Characterization of the parameters relating adjacent grains using transmission electron microscopy
A simple technique is presented for characterizing parameters such as the misorientation angle and the axis of rotation between two adjacent grains using transmission electron microscopy (TEM), without the need for an image of the Kikuchi pattern. The technique described makes use of the orthogonal...
Gespeichert in:
| Veröffentlicht in: | Journal of applied crystallography 2010-12, Vol.43 (6), p.1495-1501 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1501 |
|---|---|
| container_issue | 6 |
| container_start_page | 1495 |
| container_title | Journal of applied crystallography |
| container_volume | 43 |
| creator | Jeong, H. W. Seo, S. M. Hong, H. U. Yoo, Y. S. |
| description | A simple technique is presented for characterizing parameters such as the misorientation angle and the axis of rotation between two adjacent grains using transmission electron microscopy (TEM), without the need for an image of the Kikuchi pattern. The technique described makes use of the orthogonal relationship between the tilt axes used in TEM and the axes of the cubic crystal. The relationship was established using the well known triangulation method, in which the direction of the crystal parallel to the beam direction is determined from the measured tilt angles of the three zone axes. The error in measuring the tilt angles of the three zone axes can be evaluated by comparing the measured and crystallographic angles. The angle of deviation from the coincident site lattice (CSL) that results from the measurement error could be reduced by establishing the modified orthogonal relationship between the tilt and crystal axes. The use of this method could provide accurate measurement in real time for indexing a CSL boundary using TEM. |
| doi_str_mv | 10.1107/S002188981004149X |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_861534663</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2199849601</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3912-8145c4890e8c6b8f717c3cf5729bbca4e36477e5945cd3532fb3ca0eef804b643</originalsourceid><addsrcrecordid>eNqFkMtOwzAQRSMEEs8PYBexYRXwxM8sIYIWhEBQUBEbyzETSEmTYqeC8vU4KkIIFqxmdH3PzPVE0S6QAwAiD0eEpKBUpoAQBiy7X4k2QBCScCnk6o9-Pdr0fkIICJmmG1GRPxtnbIeu-jBd1TZxW8bdM8azIE8x6D52WIen5ik2jxNjseniJ2eqxsdz36udM42fVt73NNZoOxeaaWVd6207W2xHa6WpPe581a3o7vTkNh8mF1eDs_zoIrE0gzRRwLhlKiOorChUKUFaaksu06worGFIBZMSeRZsj5TTtCyoNQSxVIQVgtGtaH85d-ba1zn6TodQFuvaNNjOvVYCOGVC0ODc--WctHPXhHA6pBAcQKTBBEtT_w_vsNQzV02NW2ggur-5_nPzwKgl81bVuPgf0Of5TT7gwPt1yRKtfIfv36hxL1pIKrkeXw70w_FwLM7FSF_TT6I3lP8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>814651162</pqid></control><display><type>article</type><title>Characterization of the parameters relating adjacent grains using transmission electron microscopy</title><source>Wiley Online Library Journals Frontfile Complete</source><source>Alma/SFX Local Collection</source><creator>Jeong, H. W. ; Seo, S. M. ; Hong, H. U. ; Yoo, Y. S.</creator><creatorcontrib>Jeong, H. W. ; Seo, S. M. ; Hong, H. U. ; Yoo, Y. S.</creatorcontrib><description>A simple technique is presented for characterizing parameters such as the misorientation angle and the axis of rotation between two adjacent grains using transmission electron microscopy (TEM), without the need for an image of the Kikuchi pattern. The technique described makes use of the orthogonal relationship between the tilt axes used in TEM and the axes of the cubic crystal. The relationship was established using the well known triangulation method, in which the direction of the crystal parallel to the beam direction is determined from the measured tilt angles of the three zone axes. The error in measuring the tilt angles of the three zone axes can be evaluated by comparing the measured and crystallographic angles. The angle of deviation from the coincident site lattice (CSL) that results from the measurement error could be reduced by establishing the modified orthogonal relationship between the tilt and crystal axes. The use of this method could provide accurate measurement in real time for indexing a CSL boundary using TEM.</description><identifier>ISSN: 1600-5767</identifier><identifier>ISSN: 0021-8898</identifier><identifier>EISSN: 1600-5767</identifier><identifier>DOI: 10.1107/S002188981004149X</identifier><language>eng</language><publisher>5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography</publisher><subject>Crystallography ; Electron microscopy ; goniometers ; Grain ; grain boundaries ; Grains ; misorientation ; Parameter estimation ; Transmission electron microscopy</subject><ispartof>Journal of applied crystallography, 2010-12, Vol.43 (6), p.1495-1501</ispartof><rights>International Union of Crystallography, 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3912-8145c4890e8c6b8f717c3cf5729bbca4e36477e5945cd3532fb3ca0eef804b643</citedby><cites>FETCH-LOGICAL-c3912-8145c4890e8c6b8f717c3cf5729bbca4e36477e5945cd3532fb3ca0eef804b643</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1107%2FS002188981004149X$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1107%2FS002188981004149X$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids></links><search><creatorcontrib>Jeong, H. W.</creatorcontrib><creatorcontrib>Seo, S. M.</creatorcontrib><creatorcontrib>Hong, H. U.</creatorcontrib><creatorcontrib>Yoo, Y. S.</creatorcontrib><title>Characterization of the parameters relating adjacent grains using transmission electron microscopy</title><title>Journal of applied crystallography</title><addtitle>J. Appl. Cryst</addtitle><description>A simple technique is presented for characterizing parameters such as the misorientation angle and the axis of rotation between two adjacent grains using transmission electron microscopy (TEM), without the need for an image of the Kikuchi pattern. The technique described makes use of the orthogonal relationship between the tilt axes used in TEM and the axes of the cubic crystal. The relationship was established using the well known triangulation method, in which the direction of the crystal parallel to the beam direction is determined from the measured tilt angles of the three zone axes. The error in measuring the tilt angles of the three zone axes can be evaluated by comparing the measured and crystallographic angles. The angle of deviation from the coincident site lattice (CSL) that results from the measurement error could be reduced by establishing the modified orthogonal relationship between the tilt and crystal axes. The use of this method could provide accurate measurement in real time for indexing a CSL boundary using TEM.</description><subject>Crystallography</subject><subject>Electron microscopy</subject><subject>goniometers</subject><subject>Grain</subject><subject>grain boundaries</subject><subject>Grains</subject><subject>misorientation</subject><subject>Parameter estimation</subject><subject>Transmission electron microscopy</subject><issn>1600-5767</issn><issn>0021-8898</issn><issn>1600-5767</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqFkMtOwzAQRSMEEs8PYBexYRXwxM8sIYIWhEBQUBEbyzETSEmTYqeC8vU4KkIIFqxmdH3PzPVE0S6QAwAiD0eEpKBUpoAQBiy7X4k2QBCScCnk6o9-Pdr0fkIICJmmG1GRPxtnbIeu-jBd1TZxW8bdM8azIE8x6D52WIen5ik2jxNjseniJ2eqxsdz36udM42fVt73NNZoOxeaaWVd6207W2xHa6WpPe581a3o7vTkNh8mF1eDs_zoIrE0gzRRwLhlKiOorChUKUFaaksu06worGFIBZMSeRZsj5TTtCyoNQSxVIQVgtGtaH85d-ba1zn6TodQFuvaNNjOvVYCOGVC0ODc--WctHPXhHA6pBAcQKTBBEtT_w_vsNQzV02NW2ggur-5_nPzwKgl81bVuPgf0Of5TT7gwPt1yRKtfIfv36hxL1pIKrkeXw70w_FwLM7FSF_TT6I3lP8</recordid><startdate>20101201</startdate><enddate>20101201</enddate><creator>Jeong, H. W.</creator><creator>Seo, S. M.</creator><creator>Hong, H. U.</creator><creator>Yoo, Y. S.</creator><general>International Union of Crystallography</general><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20101201</creationdate><title>Characterization of the parameters relating adjacent grains using transmission electron microscopy</title><author>Jeong, H. W. ; Seo, S. M. ; Hong, H. U. ; Yoo, Y. S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3912-8145c4890e8c6b8f717c3cf5729bbca4e36477e5945cd3532fb3ca0eef804b643</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Crystallography</topic><topic>Electron microscopy</topic><topic>goniometers</topic><topic>Grain</topic><topic>grain boundaries</topic><topic>Grains</topic><topic>misorientation</topic><topic>Parameter estimation</topic><topic>Transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jeong, H. W.</creatorcontrib><creatorcontrib>Seo, S. M.</creatorcontrib><creatorcontrib>Hong, H. U.</creatorcontrib><creatorcontrib>Yoo, Y. S.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of applied crystallography</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jeong, H. W.</au><au>Seo, S. M.</au><au>Hong, H. U.</au><au>Yoo, Y. S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization of the parameters relating adjacent grains using transmission electron microscopy</atitle><jtitle>Journal of applied crystallography</jtitle><addtitle>J. Appl. Cryst</addtitle><date>2010-12-01</date><risdate>2010</risdate><volume>43</volume><issue>6</issue><spage>1495</spage><epage>1501</epage><pages>1495-1501</pages><issn>1600-5767</issn><issn>0021-8898</issn><eissn>1600-5767</eissn><abstract>A simple technique is presented for characterizing parameters such as the misorientation angle and the axis of rotation between two adjacent grains using transmission electron microscopy (TEM), without the need for an image of the Kikuchi pattern. The technique described makes use of the orthogonal relationship between the tilt axes used in TEM and the axes of the cubic crystal. The relationship was established using the well known triangulation method, in which the direction of the crystal parallel to the beam direction is determined from the measured tilt angles of the three zone axes. The error in measuring the tilt angles of the three zone axes can be evaluated by comparing the measured and crystallographic angles. The angle of deviation from the coincident site lattice (CSL) that results from the measurement error could be reduced by establishing the modified orthogonal relationship between the tilt and crystal axes. The use of this method could provide accurate measurement in real time for indexing a CSL boundary using TEM.</abstract><cop>5 Abbey Square, Chester, Cheshire CH1 2HU, England</cop><pub>International Union of Crystallography</pub><doi>10.1107/S002188981004149X</doi><tpages>7</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1600-5767 |
| ispartof | Journal of applied crystallography, 2010-12, Vol.43 (6), p.1495-1501 |
| issn | 1600-5767 0021-8898 1600-5767 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_861534663 |
| source | Wiley Online Library Journals Frontfile Complete; Alma/SFX Local Collection |
| subjects | Crystallography Electron microscopy goniometers Grain grain boundaries Grains misorientation Parameter estimation Transmission electron microscopy |
| title | Characterization of the parameters relating adjacent grains using transmission electron microscopy |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T08%3A51%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Characterization%20of%20the%20parameters%20relating%20adjacent%20grains%20using%20transmission%20electron%20microscopy&rft.jtitle=Journal%20of%20applied%20crystallography&rft.au=Jeong,%20H.%20W.&rft.date=2010-12-01&rft.volume=43&rft.issue=6&rft.spage=1495&rft.epage=1501&rft.pages=1495-1501&rft.issn=1600-5767&rft.eissn=1600-5767&rft_id=info:doi/10.1107/S002188981004149X&rft_dat=%3Cproquest_cross%3E2199849601%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=814651162&rft_id=info:pmid/&rfr_iscdi=true |