Determination of optical properties of absorbing materials: a generalized scheme

A generalized reflectance method for determination of optical properties of absorbing materials is developed and compared with other reflectance methods. In the present scheme the specimen is coated with dielectric transparent layer(s) and the reflectance ratios are measured. This novel scheme of sp...

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Veröffentlicht in:	Applied Optics 1983-02, Vol.22 (4), p.587-591
Hauptverfasser:	Nagendra, C L, Thutupalli, G K
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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