Cantilever contribution to the total electrostatic force measured with the atomic force microscope

The atomic force microscope (AFM) is a powerful tool for surface imaging at the nanometer scale and surface force measurements in the piconewton range. Among long-range surface forces, the electrostatic forces play a predominant role. They originate if the electric potentials of the substrate and of...

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Veröffentlicht in:	Measurement science & technology 2010-02, Vol.21 (2), p.025502-025502
Hauptverfasser:	Guriyanova, Svetlana, Golovko, Dmytro S, Bonaccurso, Elmar
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopes Atomic force microscopy Confocal Electric potential Electrostatics Force measurement Three dimensional
Online-Zugang:	Volltext
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