Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints
The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, n...
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Veröffentlicht in: | IEEE transactions on advanced packaging 2010-08, Vol.33 (3), p.702-712 |
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description | The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products. |
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The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.</description><identifier>ISSN: 1521-3323</identifier><identifier>EISSN: 1557-9980</identifier><identifier>DOI: 10.1109/TADVP.2010.2052806</identifier><identifier>CODEN: ITAPFZ</identifier><language>eng</language><publisher>Piscataway, NJ: IEEE</publisher><subject>Adhesive bonding ; Anisotropic conductive adhesive (ACA) ; Anisotropic magnetoresistance ; Anisotropy ; Applied sciences ; Bend tests ; Bonding ; Chips ; Conducting materials ; Conductive adhesives ; Consumer electronics ; Contact resistance ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Failure analysis ; Flexibility ; flexible interconnects ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Integrated circuits ; Physics ; reliability ; Scanning electron microscopy ; Scanning probe microscopes, components and techniques ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Silicon substrates ; Studies ; Temperature ; Testing ; ultra-thin chip-on-flex (UTCOF)</subject><ispartof>IEEE transactions on advanced packaging, 2010-08, Vol.33 (3), p.702-712</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2010</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c357t-3354428c86ed717ed0ae7e5988f09b78d9ba2510ea4714da948d8bc0c0c503503</citedby><cites>FETCH-LOGICAL-c357t-3354428c86ed717ed0ae7e5988f09b78d9ba2510ea4714da948d8bc0c0c503503</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5524039$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5524039$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23143572$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>LU, Su-Tsai</creatorcontrib><creatorcontrib>CHEN, Wen-Hwa</creatorcontrib><title>Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints</title><title>IEEE transactions on advanced packaging</title><addtitle>TADVP</addtitle><description>The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.</description><subject>Adhesive bonding</subject><subject>Anisotropic conductive adhesive (ACA)</subject><subject>Anisotropic magnetoresistance</subject><subject>Anisotropy</subject><subject>Applied sciences</subject><subject>Bend tests</subject><subject>Bonding</subject><subject>Chips</subject><subject>Conducting materials</subject><subject>Conductive adhesives</subject><subject>Consumer electronics</subject><subject>Contact resistance</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Failure analysis</subject><subject>Flexibility</subject><subject>flexible interconnects</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Integrated circuits</subject><subject>Physics</subject><subject>reliability</subject><subject>Scanning electron microscopy</subject><subject>Scanning probe microscopes, components and techniques</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Silicon substrates</subject><subject>Studies</subject><subject>Temperature</subject><subject>Testing</subject><subject>ultra-thin chip-on-flex (UTCOF)</subject><issn>1521-3323</issn><issn>1557-9980</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkU1rHDEMhoeQQr76B5qLIYQmh0n9GdvHYdptEgIpZbc5Dl6PhnWY2BvbW5pLf3s93SWHIIEk9EhIvFX1ieArQrD-Mm--_vpxRXGpKRZU4eu96pAIIWutFd6fckpqxig7qI5SesKYcMXpYfX3J4zOLN3o8isyvkezEf64XR0GtBhzNPV85TxqV25dB19PBLpYzNuH2SW69RmiDd6DzQk9urxCjXcp5BjWzqI2-H5js_sNqOlXkKbkommbS3QXnM_ppPowmDHBx108rhazb_P2pr5_-H7bNve1ZULmcrjgnCqrrqGXREKPDUgQWqkB66VUvV4aKggGwyXhvdFc9WppcTGBWfHj6vN27zqGlw2k3D27ZGEcjYewSZ1UkjLN2USevSOfwib6clxHMJVSYc5JoeiWsjGkFGHo1tE9m_haoG5SpPuvSDcp0u0UKUPnu9UmWTMO0Xjr0tskZYSXb2nhTrecA4C3thCUY6bZP321kvg</recordid><startdate>20100801</startdate><enddate>20100801</enddate><creator>LU, Su-Tsai</creator><creator>CHEN, Wen-Hwa</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20100801</creationdate><title>Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints</title><author>LU, Su-Tsai ; CHEN, Wen-Hwa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c357t-3354428c86ed717ed0ae7e5988f09b78d9ba2510ea4714da948d8bc0c0c503503</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Adhesive bonding</topic><topic>Anisotropic conductive adhesive (ACA)</topic><topic>Anisotropic magnetoresistance</topic><topic>Anisotropy</topic><topic>Applied sciences</topic><topic>Bend tests</topic><topic>Bonding</topic><topic>Chips</topic><topic>Conducting materials</topic><topic>Conductive adhesives</topic><topic>Consumer electronics</topic><topic>Contact resistance</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Failure analysis</topic><topic>Flexibility</topic><topic>flexible interconnects</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Integrated circuits</topic><topic>Physics</topic><topic>reliability</topic><topic>Scanning electron microscopy</topic><topic>Scanning probe microscopes, components and techniques</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Silicon substrates</topic><topic>Studies</topic><topic>Temperature</topic><topic>Testing</topic><topic>ultra-thin chip-on-flex (UTCOF)</topic><toplevel>online_resources</toplevel><creatorcontrib>LU, Su-Tsai</creatorcontrib><creatorcontrib>CHEN, Wen-Hwa</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Xplore</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on advanced packaging</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LU, Su-Tsai</au><au>CHEN, Wen-Hwa</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints</atitle><jtitle>IEEE transactions on advanced packaging</jtitle><stitle>TADVP</stitle><date>2010-08-01</date><risdate>2010</risdate><volume>33</volume><issue>3</issue><spage>702</spage><epage>712</epage><pages>702-712</pages><issn>1521-3323</issn><eissn>1557-9980</eissn><coden>ITAPFZ</coden><abstract>The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.</abstract><cop>Piscataway, NJ</cop><pub>IEEE</pub><doi>10.1109/TADVP.2010.2052806</doi><tpages>11</tpages></addata></record> |
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subjects | Adhesive bonding Anisotropic conductive adhesive (ACA) Anisotropic magnetoresistance Anisotropy Applied sciences Bend tests Bonding Chips Conducting materials Conductive adhesives Consumer electronics Contact resistance Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Failure analysis Flexibility flexible interconnects Instruments, apparatus, components and techniques common to several branches of physics and astronomy Integrated circuits Physics reliability Scanning electron microscopy Scanning probe microscopes, components and techniques Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Silicon substrates Studies Temperature Testing ultra-thin chip-on-flex (UTCOF) |
title | Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints |
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