Hurst exponent determination for digital speckle patterns in roughness control of metallic surfaces
In this paper, we present a study of metallic surface roughness using the Hurst exponent calculated from speckle pattern. A set of samples was prepared using polishing techniques and the roughness was directly measured by means of an optical profilometer. To study the H exponent, an experiment was p...
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Veröffentlicht in: | Optics and lasers in engineering 2011, Vol.49 (1), p.32-35 |
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container_title | Optics and lasers in engineering |
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creator | Sampaio, A.L. Lobão, D.C. Nunes, L.C.S. dos Santos, P.A.M. Silva, L. Huguenin, J.A.O. |
description | In this paper, we present a study of metallic surface roughness using the Hurst exponent calculated from speckle pattern. A set of samples was prepared using polishing techniques and the roughness was directly measured by means of an optical profilometer. To study the
H exponent, an experiment was performed by illuminating the samples using an expanded laser beam and the surface image was captured by a CCD camera. We applied techniques of the Hurst exponent calculation, traditionally calculated from surface profile, in the digitalized speckle patterns generated by the rough surfaces. We showed a clear dependence of the
H exponent on roughness of the samples. We demonstrated that this tool is very sensitive to defects in the surfaces and can be used for roughness control. |
doi_str_mv | 10.1016/j.optlaseng.2010.09.005 |
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H exponent, an experiment was performed by illuminating the samples using an expanded laser beam and the surface image was captured by a CCD camera. We applied techniques of the Hurst exponent calculation, traditionally calculated from surface profile, in the digitalized speckle patterns generated by the rough surfaces. We showed a clear dependence of the
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H exponent, an experiment was performed by illuminating the samples using an expanded laser beam and the surface image was captured by a CCD camera. We applied techniques of the Hurst exponent calculation, traditionally calculated from surface profile, in the digitalized speckle patterns generated by the rough surfaces. We showed a clear dependence of the
H exponent on roughness of the samples. We demonstrated that this tool is very sensitive to defects in the surfaces and can be used for roughness control.</description><subject>CCD cameras</subject><subject>Control surfaces</subject><subject>Digital image</subject><subject>Exact sciences and technology</subject><subject>Exponents</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Hurst exponent</subject><subject>Imaging and optical processing</subject><subject>Mathematical analysis</subject><subject>Optics</subject><subject>Physics</subject><subject>Profilometers</subject><subject>Roughness</subject><subject>Roughness surfaces</subject><subject>Speckle and moire patterns</subject><subject>Speckle patterns</subject><subject>Surface roughness</subject><issn>0143-8166</issn><issn>1873-0302</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNqFkMFO3DAQhq2qSGyhz4AvVU9Z7DiJnSNCFJCQuLRny9jjrbdeO_U4FX17jBZx5TTS6Pvn13yEXHC25YxPl_ttXmo0CGm37VnbsnnL2PiJbLiSomOC9Z_JhvFBdIpP0yn5grhnLTlwviH2bi1YKTwvOUGq1EGFcgjJ1JAT9blQF3ahmkhxAfsnAl1MbUhCGhIted39ToBIbU615EizpwdoeAyW4lq8sYDn5MSbiPD1bZ6RXz9ufl7fdQ-Pt_fXVw-dFVLWbhIS5BMbJwfOOeX60fHBGwYe1KTkoOZeSua46CczCoC5d8o-jZ5ZZSYLSpyR78e7S8l_V8CqDwEtxGgS5BW1EpzLeZC8kfJI2pIRC3i9lHAw5b_mTL9a1Xv9blW_WtVs1s1qS3576zBoTfTFJBvwPd4LocQ49I27OnLQHv4XoGi0AZIFFwrYql0OH3a9AJrNlMw</recordid><startdate>2011</startdate><enddate>2011</enddate><creator>Sampaio, A.L.</creator><creator>Lobão, D.C.</creator><creator>Nunes, L.C.S.</creator><creator>dos Santos, P.A.M.</creator><creator>Silva, L.</creator><creator>Huguenin, J.A.O.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>2011</creationdate><title>Hurst exponent determination for digital speckle patterns in roughness control of metallic surfaces</title><author>Sampaio, A.L. ; Lobão, D.C. ; Nunes, L.C.S. ; dos Santos, P.A.M. ; Silva, L. ; Huguenin, J.A.O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c377t-637e7b056deddd8d25d14fa0efe86874892770d1326a53ee92d8cb5f0c8a6ce83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>CCD cameras</topic><topic>Control surfaces</topic><topic>Digital image</topic><topic>Exact sciences and technology</topic><topic>Exponents</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Hurst exponent</topic><topic>Imaging and optical processing</topic><topic>Mathematical analysis</topic><topic>Optics</topic><topic>Physics</topic><topic>Profilometers</topic><topic>Roughness</topic><topic>Roughness surfaces</topic><topic>Speckle and moire patterns</topic><topic>Speckle patterns</topic><topic>Surface roughness</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sampaio, A.L.</creatorcontrib><creatorcontrib>Lobão, D.C.</creatorcontrib><creatorcontrib>Nunes, L.C.S.</creatorcontrib><creatorcontrib>dos Santos, P.A.M.</creatorcontrib><creatorcontrib>Silva, L.</creatorcontrib><creatorcontrib>Huguenin, J.A.O.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Optics and lasers in engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sampaio, A.L.</au><au>Lobão, D.C.</au><au>Nunes, L.C.S.</au><au>dos Santos, P.A.M.</au><au>Silva, L.</au><au>Huguenin, J.A.O.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Hurst exponent determination for digital speckle patterns in roughness control of metallic surfaces</atitle><jtitle>Optics and lasers in engineering</jtitle><date>2011</date><risdate>2011</risdate><volume>49</volume><issue>1</issue><spage>32</spage><epage>35</epage><pages>32-35</pages><issn>0143-8166</issn><eissn>1873-0302</eissn><coden>OLENDN</coden><abstract>In this paper, we present a study of metallic surface roughness using the Hurst exponent calculated from speckle pattern. A set of samples was prepared using polishing techniques and the roughness was directly measured by means of an optical profilometer. To study the
H exponent, an experiment was performed by illuminating the samples using an expanded laser beam and the surface image was captured by a CCD camera. We applied techniques of the Hurst exponent calculation, traditionally calculated from surface profile, in the digitalized speckle patterns generated by the rough surfaces. We showed a clear dependence of the
H exponent on roughness of the samples. We demonstrated that this tool is very sensitive to defects in the surfaces and can be used for roughness control.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.optlaseng.2010.09.005</doi><tpages>4</tpages></addata></record> |
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subjects | CCD cameras Control surfaces Digital image Exact sciences and technology Exponents Fundamental areas of phenomenology (including applications) Hurst exponent Imaging and optical processing Mathematical analysis Optics Physics Profilometers Roughness Roughness surfaces Speckle and moire patterns Speckle patterns Surface roughness |
title | Hurst exponent determination for digital speckle patterns in roughness control of metallic surfaces |
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