>Massengill, Lloyd W</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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rates</topic><topic>software</topic><topic>space radiation effects</topic><topic>Space vehicles</topic><topic>Spacecraft</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Weller, Robert A</creatorcontrib><creatorcontrib>Mendenhall, Marcus H</creatorcontrib><creatorcontrib>Reed, Robert A</creatorcontrib><creatorcontrib>Schrimpf, Ronald D</creatorcontrib><creatorcontrib>Warren, Kevin M</creatorcontrib><creatorcontrib>Sierawski, Brian D</creatorcontrib><creatorcontrib>Massengill, Lloyd W</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information 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science</jtitle><stitle>TNS</stitle><date>2010-08</date><risdate>2010</risdate><volume>57</volume><issue>4</issue><spage>1726</spage><epage>1746</epage><pages>1726-1746</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>In this paper, we describe a Monte Carlo approach for estimating the frequency and character of single event effects based on a combination of physical modeling of discrete radiation events, device simulations to estimate charge transport and collection, and circuit simulations to determine the effect of the collected charge. 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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Aerospace electronics Charge transport Circuit simulation Computational modeling Computer simulation computing applications cosmic rays Discrete event simulation Electronics Frequency estimation GEANT Mathematical analysis Mathematical models Monte Carlo methods Monte Carlo simulation Prediction methods Predictive models radiation transport modeling Single Event Effects single event modeling single event rates software space radiation effects Space vehicles Spacecraft |
| title | Monte Carlo Simulation of Single Event Effects |
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