Influence of high-pressure hydrogen treatment on structural and electrical properties of ZnO thin films

ZnO thin films were treated by high-pressure hydrogen (H 2). Scanning electron microscope (SEM) images show that the surface morphology of ZnO films has been changed significantly by H 2 treatment. X-ray diffraction patterns show that the Zn(OH) 2 phases formed after H 2 treatment. The X-ray photoel...

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Veröffentlicht in:	Applied surface science 2010-09, Vol.256 (22), p.6770-6774
Hauptverfasser:	Li, Chunye, Liang, Hongwei, Zhao, Jianze, Feng, Qiuju, Bian, Jiming, liu, Yang, Shen, Rensheng, Li, Wangcheng, Wu, Guoguang, Du, G.T.
Format:	Artikel
Sprache:	eng
Schlagworte:	Adsorbed layers and thin films Bonding Chemical bonds Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electrical properties Electrical properties of specific thin films Electrical properties of specific thin films and layer structures (multilayers, superlattices, quantum wells, wires, and dots) Electron and ion emission by liquids and solids impact phenomena Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology High-pressure H 2 MOCVD Phases Photoemission and photoelectron spectra Physics Scanning electron microscopy Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Thin films X-rays Zinc oxide Zn(OH) 2 ZnO
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