Effect of electromagnetic fields on integrated microcircuits

We consider the results of investigations on the effect of external electromagnetic fields on integrated microcircuits. We have determined the stability thresholds for microcircuits as a function of the electric field strength, the number of pulses to which they are exposed, and the relative orienta...

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Bibliographische Detailangaben

Veröffentlicht in:	Measurement techniques 1998-04, Vol.41 (4), p.394-397
Hauptverfasser:	Starostenko, V V, Taran, E P, Grigor'ev, E V, Borisov, A A
Format:	Artikel
Sprache:	eng
Schlagworte:	Degradation Electric field strength Electric fields Electromagnetic fields Electromagnetism Exposure Metallizing Orientation Stability Thresholds
Online-Zugang:	Volltext
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