Accuracy Analysis of Algorithms Adopted in Voltage Dip Measurements
This paper analyzes the accuracy of algorithms commonly adopted in instruments devoted to the detection and characterization of voltage dips (which are also called sags). This analysis is particularly interesting, because the results of dip measurements are utilized for calculation of severity level...
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Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2010-10, Vol.59 (10), p.2652-2659 |
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description | This paper analyzes the accuracy of algorithms commonly adopted in instruments devoted to the detection and characterization of voltage dips (which are also called sags). This analysis is particularly interesting, because the results of dip measurements are utilized for calculation of severity levels and site indexes, which are important parameters not only in the assessment of the quality level of power supply but also in the selection of equipment with proper intrinsic immunity. Instruments for dip measurement still have unresolved technical and theoretical issues related to the characterization of their metrological performances, so it can be found that different instruments are significantly in disagreement in some actual measurements. This paper moves a step into the direction of deepening the knowledge about the measurement of voltage dips, pointing out the limits incident to the adoption of the detection algorithms indicated in the standards. It starts with a discussion about parameters that characterize voltage dips, in agreement with the standard. Then, analytical calculations of some systematic deviations in the event characterization, which are introduced by the most diffused dip detection algorithms, in simplified measurement situations, are presented, underlining their remarkable impact. The obtained relations are experimentally verified on a commercial power quality instrument, forecasting its systematic deviations. |
doi_str_mv | 10.1109/TIM.2010.2045256 |
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This analysis is particularly interesting, because the results of dip measurements are utilized for calculation of severity levels and site indexes, which are important parameters not only in the assessment of the quality level of power supply but also in the selection of equipment with proper intrinsic immunity. Instruments for dip measurement still have unresolved technical and theoretical issues related to the characterization of their metrological performances, so it can be found that different instruments are significantly in disagreement in some actual measurements. This paper moves a step into the direction of deepening the knowledge about the measurement of voltage dips, pointing out the limits incident to the adoption of the detection algorithms indicated in the standards. It starts with a discussion about parameters that characterize voltage dips, in agreement with the standard. Then, analytical calculations of some systematic deviations in the event characterization, which are introduced by the most diffused dip detection algorithms, in simplified measurement situations, are presented, underlining their remarkable impact. The obtained relations are experimentally verified on a commercial power quality instrument, forecasting its systematic deviations.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.2010.2045256</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Accuracy ; Algorithm design and analysis ; Algorithms ; Detection algorithms ; Deviation ; Dipping ; Electric potential ; Instrumentation ; Instruments ; Mathematical analysis ; Measurement accuracy ; Measurement standards ; Particle measurements ; Performance evaluation ; Power measurement ; power quality instrument ; Power supplies ; sag ; Studies ; Voltage ; voltage dip ; Voltage fluctuations ; Voltage measurement</subject><ispartof>IEEE transactions on instrumentation and measurement, 2010-10, Vol.59 (10), p.2652-2659</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Oct 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c323t-799ded870af1968d690504ea7480f8f4a8c390aade3cf063fac208b745cb03d93</citedby><cites>FETCH-LOGICAL-c323t-799ded870af1968d690504ea7480f8f4a8c390aade3cf063fac208b745cb03d93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5445021$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5445021$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gallo, Daniele</creatorcontrib><creatorcontrib>Landi, Carmine</creatorcontrib><creatorcontrib>Luiso, Mario</creatorcontrib><title>Accuracy Analysis of Algorithms Adopted in Voltage Dip Measurements</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>This paper analyzes the accuracy of algorithms commonly adopted in instruments devoted to the detection and characterization of voltage dips (which are also called sags). This analysis is particularly interesting, because the results of dip measurements are utilized for calculation of severity levels and site indexes, which are important parameters not only in the assessment of the quality level of power supply but also in the selection of equipment with proper intrinsic immunity. Instruments for dip measurement still have unresolved technical and theoretical issues related to the characterization of their metrological performances, so it can be found that different instruments are significantly in disagreement in some actual measurements. This paper moves a step into the direction of deepening the knowledge about the measurement of voltage dips, pointing out the limits incident to the adoption of the detection algorithms indicated in the standards. It starts with a discussion about parameters that characterize voltage dips, in agreement with the standard. Then, analytical calculations of some systematic deviations in the event characterization, which are introduced by the most diffused dip detection algorithms, in simplified measurement situations, are presented, underlining their remarkable impact. The obtained relations are experimentally verified on a commercial power quality instrument, forecasting its systematic deviations.</description><subject>Accuracy</subject><subject>Algorithm design and analysis</subject><subject>Algorithms</subject><subject>Detection algorithms</subject><subject>Deviation</subject><subject>Dipping</subject><subject>Electric potential</subject><subject>Instrumentation</subject><subject>Instruments</subject><subject>Mathematical analysis</subject><subject>Measurement accuracy</subject><subject>Measurement standards</subject><subject>Particle measurements</subject><subject>Performance evaluation</subject><subject>Power measurement</subject><subject>power quality instrument</subject><subject>Power supplies</subject><subject>sag</subject><subject>Studies</subject><subject>Voltage</subject><subject>voltage dip</subject><subject>Voltage fluctuations</subject><subject>Voltage measurement</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkDtPwzAUhS0EEqWwI7FYYmAKXMfvMSqvSq1YCqvlOnZJlTTBTob-e1K1YmC6OtJ3jnQ_hG4JPBIC-mk1Xz7mMKYcGM-5OEMTwrnMtBD5OZoAEJVpxsUlukppCwBSMDlBs8K5IVq3x8XO1vtUJdwGXNSbNlb9d5NwUbZd70tc7fBXW_d24_Fz1eGlt2mIvvG7Pl2ji2Dr5G9Od4o-X19Ws_ds8fE2nxWLzNGc9pnUuvSlkmAD0UKVQgMH5q1kCoIKzCpHNVhbeuoCCBqsy0GtJeNuDbTUdIoejrtdbH8Gn3rTVMn5urY73w7JKKIUlYIeyPt_5LYd4vhgMgQUaE4kgZGCI-Vim1L0wXSxamzcj5A5SDWjVHOQak5Sx8rdsVJ57_9wzhiHnNBfCcFxhQ</recordid><startdate>201010</startdate><enddate>201010</enddate><creator>Gallo, Daniele</creator><creator>Landi, Carmine</creator><creator>Luiso, Mario</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>201010</creationdate><title>Accuracy Analysis of Algorithms Adopted in Voltage Dip Measurements</title><author>Gallo, Daniele ; Landi, Carmine ; Luiso, Mario</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c323t-799ded870af1968d690504ea7480f8f4a8c390aade3cf063fac208b745cb03d93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Accuracy</topic><topic>Algorithm design and analysis</topic><topic>Algorithms</topic><topic>Detection algorithms</topic><topic>Deviation</topic><topic>Dipping</topic><topic>Electric potential</topic><topic>Instrumentation</topic><topic>Instruments</topic><topic>Mathematical analysis</topic><topic>Measurement accuracy</topic><topic>Measurement standards</topic><topic>Particle measurements</topic><topic>Performance evaluation</topic><topic>Power measurement</topic><topic>power quality instrument</topic><topic>Power supplies</topic><topic>sag</topic><topic>Studies</topic><topic>Voltage</topic><topic>voltage dip</topic><topic>Voltage fluctuations</topic><topic>Voltage measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gallo, Daniele</creatorcontrib><creatorcontrib>Landi, Carmine</creatorcontrib><creatorcontrib>Luiso, Mario</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gallo, Daniele</au><au>Landi, Carmine</au><au>Luiso, Mario</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Accuracy Analysis of Algorithms Adopted in Voltage Dip Measurements</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2010-10</date><risdate>2010</risdate><volume>59</volume><issue>10</issue><spage>2652</spage><epage>2659</epage><pages>2652-2659</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>This paper analyzes the accuracy of algorithms commonly adopted in instruments devoted to the detection and characterization of voltage dips (which are also called sags). This analysis is particularly interesting, because the results of dip measurements are utilized for calculation of severity levels and site indexes, which are important parameters not only in the assessment of the quality level of power supply but also in the selection of equipment with proper intrinsic immunity. Instruments for dip measurement still have unresolved technical and theoretical issues related to the characterization of their metrological performances, so it can be found that different instruments are significantly in disagreement in some actual measurements. This paper moves a step into the direction of deepening the knowledge about the measurement of voltage dips, pointing out the limits incident to the adoption of the detection algorithms indicated in the standards. It starts with a discussion about parameters that characterize voltage dips, in agreement with the standard. Then, analytical calculations of some systematic deviations in the event characterization, which are introduced by the most diffused dip detection algorithms, in simplified measurement situations, are presented, underlining their remarkable impact. The obtained relations are experimentally verified on a commercial power quality instrument, forecasting its systematic deviations.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIM.2010.2045256</doi><tpages>8</tpages></addata></record> |
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subjects | Accuracy Algorithm design and analysis Algorithms Detection algorithms Deviation Dipping Electric potential Instrumentation Instruments Mathematical analysis Measurement accuracy Measurement standards Particle measurements Performance evaluation Power measurement power quality instrument Power supplies sag Studies Voltage voltage dip Voltage fluctuations Voltage measurement |
title | Accuracy Analysis of Algorithms Adopted in Voltage Dip Measurements |
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