Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr0.35Ti0.65)O3/SrRuO3/SrTiO3 heterostructures

Epitaxial Pb(Zr 0.35 Ti 0.65 )O 3 (PZT) thin films with tetragonal symmetry and thicknesses ranging from 45 to 230 nm were grown at 540 °C on SrRuO 3 -coated (001)SrTiO 3 substrates by pulse-injected metalorganic chemical vapor deposition. The effect of the film thickness on the ferroelectric domain...

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Veröffentlicht in:	Journal of materials science 2009-10, Vol.44 (19), p.5318-5324
Hauptverfasser:	Morioka, Hitoshi, Saito, Keisuke, Yokoyama, Shintaro, Oikawa, Takahiro, Kurosawa, Toshiyuki, Funakubo, Hiroshi
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Classical Mechanics Crystallography and Scattering Methods Dielectric properties Electric fields Epitaxy Ferroelectric domains Ferroelectric materials Ferroelectricity Ferroelectrics Film thickness Heterostructures High resolution Lead zirconate titanates Mapping Materials Science Metalorganic chemical vapor deposition Organic chemistry Polarization Polymer Sciences Solid Mechanics Strontium titanates Structural analysis Substrates Thin films Transmission electron microscopy Volume fraction X-ray diffraction
Online-Zugang:	Volltext
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