Determination of optical properties of absorbing materials: a generalized scheme

Determination of optical properties of absorbing materials: a generalized scheme

A generalized reflectance method for determination of optical properties of absorbing materials is developed and compared with other reflectance methods. In the present scheme the specimen is coated with dielectric transparent layer(s) and the reflectance ratios are measured. This novel scheme of sp...

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Veröffentlicht in:Applied Optics 1983-02, Vol.22 (4), p.587-591
Hauptverfasser: Nagendra, C L, Thutupalli, G K
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container_title Applied Optics
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creator Nagendra, C L
Thutupalli, G K
description A generalized reflectance method for determination of optical properties of absorbing materials is developed and compared with other reflectance methods. In the present scheme the specimen is coated with dielectric transparent layer(s) and the reflectance ratios are measured. This novel scheme of specimen preparation and the method of measurement allow the specimen to be free from surface layers and at the same time account for possible effects of surface roughness. It can be applied to a wide variety of materials regardless of their surface conditions and is particularly useful for metals.
doi_str_mv 10.1364/AO.22.000587
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source OSA Publishing; Alma/SFX Local Collection
title Determination of optical properties of absorbing materials: a generalized scheme
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