Backscattered electron imaging of cultured cells: application to electron probe X‐ray microanalysis using a scanning electron microscope

We report a simple method to study the elemental content in cultured human adherent cells by electron probe X‐ray microanalysis with scanning electron microscopy. Cells were adapted to grow on polycarbonate tissue culture cell inserts, washed with distilled water, plunge‐frozen with liquid nitrogen...

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Veröffentlicht in:Journal of microscopy (Oxford) 1997-10, Vol.188 (1), p.72-78
Hauptverfasser: FERNÁNDEZ‐SEGURA, E., CAÑIZARES, F. J., CUBERO, M. A., REVELLES, F., CAMPOS, A.
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Sprache:eng
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