Adhesion energies of Cr thin films on polyimide determined from buckling: Experiment and model
For the realization of flexible electronic devices, the metal–polymer interfaces upon which they are based need to be optimized. These interfaces are prone to fracture in such systems and hence form a weak point. In order to quantify the interfacial adhesion, novel mechanical tests and modeling appr...
Gespeichert in:
Veröffentlicht in: | Acta materialia 2010-09, Vol.58 (16), p.5520-5531 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 5531 |
---|---|
container_issue | 16 |
container_start_page | 5520 |
container_title | Acta materialia |
container_volume | 58 |
creator | Cordill, M.J. Fischer, F.D. Rammerstorfer, F.G. Dehm, G. |
description | For the realization of flexible electronic devices, the metal–polymer interfaces upon which they are based need to be optimized. These interfaces are prone to fracture in such systems and hence form a weak point. In order to quantify the interfacial adhesion, novel mechanical tests and modeling approaches are required. In this study, a tensile testing approach that induces buckling of films by lateral contraction of the substrate is employed to cause delamination of the film. Based on a newly developed energy balance model, the adhesion energy of Cr films on polyimide substrates is determined by measuring the buckle geometry induced by the tensile test. The obtained minimum values for the adhesion energy (about 4.5
J
m
−2) of 50–190
nm thick films compare well to those found in the literature for metal films on polymer substrates. |
doi_str_mv | 10.1016/j.actamat.2010.06.032 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_787059655</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S1359645410003976</els_id><sourcerecordid>787059655</sourcerecordid><originalsourceid>FETCH-LOGICAL-c371t-386ed81489c4c5137ebe72772c69d9e923cfc690bb55aded879aa243f000d2d73</originalsourceid><addsrcrecordid>eNqFUMtOwzAQjBBIlMInIPmCOCX4EccJF1RV5SFV4gJXLNfetC6JXewU0b_HVSuunHY0mtmdnSy7JrggmFR360LpQfVqKChOHK4KzOhJNiK1YDktOTtNmPEmr0penmcXMa4xJlSUeJR9TMwKovUOgYOwtBCRb9E0oGFlHWpt1yfCoY3vdra3BpCBAUJvHRjUBt-jxVZ_dtYt79HsZwPB9uAGpJxBvTfQXWZnreoiXB3nOHt_nL1Nn_P569PLdDLPNRNkyFldgalJWTe61JwwAQsQVAiqq8Y00FCm2wTxYsG5MkkqGqVoyVqMsaFGsHF2e9i7Cf5rC3GQvY0auk458NsoRS0wbyrOk5IflDr4GAO0cpNCq7CTBMt9nXItj3XKfZ0SVzLVmXw3xwsqatW1QTlt45-ZMsJrXO2TPBx0kN79thBk1BacBmMD6EEab_-59AvEN45O</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>787059655</pqid></control><display><type>article</type><title>Adhesion energies of Cr thin films on polyimide determined from buckling: Experiment and model</title><source>Elsevier ScienceDirect Journals</source><creator>Cordill, M.J. ; Fischer, F.D. ; Rammerstorfer, F.G. ; Dehm, G.</creator><creatorcontrib>Cordill, M.J. ; Fischer, F.D. ; Rammerstorfer, F.G. ; Dehm, G.</creatorcontrib><description>For the realization of flexible electronic devices, the metal–polymer interfaces upon which they are based need to be optimized. These interfaces are prone to fracture in such systems and hence form a weak point. In order to quantify the interfacial adhesion, novel mechanical tests and modeling approaches are required. In this study, a tensile testing approach that induces buckling of films by lateral contraction of the substrate is employed to cause delamination of the film. Based on a newly developed energy balance model, the adhesion energy of Cr films on polyimide substrates is determined by measuring the buckle geometry induced by the tensile test. The obtained minimum values for the adhesion energy (about 4.5
J
m
−2) of 50–190
nm thick films compare well to those found in the literature for metal films on polymer substrates.</description><identifier>ISSN: 1359-6454</identifier><identifier>EISSN: 1873-2453</identifier><identifier>DOI: 10.1016/j.actamat.2010.06.032</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Adhesion ; Adhesion tests ; Applied sciences ; Buckling ; Chromium ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Fracture mechanics ; Materials science ; Metals. Metallurgy ; Methods of deposition of films and coatings; film growth and epitaxy ; Physics ; Polyimide resins ; Polymeric films ; Polymers ; Scanning electron microscopy ; Thick films ; Thin films</subject><ispartof>Acta materialia, 2010-09, Vol.58 (16), p.5520-5531</ispartof><rights>2010 Acta Materialia Inc.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c371t-386ed81489c4c5137ebe72772c69d9e923cfc690bb55aded879aa243f000d2d73</citedby><cites>FETCH-LOGICAL-c371t-386ed81489c4c5137ebe72772c69d9e923cfc690bb55aded879aa243f000d2d73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S1359645410003976$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23158067$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Cordill, M.J.</creatorcontrib><creatorcontrib>Fischer, F.D.</creatorcontrib><creatorcontrib>Rammerstorfer, F.G.</creatorcontrib><creatorcontrib>Dehm, G.</creatorcontrib><title>Adhesion energies of Cr thin films on polyimide determined from buckling: Experiment and model</title><title>Acta materialia</title><description>For the realization of flexible electronic devices, the metal–polymer interfaces upon which they are based need to be optimized. These interfaces are prone to fracture in such systems and hence form a weak point. In order to quantify the interfacial adhesion, novel mechanical tests and modeling approaches are required. In this study, a tensile testing approach that induces buckling of films by lateral contraction of the substrate is employed to cause delamination of the film. Based on a newly developed energy balance model, the adhesion energy of Cr films on polyimide substrates is determined by measuring the buckle geometry induced by the tensile test. The obtained minimum values for the adhesion energy (about 4.5
J
m
−2) of 50–190
nm thick films compare well to those found in the literature for metal films on polymer substrates.</description><subject>Adhesion</subject><subject>Adhesion tests</subject><subject>Applied sciences</subject><subject>Buckling</subject><subject>Chromium</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Fracture mechanics</subject><subject>Materials science</subject><subject>Metals. Metallurgy</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Physics</subject><subject>Polyimide resins</subject><subject>Polymeric films</subject><subject>Polymers</subject><subject>Scanning electron microscopy</subject><subject>Thick films</subject><subject>Thin films</subject><issn>1359-6454</issn><issn>1873-2453</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqFUMtOwzAQjBBIlMInIPmCOCX4EccJF1RV5SFV4gJXLNfetC6JXewU0b_HVSuunHY0mtmdnSy7JrggmFR360LpQfVqKChOHK4KzOhJNiK1YDktOTtNmPEmr0penmcXMa4xJlSUeJR9TMwKovUOgYOwtBCRb9E0oGFlHWpt1yfCoY3vdra3BpCBAUJvHRjUBt-jxVZ_dtYt79HsZwPB9uAGpJxBvTfQXWZnreoiXB3nOHt_nL1Nn_P569PLdDLPNRNkyFldgalJWTe61JwwAQsQVAiqq8Y00FCm2wTxYsG5MkkqGqVoyVqMsaFGsHF2e9i7Cf5rC3GQvY0auk458NsoRS0wbyrOk5IflDr4GAO0cpNCq7CTBMt9nXItj3XKfZ0SVzLVmXw3xwsqatW1QTlt45-ZMsJrXO2TPBx0kN79thBk1BacBmMD6EEab_-59AvEN45O</recordid><startdate>20100901</startdate><enddate>20100901</enddate><creator>Cordill, M.J.</creator><creator>Fischer, F.D.</creator><creator>Rammerstorfer, F.G.</creator><creator>Dehm, G.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20100901</creationdate><title>Adhesion energies of Cr thin films on polyimide determined from buckling: Experiment and model</title><author>Cordill, M.J. ; Fischer, F.D. ; Rammerstorfer, F.G. ; Dehm, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c371t-386ed81489c4c5137ebe72772c69d9e923cfc690bb55aded879aa243f000d2d73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Adhesion</topic><topic>Adhesion tests</topic><topic>Applied sciences</topic><topic>Buckling</topic><topic>Chromium</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Fracture mechanics</topic><topic>Materials science</topic><topic>Metals. Metallurgy</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Physics</topic><topic>Polyimide resins</topic><topic>Polymeric films</topic><topic>Polymers</topic><topic>Scanning electron microscopy</topic><topic>Thick films</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cordill, M.J.</creatorcontrib><creatorcontrib>Fischer, F.D.</creatorcontrib><creatorcontrib>Rammerstorfer, F.G.</creatorcontrib><creatorcontrib>Dehm, G.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Acta materialia</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cordill, M.J.</au><au>Fischer, F.D.</au><au>Rammerstorfer, F.G.</au><au>Dehm, G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Adhesion energies of Cr thin films on polyimide determined from buckling: Experiment and model</atitle><jtitle>Acta materialia</jtitle><date>2010-09-01</date><risdate>2010</risdate><volume>58</volume><issue>16</issue><spage>5520</spage><epage>5531</epage><pages>5520-5531</pages><issn>1359-6454</issn><eissn>1873-2453</eissn><abstract>For the realization of flexible electronic devices, the metal–polymer interfaces upon which they are based need to be optimized. These interfaces are prone to fracture in such systems and hence form a weak point. In order to quantify the interfacial adhesion, novel mechanical tests and modeling approaches are required. In this study, a tensile testing approach that induces buckling of films by lateral contraction of the substrate is employed to cause delamination of the film. Based on a newly developed energy balance model, the adhesion energy of Cr films on polyimide substrates is determined by measuring the buckle geometry induced by the tensile test. The obtained minimum values for the adhesion energy (about 4.5
J
m
−2) of 50–190
nm thick films compare well to those found in the literature for metal films on polymer substrates.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.actamat.2010.06.032</doi><tpages>12</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1359-6454 |
ispartof | Acta materialia, 2010-09, Vol.58 (16), p.5520-5531 |
issn | 1359-6454 1873-2453 |
language | eng |
recordid | cdi_proquest_miscellaneous_787059655 |
source | Elsevier ScienceDirect Journals |
subjects | Adhesion Adhesion tests Applied sciences Buckling Chromium Cross-disciplinary physics: materials science rheology Exact sciences and technology Fracture mechanics Materials science Metals. Metallurgy Methods of deposition of films and coatings film growth and epitaxy Physics Polyimide resins Polymeric films Polymers Scanning electron microscopy Thick films Thin films |
title | Adhesion energies of Cr thin films on polyimide determined from buckling: Experiment and model |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T06%3A25%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Adhesion%20energies%20of%20Cr%20thin%20films%20on%20polyimide%20determined%20from%20buckling:%20Experiment%20and%20model&rft.jtitle=Acta%20materialia&rft.au=Cordill,%20M.J.&rft.date=2010-09-01&rft.volume=58&rft.issue=16&rft.spage=5520&rft.epage=5531&rft.pages=5520-5531&rft.issn=1359-6454&rft.eissn=1873-2453&rft_id=info:doi/10.1016/j.actamat.2010.06.032&rft_dat=%3Cproquest_cross%3E787059655%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=787059655&rft_id=info:pmid/&rft_els_id=S1359645410003976&rfr_iscdi=true |