Metallic transport in a monatomic layer of in on a silicon surface

We have succeeded in detecting metallic transport in a monatomic layer of In on an Si(111) surface, Si(111)-sqrt[7]×sqrt[3]-In surface reconstruction, using the micro-four-point probe method. The In layer exhibited conductivity higher than the minimum metallic conductivity (the Ioffe-Regel criterion...

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Veröffentlicht in:	Physical review letters 2011-03, Vol.106 (11), p.116802-116802, Article 116802
Hauptverfasser:	Yamazaki, Shiro, Hosomura, Yoshikazu, Matsuda, Iwao, Hobara, Rei, Eguchi, Toyoaki, Hasegawa, Yukio, Hasegawa, Shuji
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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