Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis

▶ X-ray or neutron line profile analysis becomes a powerful tool to characterize dislocation structures, crystallite size, size-distribution and planar faults when diffraction patterns are constructed by the bottom-up approach following physical principles. ▶ The microstructure of archaeological spe...

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Veröffentlicht in:	Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2010-11, Vol.528 (1), p.112-121
Hauptverfasser:	Ribarik, Gabor, Ungar, Tamas
Format:	Artikel
Sprache:	eng
Schlagworte:	Crystal defects Density Diffraction patterns Dislocation density Dislocation structure Microstructure Planar defects Polycrystals Single crystals Software packages Strain anisotropy Texture X-ray line broadening
Online-Zugang:	Volltext
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