4D Shearforce-Based Constant-Distance Mode Scanning Electrochemical Microscopy

4D shearforce-based constant-distance mode scanning electrochemical microscopy (4D SF/CD-SECM) is designed to assess SECM tip currents at several but constant distances to the sample topography at each point of the x,y-scanning grid. The distance dependent signal is achieved by a shearforce interact...

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Veröffentlicht in:	Analytical chemistry (Washington) 2010-09, Vol.82 (18), p.7842-7848
Hauptverfasser:	Nebel, Michaela, Eckhard, Kathrin, Erichsen, Thomas, Schulte, Albert, Schuhmann, Wolfgang
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical chemistry Chemistry Diffusion Electrocatalysis Electrochemical methods Electrochemistry - instrumentation Electrochemistry - methods Electrodes Exact sciences and technology Feasibility Studies Microelectrodes Microscopy - instrumentation Microscopy - methods Oxidation-Reduction Platinum - chemistry Scanning electron microscopy
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