Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip

One of the factors that limit the spatial resolution in atomic force microscopy (AFM) is the physical size of the probe. This limitation is particularly severe when the imaged structures are comparable in size to the tip's apex. The resolution in the AFM is usually enhanced by using sharp tips...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Review of scientific instruments 2011-02, Vol.82 (2), p.023710-023710-7
Hauptverfasser: Martínez, L., Tello, M., Díaz, M., Román, E., Garcia, R., Huttel, Y.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 023710-7
container_issue 2
container_start_page 023710
container_title Review of scientific instruments
container_volume 82
creator Martínez, L.
Tello, M.
Díaz, M.
Román, E.
Garcia, R.
Huttel, Y.
description One of the factors that limit the spatial resolution in atomic force microscopy (AFM) is the physical size of the probe. This limitation is particularly severe when the imaged structures are comparable in size to the tip's apex. The resolution in the AFM is usually enhanced by using sharp tips with high aspect ratios. In the present paper we propose an approach to modify AFM tips that consists of depositing nanoclusters on standard silicon tips. We show that the use of those tips leads to atomic force microscopy images of higher aspect ratios and spatial resolution. The present approach has two major properties. It provides higher aspect-ratio images of nanoscale objects and, at the same time, enables to functionalize the AFM tips by depositing nanoparticles with well-controlled chemical composition.
doi_str_mv 10.1063/1.3556788
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_861204357</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>861204357</sourcerecordid><originalsourceid>FETCH-LOGICAL-c405t-1e4b5eda8fff4f944883a307932b369955c3ff4b152ac4d59b0b7951d9996c4d3</originalsourceid><addsrcrecordid>eNp1kc9q3DAQh0VoaDZJD3mBolvJwalk_bF1KYTQJIVAL8lZyPJ4V8WWXEk-7Lv0YSvvbnrrXAQzH9-g-SF0Q8kdJZJ9pXdMCNm07RnaUNKqqpE1-4A2hDBeyYa3F-gypV-klKD0I7qoKZNUEr5Bf-7TDDZX0WQXsPE9Hk2GaMYqQgrjUroeg98Zb2ECn7HzeAjRAp6cjSHZMO9xt8cmZ2N3zm-xNz7YcUnFkvAWfJFl6A-Mx6vtNMQpLKvHZJx3UHb0OAzY4ORGZwuW3XyNzgczJvh0eq_Q2-P314fn6uXn04-H-5fKciJyRYF3AnrTDsPAB8V52zLDSKNY3TGplBCWlUlHRW0s74XqSNcoQXullCwNdoW-HL1zDL8XSFlPLlkYR-MhLEm3ktaEM9EU8vZIrn9PEQY9RzeZuNeU6DULTfUpi8J-PlmXboL-H_l-_AJ8OwLJurze3__fdoxJH2LSJSZdYmJ_AaNfnDU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>861204357</pqid></control><display><type>article</type><title>Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Martínez, L. ; Tello, M. ; Díaz, M. ; Román, E. ; Garcia, R. ; Huttel, Y.</creator><creatorcontrib>Martínez, L. ; Tello, M. ; Díaz, M. ; Román, E. ; Garcia, R. ; Huttel, Y.</creatorcontrib><description>One of the factors that limit the spatial resolution in atomic force microscopy (AFM) is the physical size of the probe. This limitation is particularly severe when the imaged structures are comparable in size to the tip's apex. The resolution in the AFM is usually enhanced by using sharp tips with high aspect ratios. In the present paper we propose an approach to modify AFM tips that consists of depositing nanoclusters on standard silicon tips. We show that the use of those tips leads to atomic force microscopy images of higher aspect ratios and spatial resolution. The present approach has two major properties. It provides higher aspect-ratio images of nanoscale objects and, at the same time, enables to functionalize the AFM tips by depositing nanoparticles with well-controlled chemical composition.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.3556788</identifier><identifier>PMID: 21361604</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><ispartof>Review of scientific instruments, 2011-02, Vol.82 (2), p.023710-023710-7</ispartof><rights>2011 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c405t-1e4b5eda8fff4f944883a307932b369955c3ff4b152ac4d59b0b7951d9996c4d3</citedby><cites>FETCH-LOGICAL-c405t-1e4b5eda8fff4f944883a307932b369955c3ff4b152ac4d59b0b7951d9996c4d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.3556788$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/21361604$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Martínez, L.</creatorcontrib><creatorcontrib>Tello, M.</creatorcontrib><creatorcontrib>Díaz, M.</creatorcontrib><creatorcontrib>Román, E.</creatorcontrib><creatorcontrib>Garcia, R.</creatorcontrib><creatorcontrib>Huttel, Y.</creatorcontrib><title>Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip</title><title>Review of scientific instruments</title><addtitle>Rev Sci Instrum</addtitle><description>One of the factors that limit the spatial resolution in atomic force microscopy (AFM) is the physical size of the probe. This limitation is particularly severe when the imaged structures are comparable in size to the tip's apex. The resolution in the AFM is usually enhanced by using sharp tips with high aspect ratios. In the present paper we propose an approach to modify AFM tips that consists of depositing nanoclusters on standard silicon tips. We show that the use of those tips leads to atomic force microscopy images of higher aspect ratios and spatial resolution. The present approach has two major properties. It provides higher aspect-ratio images of nanoscale objects and, at the same time, enables to functionalize the AFM tips by depositing nanoparticles with well-controlled chemical composition.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp1kc9q3DAQh0VoaDZJD3mBolvJwalk_bF1KYTQJIVAL8lZyPJ4V8WWXEk-7Lv0YSvvbnrrXAQzH9-g-SF0Q8kdJZJ9pXdMCNm07RnaUNKqqpE1-4A2hDBeyYa3F-gypV-klKD0I7qoKZNUEr5Bf-7TDDZX0WQXsPE9Hk2GaMYqQgrjUroeg98Zb2ECn7HzeAjRAp6cjSHZMO9xt8cmZ2N3zm-xNz7YcUnFkvAWfJFl6A-Mx6vtNMQpLKvHZJx3UHb0OAzY4ORGZwuW3XyNzgczJvh0eq_Q2-P314fn6uXn04-H-5fKciJyRYF3AnrTDsPAB8V52zLDSKNY3TGplBCWlUlHRW0s74XqSNcoQXullCwNdoW-HL1zDL8XSFlPLlkYR-MhLEm3ktaEM9EU8vZIrn9PEQY9RzeZuNeU6DULTfUpi8J-PlmXboL-H_l-_AJ8OwLJurze3__fdoxJH2LSJSZdYmJ_AaNfnDU</recordid><startdate>20110201</startdate><enddate>20110201</enddate><creator>Martínez, L.</creator><creator>Tello, M.</creator><creator>Díaz, M.</creator><creator>Román, E.</creator><creator>Garcia, R.</creator><creator>Huttel, Y.</creator><general>American Institute of Physics</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20110201</creationdate><title>Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip</title><author>Martínez, L. ; Tello, M. ; Díaz, M. ; Román, E. ; Garcia, R. ; Huttel, Y.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c405t-1e4b5eda8fff4f944883a307932b369955c3ff4b152ac4d59b0b7951d9996c4d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Martínez, L.</creatorcontrib><creatorcontrib>Tello, M.</creatorcontrib><creatorcontrib>Díaz, M.</creatorcontrib><creatorcontrib>Román, E.</creatorcontrib><creatorcontrib>Garcia, R.</creatorcontrib><creatorcontrib>Huttel, Y.</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Martínez, L.</au><au>Tello, M.</au><au>Díaz, M.</au><au>Román, E.</au><au>Garcia, R.</au><au>Huttel, Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2011-02-01</date><risdate>2011</risdate><volume>82</volume><issue>2</issue><spage>023710</spage><epage>023710-7</epage><pages>023710-023710-7</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>One of the factors that limit the spatial resolution in atomic force microscopy (AFM) is the physical size of the probe. This limitation is particularly severe when the imaged structures are comparable in size to the tip's apex. The resolution in the AFM is usually enhanced by using sharp tips with high aspect ratios. In the present paper we propose an approach to modify AFM tips that consists of depositing nanoclusters on standard silicon tips. We show that the use of those tips leads to atomic force microscopy images of higher aspect ratios and spatial resolution. The present approach has two major properties. It provides higher aspect-ratio images of nanoscale objects and, at the same time, enables to functionalize the AFM tips by depositing nanoparticles with well-controlled chemical composition.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><pmid>21361604</pmid><doi>10.1063/1.3556788</doi><tpages>1</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0034-6748
ispartof Review of scientific instruments, 2011-02, Vol.82 (2), p.023710-023710-7
issn 0034-6748
1089-7623
language eng
recordid cdi_proquest_miscellaneous_861204357
source AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection
title Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T02%3A50%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Aspect-ratio%20and%20lateral-resolution%20enhancement%20in%20force%20microscopy%20by%20attaching%20nanoclusters%20generated%20by%20an%20ion%20cluster%20source%20at%20the%20end%20of%20a%20silicon%20tip&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Mart%C3%ADnez,%20L.&rft.date=2011-02-01&rft.volume=82&rft.issue=2&rft.spage=023710&rft.epage=023710-7&rft.pages=023710-023710-7&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.3556788&rft_dat=%3Cproquest_cross%3E861204357%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=861204357&rft_id=info:pmid/21361604&rfr_iscdi=true