Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints

The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, n...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on advanced packaging 2010-08, Vol.33 (3), p.702-712
Hauptverfasser: LU, Su-Tsai, CHEN, Wen-Hwa
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 712
container_issue 3
container_start_page 702
container_title IEEE transactions on advanced packaging
container_volume 33
creator LU, Su-Tsai
CHEN, Wen-Hwa
description The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.
doi_str_mv 10.1109/TADVP.2010.2052806
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_787239430</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5524039</ieee_id><sourcerecordid>2720477181</sourcerecordid><originalsourceid>FETCH-LOGICAL-c357t-3354428c86ed717ed0ae7e5988f09b78d9ba2510ea4714da948d8bc0c0c503503</originalsourceid><addsrcrecordid>eNpdkU1rHDEMhoeQQr76B5qLIYQmh0n9GdvHYdptEgIpZbc5Dl6PhnWY2BvbW5pLf3s93SWHIIEk9EhIvFX1ieArQrD-Mm--_vpxRXGpKRZU4eu96pAIIWutFd6fckpqxig7qI5SesKYcMXpYfX3J4zOLN3o8isyvkezEf64XR0GtBhzNPV85TxqV25dB19PBLpYzNuH2SW69RmiDd6DzQk9urxCjXcp5BjWzqI2-H5js_sNqOlXkKbkommbS3QXnM_ppPowmDHBx108rhazb_P2pr5_-H7bNve1ZULmcrjgnCqrrqGXREKPDUgQWqkB66VUvV4aKggGwyXhvdFc9WppcTGBWfHj6vN27zqGlw2k3D27ZGEcjYewSZ1UkjLN2USevSOfwib6clxHMJVSYc5JoeiWsjGkFGHo1tE9m_haoG5SpPuvSDcp0u0UKUPnu9UmWTMO0Xjr0tskZYSXb2nhTrecA4C3thCUY6bZP321kvg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1027780441</pqid></control><display><type>article</type><title>Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints</title><source>IEEE Xplore</source><creator>LU, Su-Tsai ; CHEN, Wen-Hwa</creator><creatorcontrib>LU, Su-Tsai ; CHEN, Wen-Hwa</creatorcontrib><description>The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.</description><identifier>ISSN: 1521-3323</identifier><identifier>EISSN: 1557-9980</identifier><identifier>DOI: 10.1109/TADVP.2010.2052806</identifier><identifier>CODEN: ITAPFZ</identifier><language>eng</language><publisher>Piscataway, NJ: IEEE</publisher><subject>Adhesive bonding ; Anisotropic conductive adhesive (ACA) ; Anisotropic magnetoresistance ; Anisotropy ; Applied sciences ; Bend tests ; Bonding ; Chips ; Conducting materials ; Conductive adhesives ; Consumer electronics ; Contact resistance ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Failure analysis ; Flexibility ; flexible interconnects ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Integrated circuits ; Physics ; reliability ; Scanning electron microscopy ; Scanning probe microscopes, components and techniques ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Silicon substrates ; Studies ; Temperature ; Testing ; ultra-thin chip-on-flex (UTCOF)</subject><ispartof>IEEE transactions on advanced packaging, 2010-08, Vol.33 (3), p.702-712</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2010</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c357t-3354428c86ed717ed0ae7e5988f09b78d9ba2510ea4714da948d8bc0c0c503503</citedby><cites>FETCH-LOGICAL-c357t-3354428c86ed717ed0ae7e5988f09b78d9ba2510ea4714da948d8bc0c0c503503</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5524039$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5524039$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=23143572$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>LU, Su-Tsai</creatorcontrib><creatorcontrib>CHEN, Wen-Hwa</creatorcontrib><title>Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints</title><title>IEEE transactions on advanced packaging</title><addtitle>TADVP</addtitle><description>The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.</description><subject>Adhesive bonding</subject><subject>Anisotropic conductive adhesive (ACA)</subject><subject>Anisotropic magnetoresistance</subject><subject>Anisotropy</subject><subject>Applied sciences</subject><subject>Bend tests</subject><subject>Bonding</subject><subject>Chips</subject><subject>Conducting materials</subject><subject>Conductive adhesives</subject><subject>Consumer electronics</subject><subject>Contact resistance</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Failure analysis</subject><subject>Flexibility</subject><subject>flexible interconnects</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Integrated circuits</subject><subject>Physics</subject><subject>reliability</subject><subject>Scanning electron microscopy</subject><subject>Scanning probe microscopes, components and techniques</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Silicon substrates</subject><subject>Studies</subject><subject>Temperature</subject><subject>Testing</subject><subject>ultra-thin chip-on-flex (UTCOF)</subject><issn>1521-3323</issn><issn>1557-9980</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkU1rHDEMhoeQQr76B5qLIYQmh0n9GdvHYdptEgIpZbc5Dl6PhnWY2BvbW5pLf3s93SWHIIEk9EhIvFX1ieArQrD-Mm--_vpxRXGpKRZU4eu96pAIIWutFd6fckpqxig7qI5SesKYcMXpYfX3J4zOLN3o8isyvkezEf64XR0GtBhzNPV85TxqV25dB19PBLpYzNuH2SW69RmiDd6DzQk9urxCjXcp5BjWzqI2-H5js_sNqOlXkKbkommbS3QXnM_ppPowmDHBx108rhazb_P2pr5_-H7bNve1ZULmcrjgnCqrrqGXREKPDUgQWqkB66VUvV4aKggGwyXhvdFc9WppcTGBWfHj6vN27zqGlw2k3D27ZGEcjYewSZ1UkjLN2USevSOfwib6clxHMJVSYc5JoeiWsjGkFGHo1tE9m_haoG5SpPuvSDcp0u0UKUPnu9UmWTMO0Xjr0tskZYSXb2nhTrecA4C3thCUY6bZP321kvg</recordid><startdate>20100801</startdate><enddate>20100801</enddate><creator>LU, Su-Tsai</creator><creator>CHEN, Wen-Hwa</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20100801</creationdate><title>Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints</title><author>LU, Su-Tsai ; CHEN, Wen-Hwa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c357t-3354428c86ed717ed0ae7e5988f09b78d9ba2510ea4714da948d8bc0c0c503503</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Adhesive bonding</topic><topic>Anisotropic conductive adhesive (ACA)</topic><topic>Anisotropic magnetoresistance</topic><topic>Anisotropy</topic><topic>Applied sciences</topic><topic>Bend tests</topic><topic>Bonding</topic><topic>Chips</topic><topic>Conducting materials</topic><topic>Conductive adhesives</topic><topic>Consumer electronics</topic><topic>Contact resistance</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Failure analysis</topic><topic>Flexibility</topic><topic>flexible interconnects</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Integrated circuits</topic><topic>Physics</topic><topic>reliability</topic><topic>Scanning electron microscopy</topic><topic>Scanning probe microscopes, components and techniques</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Silicon substrates</topic><topic>Studies</topic><topic>Temperature</topic><topic>Testing</topic><topic>ultra-thin chip-on-flex (UTCOF)</topic><toplevel>online_resources</toplevel><creatorcontrib>LU, Su-Tsai</creatorcontrib><creatorcontrib>CHEN, Wen-Hwa</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Xplore</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on advanced packaging</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LU, Su-Tsai</au><au>CHEN, Wen-Hwa</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints</atitle><jtitle>IEEE transactions on advanced packaging</jtitle><stitle>TADVP</stitle><date>2010-08-01</date><risdate>2010</risdate><volume>33</volume><issue>3</issue><spage>702</spage><epage>712</epage><pages>702-712</pages><issn>1521-3323</issn><eissn>1557-9980</eissn><coden>ITAPFZ</coden><abstract>The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.</abstract><cop>Piscataway, NJ</cop><pub>IEEE</pub><doi>10.1109/TADVP.2010.2052806</doi><tpages>11</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1521-3323
ispartof IEEE transactions on advanced packaging, 2010-08, Vol.33 (3), p.702-712
issn 1521-3323
1557-9980
language eng
recordid cdi_proquest_miscellaneous_787239430
source IEEE Xplore
subjects Adhesive bonding
Anisotropic conductive adhesive (ACA)
Anisotropic magnetoresistance
Anisotropy
Applied sciences
Bend tests
Bonding
Chips
Conducting materials
Conductive adhesives
Consumer electronics
Contact resistance
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Failure analysis
Flexibility
flexible interconnects
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Integrated circuits
Physics
reliability
Scanning electron microscopy
Scanning probe microscopes, components and techniques
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Silicon substrates
Studies
Temperature
Testing
ultra-thin chip-on-flex (UTCOF)
title Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T18%3A48%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reliability%20and%20Flexibility%20of%20Ultra-Thin%20Chip-on-Flex%20(UTCOF)%20Interconnects%20With%20Anisotropic%20Conductive%20Adhesive%20(ACA)%20Joints&rft.jtitle=IEEE%20transactions%20on%20advanced%20packaging&rft.au=LU,%20Su-Tsai&rft.date=2010-08-01&rft.volume=33&rft.issue=3&rft.spage=702&rft.epage=712&rft.pages=702-712&rft.issn=1521-3323&rft.eissn=1557-9980&rft.coden=ITAPFZ&rft_id=info:doi/10.1109/TADVP.2010.2052806&rft_dat=%3Cproquest_RIE%3E2720477181%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1027780441&rft_id=info:pmid/&rft_ieee_id=5524039&rfr_iscdi=true