A fast-developing and low-cost characterization and test environment for a double axis resonating micromirror
Testing and characterization of micro-electro-mechanical systems (MEMS) and micro-opto-electro-mechanical systems (MOEMS) can be very challenging due to the multi-domain nature of these devices. Nowadays high volume, high-cost, and accurate measuring systems are necessary to characterize and test ME...
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| Veröffentlicht in: | Microelectronics 2010-11, Vol.41 (11), p.778-788 |
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| container_title | Microelectronics |
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| creator | Battini, Francesco Volpi, Emilio Marchetti, Eleonora Cecchini, Tommaso Sechi, Francesco Fanucci, Luca Hofmann, Ulrich |
| description | Testing and characterization of micro-electro-mechanical systems (MEMS) and micro-opto-electro-mechanical systems (MOEMS) can be very challenging due to the multi-domain nature of these devices. Nowadays high volume, high-cost, and accurate measuring systems are necessary to characterize and test MEMS and MOEMS especially to examine their motions, deflections, and resonance frequencies. This paper presents a fast-developing and low-cost environment for MEMS and MOEMS testing and characterization. The environment is based on a flexible mixed-signal platform named Intelligent Sensor InterFace (ISIF). As a case study we consider the characterization of a double axis scanning micromirror. The testing environment has been validated by comparing measurement results with results obtained by the finite element method simulations performed with Comsol Multiphysics. Finally, these results have been exploited to create an electrical equivalent model of the micromirror. |
| doi_str_mv | 10.1016/j.mejo.2010.07.007 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 1879-2391 |
| ispartof | Microelectronics, 2010-11, Vol.41 (11), p.778-788 |
| issn | 1879-2391 0026-2692 1879-2391 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_831174293 |
| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Computer simulation Deflection Devices Equivalence Fast-developing Low-cost characterization Mathematical analysis Microelectromechanical systems Microelectromechanical systems (MEMS) Microelectronics Micromirror MOEMS Platforms Scanning Testing |
| title | A fast-developing and low-cost characterization and test environment for a double axis resonating micromirror |
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