Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer
This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of...
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| Veröffentlicht in: | X-Ray Optics and Instrumentation 2010, Vol.2010, p.1-10 |
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| creator | Haugh, Michael J. Stewart, Richard |
| description | This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer. |
| doi_str_mv | 10.1155/2010/583626 |
| format | Article |
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The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.</description><identifier>ISSN: 1687-7632</identifier><identifier>EISSN: 1687-7640</identifier><identifier>DOI: 10.1155/2010/583626</identifier><language>eng</language><publisher>New York: Hindawi Publishing Corporation</publisher><subject>Crystals ; Curved ; DESIGN ; Diffraction ; DOPPLER BROADENING ; Experiments ; Glass substrates ; GONIOMETERS ; Inertial ; INERTIAL CONFINEMENT ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; KEV RANGE ; MICA ; National security ; PLASMA ; Quality ; Spectrometers ; Spectrum analysis ; TESTING ; X-RAY DIFFRACTION ; X-RAY SOURCES ; X-ray Spectrometer, crystal, high-resolution ; X-RAY SPECTROMETERS ; X-rays</subject><ispartof>X-Ray Optics and Instrumentation, 2010, Vol.2010, p.1-10</ispartof><rights>Copyright © 2010 Michael J. Haugh and Richard Stewart.</rights><rights>Copyright © 2010 Michael J. Haugh and Richard Stewart. Michael J. Haugh et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3056-9863c67beab6c1331f9271b269a6f6e26db71abf8d5f844ca3dc3d794fe5fcae3</citedby><cites>FETCH-LOGICAL-c3056-9863c67beab6c1331f9271b269a6f6e26db71abf8d5f844ca3dc3d794fe5fcae3</cites><orcidid>0000-0002-9613-9220</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,881,4010,27900,27901,27902</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/993431$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><contributor>Ice, Gene</contributor><creatorcontrib>Haugh, Michael J.</creatorcontrib><creatorcontrib>Stewart, Richard</creatorcontrib><creatorcontrib>National Security Technologies, LLC (United States)</creatorcontrib><title>Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer</title><title>X-Ray Optics and Instrumentation</title><description>This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.</description><subject>Crystals</subject><subject>Curved</subject><subject>DESIGN</subject><subject>Diffraction</subject><subject>DOPPLER BROADENING</subject><subject>Experiments</subject><subject>Glass substrates</subject><subject>GONIOMETERS</subject><subject>Inertial</subject><subject>INERTIAL CONFINEMENT</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>KEV RANGE</subject><subject>MICA</subject><subject>National security</subject><subject>PLASMA</subject><subject>Quality</subject><subject>Spectrometers</subject><subject>Spectrum analysis</subject><subject>TESTING</subject><subject>X-RAY DIFFRACTION</subject><subject>X-RAY SOURCES</subject><subject>X-ray Spectrometer, crystal, high-resolution</subject><subject>X-RAY SPECTROMETERS</subject><subject>X-rays</subject><issn>1687-7632</issn><issn>1687-7640</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RHX</sourceid><sourceid>BENPR</sourceid><recordid>eNp90c9LwzAUB_AgCs7pyX-gehHUuqRp0_YoRd1AUeYPvIU0fdky2mYmrbL_3oyKBw-e8gif93iPL0LHBF8RkiSTCBM8STLKIraDRoRlaZiyGO_-1jTaRwfOrTD23zgaobcHEK63ul0ERW8_oQoKu3GdqIMnsMrYRrQSAl8EIpjqxTKcgzN132nTXgazRiy2ne_hXGyC5zXIzpoGOrCHaE-J2sHRzztGr7c3L8U0vH-8mxXX96GkOGFhnjEqWVqCKJkklBKVRykpI5YLphhErCpTIkqVVYnK4lgKWklapXmsIFFSAB2jk2GucZ3mTuoO5FKatvWr8DynMSXenA1mbc1HD67jjXYS6lq0YHrHsyRhWY5z5uXpH7kyvW39AR4xTHEapx5dDEha45wFxddWN8JuOMF8mwLfpsCHFLw-H_RSt5X40v_ibxpGhbs</recordid><startdate>2010</startdate><enddate>2010</enddate><creator>Haugh, Michael J.</creator><creator>Stewart, Richard</creator><general>Hindawi Publishing Corporation</general><general>Hindawi Limited</general><scope>RHU</scope><scope>RHW</scope><scope>RHX</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>P5Z</scope><scope>P62</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0002-9613-9220</orcidid></search><sort><creationdate>2010</creationdate><title>Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer</title><author>Haugh, Michael J. ; Stewart, Richard</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3056-9863c67beab6c1331f9271b269a6f6e26db71abf8d5f844ca3dc3d794fe5fcae3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Crystals</topic><topic>Curved</topic><topic>DESIGN</topic><topic>Diffraction</topic><topic>DOPPLER BROADENING</topic><topic>Experiments</topic><topic>Glass substrates</topic><topic>GONIOMETERS</topic><topic>Inertial</topic><topic>INERTIAL CONFINEMENT</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>KEV RANGE</topic><topic>MICA</topic><topic>National security</topic><topic>PLASMA</topic><topic>Quality</topic><topic>Spectrometers</topic><topic>Spectrum analysis</topic><topic>TESTING</topic><topic>X-RAY DIFFRACTION</topic><topic>X-RAY SOURCES</topic><topic>X-ray Spectrometer, crystal, high-resolution</topic><topic>X-RAY SPECTROMETERS</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Haugh, Michael J.</creatorcontrib><creatorcontrib>Stewart, Richard</creatorcontrib><creatorcontrib>National Security Technologies, LLC (United States)</creatorcontrib><collection>Hindawi Publishing Complete</collection><collection>Hindawi Publishing Subscription Journals</collection><collection>Hindawi Publishing Open Access Journals</collection><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection (ProQuest)</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection><jtitle>X-Ray Optics and Instrumentation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Haugh, Michael J.</au><au>Stewart, Richard</au><au>Ice, Gene</au><aucorp>National Security Technologies, LLC (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer</atitle><jtitle>X-Ray Optics and Instrumentation</jtitle><date>2010</date><risdate>2010</risdate><volume>2010</volume><spage>1</spage><epage>10</epage><pages>1-10</pages><issn>1687-7632</issn><eissn>1687-7640</eissn><abstract>This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. 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| source | Wiley Online Library Open Access; EZB-FREE-00999 freely available EZB journals; Alma/SFX Local Collection; Free Full-Text Journals in Chemistry |
| subjects | Crystals Curved DESIGN Diffraction DOPPLER BROADENING Experiments Glass substrates GONIOMETERS Inertial INERTIAL CONFINEMENT INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY KEV RANGE MICA National security PLASMA Quality Spectrometers Spectrum analysis TESTING X-RAY DIFFRACTION X-RAY SOURCES X-ray Spectrometer, crystal, high-resolution X-RAY SPECTROMETERS X-rays |
| title | Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer |
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