Reduction of hysteresis for carbon nanotube mobility measurements using pulsed characterization
We describe a pulsed measurement technique for suppressing hysteresis for carbon nanotube (CNT) device measurements in air, vacuum, and over a wide temperature range (80-453 K). Varying the gate pulse width and duty cycle probes the relaxation times associated with charge trapping near the CNT, foun...
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Veröffentlicht in: | Nanotechnology 2010-02, Vol.21 (8), p.085702-85702 |
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creator | Estrada, David Dutta, Sumit Liao, Albert Pop, Eric |
description | We describe a pulsed measurement technique for suppressing hysteresis for carbon nanotube (CNT) device measurements in air, vacuum, and over a wide temperature range (80-453 K). Varying the gate pulse width and duty cycle probes the relaxation times associated with charge trapping near the CNT, found to be up to the 0.1-10 s range. Longer off times between voltage pulses enable consistent, hysteresis-free measurements of CNT mobility. A tunneling front model for charge trapping and relaxation is also described, suggesting trap depths up to 4-8 nm for CNTs on SiO2. Pulsed measurements will also be applicable for other nanoscale devices such as graphene, nanowires, or molecular electronics, and could enable probing trap relaxation times in a variety of material system interfaces. |
doi_str_mv | 10.1088/0957-4484/21/8/085702 |
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Varying the gate pulse width and duty cycle probes the relaxation times associated with charge trapping near the CNT, found to be up to the 0.1-10 s range. Longer off times between voltage pulses enable consistent, hysteresis-free measurements of CNT mobility. A tunneling front model for charge trapping and relaxation is also described, suggesting trap depths up to 4-8 nm for CNTs on SiO2. 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Pulsed measurements will also be applicable for other nanoscale devices such as graphene, nanowires, or molecular electronics, and could enable probing trap relaxation times in a variety of material system interfaces.</description><subject>Carbon nanotubes</subject><subject>Charge</subject><subject>Devices</subject><subject>Graphene</subject><subject>Mathematical models</subject><subject>Nanostructure</subject><subject>Nanowires</subject><subject>Relaxation time</subject><subject>Trapping</subject><issn>0957-4484</issn><issn>1361-6528</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqNkU1LxDAQhoMo7rr6E5TcvFg3H02THmXxCxYE0XNI2sSNbJuatIf115u6qxcFPQ3DPO87wzsAnGJ0iZEQc1QynuW5yOcEz1MrGEdkD0wxLXBWMCL2wfSbmYCjGF8RwlgQfAgmBKGSlwJNgXw09VD1zrfQW7jaxN4EE12E1gdYqaDToFWt7wdtYOO1W7t-Axuj4hBMY9o-wiG69gV2wzqaGlYrFVSVTNy7Gl2PwYFVaXKyqzPwfHP9tLjLlg-394urZVal8_qMKG0t4cZizm2hEM0to5gRShCzdZFjrDQrBc_rWlgrEMmFMZpXiGqhSqrpDJxvfbvg3wYTe9m4WJn1WrXGD1EKxooyudE_SU6pKEiJRCLZlqyCjzEYK7vgGhU2EiM5PkGOAcsxYEmwTO3nE5LubLdh0I2pv1VfqScAbQHnu397XvyU_IrKrrb0Ax-5n80</recordid><startdate>20100226</startdate><enddate>20100226</enddate><creator>Estrada, David</creator><creator>Dutta, Sumit</creator><creator>Liao, Albert</creator><creator>Pop, Eric</creator><general>IOP Publishing</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20100226</creationdate><title>Reduction of hysteresis for carbon nanotube mobility measurements using pulsed characterization</title><author>Estrada, David ; Dutta, Sumit ; Liao, Albert ; Pop, Eric</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c484t-2abff27ef177f6a034f531523205fd6411ab59874dd8ff80248eeb7c03b8a93b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Carbon nanotubes</topic><topic>Charge</topic><topic>Devices</topic><topic>Graphene</topic><topic>Mathematical models</topic><topic>Nanostructure</topic><topic>Nanowires</topic><topic>Relaxation time</topic><topic>Trapping</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Estrada, David</creatorcontrib><creatorcontrib>Dutta, Sumit</creatorcontrib><creatorcontrib>Liao, Albert</creatorcontrib><creatorcontrib>Pop, Eric</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Nanotechnology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Estrada, David</au><au>Dutta, Sumit</au><au>Liao, Albert</au><au>Pop, Eric</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reduction of hysteresis for carbon nanotube mobility measurements using pulsed characterization</atitle><jtitle>Nanotechnology</jtitle><addtitle>Nanotechnology</addtitle><date>2010-02-26</date><risdate>2010</risdate><volume>21</volume><issue>8</issue><spage>085702</spage><epage>85702</epage><pages>085702-85702</pages><issn>0957-4484</issn><eissn>1361-6528</eissn><abstract>We describe a pulsed measurement technique for suppressing hysteresis for carbon nanotube (CNT) device measurements in air, vacuum, and over a wide temperature range (80-453 K). 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subjects | Carbon nanotubes Charge Devices Graphene Mathematical models Nanostructure Nanowires Relaxation time Trapping |
title | Reduction of hysteresis for carbon nanotube mobility measurements using pulsed characterization |
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