Application of time delay spectrometry for rough surface characterization
This paper describes the design and performance of an ultrasound measurement system, utilizing a swept frequency excitation signal, for analyzing the backscattered signal from planar rough surfaces. The implementation is in the form of a time delay spectrometry (TDS) system operating in reflection m...
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| Veröffentlicht in: | Ultrasonics 2001-03, Vol.39 (2), p.101-108 |
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| creator | Pedersen, P.C. Grebe, A. |
| description | This paper describes the design and performance of an ultrasound measurement system, utilizing a swept frequency excitation signal, for analyzing the backscattered signal from planar rough surfaces. The implementation is in the form of a time delay spectrometry (TDS) system operating in reflection mode whose advantages are improved signal-to-noise ratio even with low peak power relative to conventional pulse-echo methods. Because of simultaneous transmission and reception, the TDS system requires two transducers. The TDS measurement system uses a swept frequency spectrum analyzer as the central analog processing unit. Both planar piston and focused transducers in the low MHz range were used for the measurements. Due to the statistical nature of rough surface backscatter, the mean of several statistically uncorrelated measurements is required to characterize the scattering behavior of a given rough surface. Backscatter data are obtained for a series of planar rough surfaces, in the form of scattering magnitude vs. frequency and vs. incident (=backscattered) angle. Analysis of the results reveals a good correlation between the root-mean-square (RMS) height and mean backscatter magnitude at 0° incident angle, and between the ratio of RMS height to correlation length and the difference in mean backscatter magnitude between 0° and 5°. |
| doi_str_mv | 10.1016/S0041-624X(00)00044-5 |
| format | Article |
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The implementation is in the form of a time delay spectrometry (TDS) system operating in reflection mode whose advantages are improved signal-to-noise ratio even with low peak power relative to conventional pulse-echo methods. Because of simultaneous transmission and reception, the TDS system requires two transducers. The TDS measurement system uses a swept frequency spectrum analyzer as the central analog processing unit. Both planar piston and focused transducers in the low MHz range were used for the measurements. Due to the statistical nature of rough surface backscatter, the mean of several statistically uncorrelated measurements is required to characterize the scattering behavior of a given rough surface. Backscatter data are obtained for a series of planar rough surfaces, in the form of scattering magnitude vs. frequency and vs. incident (=backscattered) angle. 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The implementation is in the form of a time delay spectrometry (TDS) system operating in reflection mode whose advantages are improved signal-to-noise ratio even with low peak power relative to conventional pulse-echo methods. Because of simultaneous transmission and reception, the TDS system requires two transducers. The TDS measurement system uses a swept frequency spectrum analyzer as the central analog processing unit. Both planar piston and focused transducers in the low MHz range were used for the measurements. Due to the statistical nature of rough surface backscatter, the mean of several statistically uncorrelated measurements is required to characterize the scattering behavior of a given rough surface. Backscatter data are obtained for a series of planar rough surfaces, in the form of scattering magnitude vs. frequency and vs. incident (=backscattered) angle. Analysis of the results reveals a good correlation between the root-mean-square (RMS) height and mean backscatter magnitude at 0° incident angle, and between the ratio of RMS height to correlation length and the difference in mean backscatter magnitude between 0° and 5°.</description><subject>Acoustical measurements and instrumentation</subject><subject>Acoustics</subject><subject>Applied sciences</subject><subject>Equipment Design</subject><subject>Exact sciences and technology</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Industrial metrology. Testing</subject><subject>Linear sweep</subject><subject>Mechanical engineering. Machine design</subject><subject>Physics</subject><subject>Remote sensing</subject><subject>RMS height</subject><subject>Rough surface</subject><subject>Surface Properties</subject><subject>Time delay spectrometry</subject><subject>Time Factors</subject><subject>Ultrasonics</subject><subject>Ultrasonography - instrumentation</subject><issn>0041-624X</issn><issn>1874-9968</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqFkE1r3DAQhkVJyG4-fkKLIVDSg5ORLFn2KYSQNgsLObSF3sSsPGpU7JUr2YXNr4_3g_SY0zDwvPMOD2MfOVxz4OXNdwDJ81LIX1cAX2DaZK4-sDmvtMzruqyO2PwNmbHTlP4AcFnx4oTNOBcaSqHnbHHX9623OPiwzoLLBt9R1lCLmyz1ZIcYOhriJnMhZjGMv5-zNEaHljL7jBHtQNG_7NLn7Nhhm-jiMM_Yz68PP-4f8-XTt8X93TK3Uqkh51hToxqhbaGdK60qAAmxcKAr0FRxDUKgqCtBDpoaipW1eiWxbKZ_JcnijH3e3-1j-DtSGkznk6W2xTWFMRmtAQpVwQSqPWhjSCmSM330HcaN4WC2Ds3OodkKMgBm59CoKffpUDCuOmr-pw7SJuDyAGCy2LqIa-vTG1fVQqpt_e2eoknGP0_RJOtpbanxcRJrmuDfeeQVPsaOTQ</recordid><startdate>20010301</startdate><enddate>20010301</enddate><creator>Pedersen, P.C.</creator><creator>Grebe, A.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20010301</creationdate><title>Application of time delay spectrometry for rough surface characterization</title><author>Pedersen, P.C. ; Grebe, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c455t-1a9ed5d27c37ff6c530aeaa3f07807e817022a2982ef0d903bcc7b4a6d6274e43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Acoustical measurements and instrumentation</topic><topic>Acoustics</topic><topic>Applied sciences</topic><topic>Equipment Design</topic><topic>Exact sciences and technology</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Industrial metrology. Testing</topic><topic>Linear sweep</topic><topic>Mechanical engineering. Machine design</topic><topic>Physics</topic><topic>Remote sensing</topic><topic>RMS height</topic><topic>Rough surface</topic><topic>Surface Properties</topic><topic>Time delay spectrometry</topic><topic>Time Factors</topic><topic>Ultrasonics</topic><topic>Ultrasonography - instrumentation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pedersen, P.C.</creatorcontrib><creatorcontrib>Grebe, A.</creatorcontrib><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Ultrasonics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pedersen, P.C.</au><au>Grebe, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Application of time delay spectrometry for rough surface characterization</atitle><jtitle>Ultrasonics</jtitle><addtitle>Ultrasonics</addtitle><date>2001-03-01</date><risdate>2001</risdate><volume>39</volume><issue>2</issue><spage>101</spage><epage>108</epage><pages>101-108</pages><issn>0041-624X</issn><eissn>1874-9968</eissn><coden>ULTRA3</coden><abstract>This paper describes the design and performance of an ultrasound measurement system, utilizing a swept frequency excitation signal, for analyzing the backscattered signal from planar rough surfaces. The implementation is in the form of a time delay spectrometry (TDS) system operating in reflection mode whose advantages are improved signal-to-noise ratio even with low peak power relative to conventional pulse-echo methods. Because of simultaneous transmission and reception, the TDS system requires two transducers. The TDS measurement system uses a swept frequency spectrum analyzer as the central analog processing unit. Both planar piston and focused transducers in the low MHz range were used for the measurements. Due to the statistical nature of rough surface backscatter, the mean of several statistically uncorrelated measurements is required to characterize the scattering behavior of a given rough surface. Backscatter data are obtained for a series of planar rough surfaces, in the form of scattering magnitude vs. frequency and vs. incident (=backscattered) angle. Analysis of the results reveals a good correlation between the root-mean-square (RMS) height and mean backscatter magnitude at 0° incident angle, and between the ratio of RMS height to correlation length and the difference in mean backscatter magnitude between 0° and 5°.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><pmid>11270627</pmid><doi>10.1016/S0041-624X(00)00044-5</doi><tpages>8</tpages></addata></record> |
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| ispartof | Ultrasonics, 2001-03, Vol.39 (2), p.101-108 |
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| language | eng |
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| source | MEDLINE; Access via ScienceDirect (Elsevier) |
| subjects | Acoustical measurements and instrumentation Acoustics Applied sciences Equipment Design Exact sciences and technology Fundamental areas of phenomenology (including applications) Industrial metrology. Testing Linear sweep Mechanical engineering. Machine design Physics Remote sensing RMS height Rough surface Surface Properties Time delay spectrometry Time Factors Ultrasonics Ultrasonography - instrumentation |
| title | Application of time delay spectrometry for rough surface characterization |
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