Temperature effects on the chemical composition of nickel–phosphorus alloy thin films
Electroless Ni–P (EN) alloys are widely used as coating materials. Their properties depend on the level of phosphorus present and the extent of thermal treatment. We report the results of two complimentary electronic structure techniques, X-ray absorption near edge structure (XANES) and X-ray photoe...
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| Veröffentlicht in: | Thin solid films 2010-02, Vol.518 (8), p.2045-2049 |
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| creator | Oguocha, I.N.A. Taheri, R. Yannacopoulos, S. Uju, W.A. Sammynaiken, R. Wettig, S. Hu, Y.-F. |
| description | Electroless Ni–P (EN) alloys are widely used as coating materials. Their properties depend on the level of phosphorus present and the extent of thermal treatment. We report the results of two complimentary electronic structure techniques, X-ray absorption near edge structure (XANES) and X-ray photoelectron spectroscopy (XPS), and the site-specific surface chemistry in EN alloys of different phosphorus compositions and thermal treatments. In XANES experiment, absorption at the Ni L
3,2 edge and the P K edge were measured and the P 2p, Ni 2p, and Ni 3p bands were measured by XPS. Heating EN alloys to high temperatures result in a competitive reaction between phosphorus and nickel on the surface for oxygen. There is an increase in the level of phosphates and other forms of phosphorus oxides and a decrease in the oxidized nickel on the surface of the EN alloy thin film. Changes in the electronic structure and chemical composition in the bulk of the EN alloy are not obvious. |
| doi_str_mv | 10.1016/j.tsf.2009.09.007 |
| format | Article |
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3,2 edge and the P K edge were measured and the P 2p, Ni 2p, and Ni 3p bands were measured by XPS. Heating EN alloys to high temperatures result in a competitive reaction between phosphorus and nickel on the surface for oxygen. There is an increase in the level of phosphates and other forms of phosphorus oxides and a decrease in the oxidized nickel on the surface of the EN alloy thin film. Changes in the electronic structure and chemical composition in the bulk of the EN alloy are not obvious.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/j.tsf.2009.09.007</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Chemical composition ; Composition and phase identification ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Electroless deposition ; Electronic structure ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Exact sciences and technology ; Heat treatment ; Nickel ; Ni–P alloy ; Oxide ; Phosphate ; Phosphorus ; Physics ; Surface and interface electron states ; Surface chemistry ; Surface states, band structure, electron density of states ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology ; Thin films ; X-ray absorption near edge structure ; X-ray photoelectron spectroscopy ; X-rays</subject><ispartof>Thin solid films, 2010-02, Vol.518 (8), p.2045-2049</ispartof><rights>2009 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c359t-6727f46f45dc2bd3fc23b149405a9b8f208206c1baa1e99314c6a2acb2456d203</citedby><cites>FETCH-LOGICAL-c359t-6727f46f45dc2bd3fc23b149405a9b8f208206c1baa1e99314c6a2acb2456d203</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.tsf.2009.09.007$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22472480$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Oguocha, I.N.A.</creatorcontrib><creatorcontrib>Taheri, R.</creatorcontrib><creatorcontrib>Yannacopoulos, S.</creatorcontrib><creatorcontrib>Uju, W.A.</creatorcontrib><creatorcontrib>Sammynaiken, R.</creatorcontrib><creatorcontrib>Wettig, S.</creatorcontrib><creatorcontrib>Hu, Y.-F.</creatorcontrib><title>Temperature effects on the chemical composition of nickel–phosphorus alloy thin films</title><title>Thin solid films</title><description>Electroless Ni–P (EN) alloys are widely used as coating materials. Their properties depend on the level of phosphorus present and the extent of thermal treatment. We report the results of two complimentary electronic structure techniques, X-ray absorption near edge structure (XANES) and X-ray photoelectron spectroscopy (XPS), and the site-specific surface chemistry in EN alloys of different phosphorus compositions and thermal treatments. In XANES experiment, absorption at the Ni L
3,2 edge and the P K edge were measured and the P 2p, Ni 2p, and Ni 3p bands were measured by XPS. Heating EN alloys to high temperatures result in a competitive reaction between phosphorus and nickel on the surface for oxygen. There is an increase in the level of phosphates and other forms of phosphorus oxides and a decrease in the oxidized nickel on the surface of the EN alloy thin film. Changes in the electronic structure and chemical composition in the bulk of the EN alloy are not obvious.</description><subject>Chemical composition</subject><subject>Composition and phase identification</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Electroless deposition</subject><subject>Electronic structure</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Exact sciences and technology</subject><subject>Heat treatment</subject><subject>Nickel</subject><subject>Ni–P alloy</subject><subject>Oxide</subject><subject>Phosphate</subject><subject>Phosphorus</subject><subject>Physics</subject><subject>Surface and interface electron states</subject><subject>Surface chemistry</subject><subject>Surface states, band structure, electron density of states</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><subject>Thin films</subject><subject>X-ray absorption near edge structure</subject><subject>X-ray photoelectron spectroscopy</subject><subject>X-rays</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp9kMtKxEAQRRtRcHx8gLtsxFXG6k7nhSsZfMGAG8Vl0-lUMz0m6diVEWbnP_iHfokJM7gUqqhF3XuLOoxdcJhz4Nn1ej6QnQuAcj4V5Adsxou8jEWe8EM2A5AQZ1DCMTshWgMAFyKZsbcXbHsMetgEjNBaNANFvouGFUZmha0zuomMb3tPbnDjwtuoc-Ydm5-v737laeywoUg3jd-OLtdF1jUtnbEjqxvC8_08Za_3dy-Lx3j5_PC0uF3GJknLIc5ykVuZWZnWRlR1Yo1IKi5LCakuq8IKKARkhldacyzLhEuTaaFNJWSa1QKSU3a1y-2D_9ggDap1ZLBpdId-Q6pI0yxPOUxKvlOa4IkCWtUH1-qwVRzUxFCt1chQTQzVVJCPnst9uqYRhA26M47-jELIXMhiyr7Z6XB89dNhUGQcdgZrF0aiqvbunyu_TbiImQ</recordid><startdate>20100201</startdate><enddate>20100201</enddate><creator>Oguocha, I.N.A.</creator><creator>Taheri, R.</creator><creator>Yannacopoulos, S.</creator><creator>Uju, W.A.</creator><creator>Sammynaiken, R.</creator><creator>Wettig, S.</creator><creator>Hu, Y.-F.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20100201</creationdate><title>Temperature effects on the chemical composition of nickel–phosphorus alloy thin films</title><author>Oguocha, I.N.A. ; Taheri, R. ; Yannacopoulos, S. ; Uju, W.A. ; Sammynaiken, R. ; Wettig, S. ; Hu, Y.-F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c359t-6727f46f45dc2bd3fc23b149405a9b8f208206c1baa1e99314c6a2acb2456d203</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Chemical composition</topic><topic>Composition and phase identification</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Electroless deposition</topic><topic>Electronic structure</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Exact sciences and technology</topic><topic>Heat treatment</topic><topic>Nickel</topic><topic>Ni–P alloy</topic><topic>Oxide</topic><topic>Phosphate</topic><topic>Phosphorus</topic><topic>Physics</topic><topic>Surface and interface electron states</topic><topic>Surface chemistry</topic><topic>Surface states, band structure, electron density of states</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><topic>Thin films</topic><topic>X-ray absorption near edge structure</topic><topic>X-ray photoelectron spectroscopy</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oguocha, I.N.A.</creatorcontrib><creatorcontrib>Taheri, R.</creatorcontrib><creatorcontrib>Yannacopoulos, S.</creatorcontrib><creatorcontrib>Uju, W.A.</creatorcontrib><creatorcontrib>Sammynaiken, R.</creatorcontrib><creatorcontrib>Wettig, S.</creatorcontrib><creatorcontrib>Hu, Y.-F.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oguocha, I.N.A.</au><au>Taheri, R.</au><au>Yannacopoulos, S.</au><au>Uju, W.A.</au><au>Sammynaiken, R.</au><au>Wettig, S.</au><au>Hu, Y.-F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Temperature effects on the chemical composition of nickel–phosphorus alloy thin films</atitle><jtitle>Thin solid films</jtitle><date>2010-02-01</date><risdate>2010</risdate><volume>518</volume><issue>8</issue><spage>2045</spage><epage>2049</epage><pages>2045-2049</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>Electroless Ni–P (EN) alloys are widely used as coating materials. Their properties depend on the level of phosphorus present and the extent of thermal treatment. We report the results of two complimentary electronic structure techniques, X-ray absorption near edge structure (XANES) and X-ray photoelectron spectroscopy (XPS), and the site-specific surface chemistry in EN alloys of different phosphorus compositions and thermal treatments. In XANES experiment, absorption at the Ni L
3,2 edge and the P K edge were measured and the P 2p, Ni 2p, and Ni 3p bands were measured by XPS. Heating EN alloys to high temperatures result in a competitive reaction between phosphorus and nickel on the surface for oxygen. There is an increase in the level of phosphates and other forms of phosphorus oxides and a decrease in the oxidized nickel on the surface of the EN alloy thin film. Changes in the electronic structure and chemical composition in the bulk of the EN alloy are not obvious.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.tsf.2009.09.007</doi><tpages>5</tpages></addata></record> |
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| subjects | Chemical composition Composition and phase identification Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electroless deposition Electronic structure Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Heat treatment Nickel Ni–P alloy Oxide Phosphate Phosphorus Physics Surface and interface electron states Surface chemistry Surface states, band structure, electron density of states Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Thin films X-ray absorption near edge structure X-ray photoelectron spectroscopy X-rays |
| title | Temperature effects on the chemical composition of nickel–phosphorus alloy thin films |
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