Effect of Structure and Size on the Electrical Properties of Nanocrystalline WO3 Films

Nanocrystalline WO3 films were grown by reactive magnetron sputter-deposition by varying the substrate temperature in the range of 303(RT)−673 K. The structure and electrical transport properties of WO3 films were evaluated using X-ray diffraction and dc electrical conductivity measurements. The eff...

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Veröffentlicht in:	ACS applied materials & interfaces 2010-09, Vol.2 (9), p.2623-2628
Hauptverfasser:	Vemuri, R.S, Bharathi, K. Kamala, Gullapalli, S.K, Ramana, C.V
Format:	Artikel
Sprache:	eng
Schlagworte:	Electric Conductivity Materials Testing Membranes, Artificial Nanostructures - chemistry Nanostructures - ultrastructure Oxides - chemistry Particle Size Tungsten - chemistry
Online-Zugang:	Volltext
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