Dynamics in ultrathin liquid films studied by simultaneous dielectric spectroscopy (DRS) and organic molecular beam deposition (OMBD)
. Real-time dielectric relaxation spectroscopy for a molecular beam deposited glass forming liquids is proposed as a versatile approach for the study of the dynamic glass transition in geometric confinement. To achieve the highest sensitivity down to monomolecular organic layers in a wide frequency...
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Veröffentlicht in: | The European physical journal. ST, Special topics Special topics, 2010-10, Vol.189 (1), p.181-186 |
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creator | Wübbenhorst, M. Capponi, S. Napolitano, S. Rozanski, S. Couderc, G. Behrnd, N.-R. Hulliger, J. |
description | .
Real-time dielectric relaxation spectroscopy for a molecular beam deposited glass forming liquids is proposed as a versatile approach for the study of the dynamic glass transition in geometric confinement. To achieve the highest sensitivity down to monomolecular organic layers in a wide frequency range (0.1–10
7
Hz) during simultaneous deposition and desorption, we have used μm spaced interdigitated electrodes under ultrahigh vacuum conditions. Experiments using glycerol deposited on fused silica at − 40
∘
C revealed a dielectric glass transition process for a layer thickness as low as 0.7 nm. While its peak position hardly changes upon thickness reduction, a clear broadening is observed that implies an increasing heterogeneous mobility scenario for the thinnest films caused by molecules being part of a reduced (at the substrate) or enhanced (free surface) mobility layer. This finding is supported by desorption experiments that reveal a strong retardation of the desorption rate for films below 1 nm. |
doi_str_mv | 10.1140/epjst/e2010-01321-1 |
format | Article |
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Real-time dielectric relaxation spectroscopy for a molecular beam deposited glass forming liquids is proposed as a versatile approach for the study of the dynamic glass transition in geometric confinement. To achieve the highest sensitivity down to monomolecular organic layers in a wide frequency range (0.1–10
7
Hz) during simultaneous deposition and desorption, we have used μm spaced interdigitated electrodes under ultrahigh vacuum conditions. Experiments using glycerol deposited on fused silica at − 40
∘
C revealed a dielectric glass transition process for a layer thickness as low as 0.7 nm. While its peak position hardly changes upon thickness reduction, a clear broadening is observed that implies an increasing heterogeneous mobility scenario for the thinnest films caused by molecules being part of a reduced (at the substrate) or enhanced (free surface) mobility layer. This finding is supported by desorption experiments that reveal a strong retardation of the desorption rate for films below 1 nm.</description><identifier>ISSN: 1951-6355</identifier><identifier>EISSN: 1951-6401</identifier><identifier>DOI: 10.1140/epjst/e2010-01321-1</identifier><language>eng</language><publisher>Berlin/Heidelberg: Springer-Verlag</publisher><subject>Atomic ; Classical and Continuum Physics ; Condensed Matter Physics ; Deposition ; Desorption ; Dielectrics ; Dynamic tests ; Dynamics ; Glass transition ; Materials Science ; Measurement Science and Instrumentation ; Molecular ; Molecular beams ; Optical and Plasma Physics ; Physics ; Physics and Astronomy ; Regular Article ; Spectroscopy ; Ultrahigh vacuum</subject><ispartof>The European physical journal. ST, Special topics, 2010-10, Vol.189 (1), p.181-186</ispartof><rights>EDP Sciences and Springer 2010</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c399t-2292699990064b4704e286ad09e1c9342f6c586229b2a5ba695aff7266c47a83</citedby><cites>FETCH-LOGICAL-c399t-2292699990064b4704e286ad09e1c9342f6c586229b2a5ba695aff7266c47a83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1140/epjst/e2010-01321-1$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1140/epjst/e2010-01321-1$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,778,782,27907,27908,41471,42540,51302</link.rule.ids></links><search><creatorcontrib>Wübbenhorst, M.</creatorcontrib><creatorcontrib>Capponi, S.</creatorcontrib><creatorcontrib>Napolitano, S.</creatorcontrib><creatorcontrib>Rozanski, S.</creatorcontrib><creatorcontrib>Couderc, G.</creatorcontrib><creatorcontrib>Behrnd, N.-R.</creatorcontrib><creatorcontrib>Hulliger, J.</creatorcontrib><title>Dynamics in ultrathin liquid films studied by simultaneous dielectric spectroscopy (DRS) and organic molecular beam deposition (OMBD)</title><title>The European physical journal. ST, Special topics</title><addtitle>Eur. Phys. J. Spec. Top</addtitle><description>.
Real-time dielectric relaxation spectroscopy for a molecular beam deposited glass forming liquids is proposed as a versatile approach for the study of the dynamic glass transition in geometric confinement. To achieve the highest sensitivity down to monomolecular organic layers in a wide frequency range (0.1–10
7
Hz) during simultaneous deposition and desorption, we have used μm spaced interdigitated electrodes under ultrahigh vacuum conditions. Experiments using glycerol deposited on fused silica at − 40
∘
C revealed a dielectric glass transition process for a layer thickness as low as 0.7 nm. While its peak position hardly changes upon thickness reduction, a clear broadening is observed that implies an increasing heterogeneous mobility scenario for the thinnest films caused by molecules being part of a reduced (at the substrate) or enhanced (free surface) mobility layer. This finding is supported by desorption experiments that reveal a strong retardation of the desorption rate for films below 1 nm.</description><subject>Atomic</subject><subject>Classical and Continuum Physics</subject><subject>Condensed Matter Physics</subject><subject>Deposition</subject><subject>Desorption</subject><subject>Dielectrics</subject><subject>Dynamic tests</subject><subject>Dynamics</subject><subject>Glass transition</subject><subject>Materials Science</subject><subject>Measurement Science and Instrumentation</subject><subject>Molecular</subject><subject>Molecular beams</subject><subject>Optical and Plasma Physics</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Regular Article</subject><subject>Spectroscopy</subject><subject>Ultrahigh vacuum</subject><issn>1951-6355</issn><issn>1951-6401</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp9kL1OwzAUhSMEEqXwBCzeaIdQ24ndeISWP6moEnS3HMcprhI7tZ0hD8B747awcpd7ZH_nSuckyS2C9wjlcKa6nQ8zhSGCKUQZRik6S0aIEZTSHKLzP50Rcplceb-DkFDMslHyvRyMaLX0QBvQN8GJ8BVVo_e9rkCtm9YDH_pKqwqUA_C6jZAwyvYexMdGyeC0BL47COul7QYwWX58ToEwFbBuK0z8bm0E-0Y4UCrRgkp11uugrQGT9fvjcnqdXNSi8ermd4-TzfPTZvGartYvb4uHVSozxkKKMcOUxYGQ5mU-h7nCBRUVZApJluW4ppIUNGIlFqQUlBFR13NMqcznosjGyd3pbOfsvlc-8FZ7qZrmFIgXhNCCMIYjmZ1IGUN5p2reOd0KN3AE-aFyfqycHyvnx8o5iq785PKRNlvl-M72zsRE_9p-AIemiHM</recordid><startdate>20101001</startdate><enddate>20101001</enddate><creator>Wübbenhorst, M.</creator><creator>Capponi, S.</creator><creator>Napolitano, S.</creator><creator>Rozanski, S.</creator><creator>Couderc, G.</creator><creator>Behrnd, N.-R.</creator><creator>Hulliger, J.</creator><general>Springer-Verlag</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20101001</creationdate><title>Dynamics in ultrathin liquid films studied by simultaneous dielectric spectroscopy (DRS) and organic molecular beam deposition (OMBD)</title><author>Wübbenhorst, M. ; Capponi, S. ; Napolitano, S. ; Rozanski, S. ; Couderc, G. ; Behrnd, N.-R. ; Hulliger, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c399t-2292699990064b4704e286ad09e1c9342f6c586229b2a5ba695aff7266c47a83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Atomic</topic><topic>Classical and Continuum Physics</topic><topic>Condensed Matter Physics</topic><topic>Deposition</topic><topic>Desorption</topic><topic>Dielectrics</topic><topic>Dynamic tests</topic><topic>Dynamics</topic><topic>Glass transition</topic><topic>Materials Science</topic><topic>Measurement Science and Instrumentation</topic><topic>Molecular</topic><topic>Molecular beams</topic><topic>Optical and Plasma Physics</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Regular Article</topic><topic>Spectroscopy</topic><topic>Ultrahigh vacuum</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wübbenhorst, M.</creatorcontrib><creatorcontrib>Capponi, S.</creatorcontrib><creatorcontrib>Napolitano, S.</creatorcontrib><creatorcontrib>Rozanski, S.</creatorcontrib><creatorcontrib>Couderc, G.</creatorcontrib><creatorcontrib>Behrnd, N.-R.</creatorcontrib><creatorcontrib>Hulliger, J.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>The European physical journal. ST, Special topics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wübbenhorst, M.</au><au>Capponi, S.</au><au>Napolitano, S.</au><au>Rozanski, S.</au><au>Couderc, G.</au><au>Behrnd, N.-R.</au><au>Hulliger, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dynamics in ultrathin liquid films studied by simultaneous dielectric spectroscopy (DRS) and organic molecular beam deposition (OMBD)</atitle><jtitle>The European physical journal. ST, Special topics</jtitle><stitle>Eur. Phys. J. Spec. Top</stitle><date>2010-10-01</date><risdate>2010</risdate><volume>189</volume><issue>1</issue><spage>181</spage><epage>186</epage><pages>181-186</pages><issn>1951-6355</issn><eissn>1951-6401</eissn><abstract>.
Real-time dielectric relaxation spectroscopy for a molecular beam deposited glass forming liquids is proposed as a versatile approach for the study of the dynamic glass transition in geometric confinement. To achieve the highest sensitivity down to monomolecular organic layers in a wide frequency range (0.1–10
7
Hz) during simultaneous deposition and desorption, we have used μm spaced interdigitated electrodes under ultrahigh vacuum conditions. Experiments using glycerol deposited on fused silica at − 40
∘
C revealed a dielectric glass transition process for a layer thickness as low as 0.7 nm. While its peak position hardly changes upon thickness reduction, a clear broadening is observed that implies an increasing heterogeneous mobility scenario for the thinnest films caused by molecules being part of a reduced (at the substrate) or enhanced (free surface) mobility layer. This finding is supported by desorption experiments that reveal a strong retardation of the desorption rate for films below 1 nm.</abstract><cop>Berlin/Heidelberg</cop><pub>Springer-Verlag</pub><doi>10.1140/epjst/e2010-01321-1</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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source | Springer Nature - Complete Springer Journals |
subjects | Atomic Classical and Continuum Physics Condensed Matter Physics Deposition Desorption Dielectrics Dynamic tests Dynamics Glass transition Materials Science Measurement Science and Instrumentation Molecular Molecular beams Optical and Plasma Physics Physics Physics and Astronomy Regular Article Spectroscopy Ultrahigh vacuum |
title | Dynamics in ultrathin liquid films studied by simultaneous dielectric spectroscopy (DRS) and organic molecular beam deposition (OMBD) |
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