Substrate Temperature Effect on Optical Constants of Gd(2)O(3) Thin Films
Effect of substrate temperature on lanthanide oxide material Gd(2)O(3) thin films deposited by e-beam evaporation has been reported in the present work. Optical properties and surface morphology of as deposited films have been measured using spectrophotometry and atomic force microscopy respectively...
Gespeichert in:
| Veröffentlicht in: | Key engineering materials 2010-01, Vol.442, p.96-101 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 101 |
|---|---|
| container_issue | |
| container_start_page | 96 |
| container_title | Key engineering materials |
| container_volume | 442 |
| creator | Wasiq, M F Nadeem, M Y Chollet, F Atiq, S |
| description | Effect of substrate temperature on lanthanide oxide material Gd(2)O(3) thin films deposited by e-beam evaporation has been reported in the present work. Optical properties and surface morphology of as deposited films have been measured using spectrophotometry and atomic force microscopy respectively. Optical constants such as refractive index, extinction coefficient, band gap and Urbach energy have been determined by analysis of experimentally recorded absorption, transmittance and reflection data in wavelength range 200-800nm. Optical band gap energy shows decreasing while Urbach energy shows increasing behavior with increasing temperature. Extinction coefficient and refractive index with varying wavelengths are also calculated. Surface topographies of all samples are studied by atomic force microscope (AFM) and root mean square (RMS) value of roughness is observed increasing with increasing substrate temperature. |
| doi_str_mv | 10.4028/www.scientific.net/KEM.442.96 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_753686936</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>753686936</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_7536869363</originalsourceid><addsrcrecordid>eNqNyrFOwzAUQFEPRaJA_-EtFe1Q145Tk8xVShFCHZq9Mu6zauTYIc9Rfh8GPoDpnuEytpSCl6KottM0cbIeY_bOWx4xb9-bD16WBa_1jM2lkGpTV4W-Zw9EX0IoWcndnL2dx0_Kg8kILXY9_mocEBrn0GZIEU599tYE2KdI2cRMkBy8XlfF-rRSa2hvPsLBh46e2J0zgXDx10f2fGja_XHTD-l7RMqXzpPFEEzENNLlZad0pWul1f_PHy5DSSE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>753686936</pqid></control><display><type>article</type><title>Substrate Temperature Effect on Optical Constants of Gd(2)O(3) Thin Films</title><source>Scientific.net Journals</source><creator>Wasiq, M F ; Nadeem, M Y ; Chollet, F ; Atiq, S</creator><creatorcontrib>Wasiq, M F ; Nadeem, M Y ; Chollet, F ; Atiq, S</creatorcontrib><description>Effect of substrate temperature on lanthanide oxide material Gd(2)O(3) thin films deposited by e-beam evaporation has been reported in the present work. Optical properties and surface morphology of as deposited films have been measured using spectrophotometry and atomic force microscopy respectively. Optical constants such as refractive index, extinction coefficient, band gap and Urbach energy have been determined by analysis of experimentally recorded absorption, transmittance and reflection data in wavelength range 200-800nm. Optical band gap energy shows decreasing while Urbach energy shows increasing behavior with increasing temperature. Extinction coefficient and refractive index with varying wavelengths are also calculated. Surface topographies of all samples are studied by atomic force microscope (AFM) and root mean square (RMS) value of roughness is observed increasing with increasing substrate temperature.</description><identifier>ISSN: 1013-9826</identifier><identifier>DOI: 10.4028/www.scientific.net/KEM.442.96</identifier><language>eng</language><subject>Atomic force microscopes ; Atomic force microscopy ; Coefficients ; Constants ; Deposition ; Energy gap ; Energy transmission ; Evaporation ; Extinction ; Lanthanides ; Mathematical analysis ; Mean square values ; Morphology ; Optical properties ; Oxides ; Reflection ; Refractive index ; Refractivity ; Roots ; Roughness ; Spectrophotometry ; Surface chemistry ; Thin films ; Topography ; Transmittance ; Wavelengths</subject><ispartof>Key engineering materials, 2010-01, Vol.442, p.96-101</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Wasiq, M F</creatorcontrib><creatorcontrib>Nadeem, M Y</creatorcontrib><creatorcontrib>Chollet, F</creatorcontrib><creatorcontrib>Atiq, S</creatorcontrib><title>Substrate Temperature Effect on Optical Constants of Gd(2)O(3) Thin Films</title><title>Key engineering materials</title><description>Effect of substrate temperature on lanthanide oxide material Gd(2)O(3) thin films deposited by e-beam evaporation has been reported in the present work. Optical properties and surface morphology of as deposited films have been measured using spectrophotometry and atomic force microscopy respectively. Optical constants such as refractive index, extinction coefficient, band gap and Urbach energy have been determined by analysis of experimentally recorded absorption, transmittance and reflection data in wavelength range 200-800nm. Optical band gap energy shows decreasing while Urbach energy shows increasing behavior with increasing temperature. Extinction coefficient and refractive index with varying wavelengths are also calculated. Surface topographies of all samples are studied by atomic force microscope (AFM) and root mean square (RMS) value of roughness is observed increasing with increasing substrate temperature.</description><subject>Atomic force microscopes</subject><subject>Atomic force microscopy</subject><subject>Coefficients</subject><subject>Constants</subject><subject>Deposition</subject><subject>Energy gap</subject><subject>Energy transmission</subject><subject>Evaporation</subject><subject>Extinction</subject><subject>Lanthanides</subject><subject>Mathematical analysis</subject><subject>Mean square values</subject><subject>Morphology</subject><subject>Optical properties</subject><subject>Oxides</subject><subject>Reflection</subject><subject>Refractive index</subject><subject>Refractivity</subject><subject>Roots</subject><subject>Roughness</subject><subject>Spectrophotometry</subject><subject>Surface chemistry</subject><subject>Thin films</subject><subject>Topography</subject><subject>Transmittance</subject><subject>Wavelengths</subject><issn>1013-9826</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqNyrFOwzAUQFEPRaJA_-EtFe1Q145Tk8xVShFCHZq9Mu6zauTYIc9Rfh8GPoDpnuEytpSCl6KottM0cbIeY_bOWx4xb9-bD16WBa_1jM2lkGpTV4W-Zw9EX0IoWcndnL2dx0_Kg8kILXY9_mocEBrn0GZIEU599tYE2KdI2cRMkBy8XlfF-rRSa2hvPsLBh46e2J0zgXDx10f2fGja_XHTD-l7RMqXzpPFEEzENNLlZad0pWul1f_PHy5DSSE</recordid><startdate>20100101</startdate><enddate>20100101</enddate><creator>Wasiq, M F</creator><creator>Nadeem, M Y</creator><creator>Chollet, F</creator><creator>Atiq, S</creator><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20100101</creationdate><title>Substrate Temperature Effect on Optical Constants of Gd(2)O(3) Thin Films</title><author>Wasiq, M F ; Nadeem, M Y ; Chollet, F ; Atiq, S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_7536869363</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Atomic force microscopes</topic><topic>Atomic force microscopy</topic><topic>Coefficients</topic><topic>Constants</topic><topic>Deposition</topic><topic>Energy gap</topic><topic>Energy transmission</topic><topic>Evaporation</topic><topic>Extinction</topic><topic>Lanthanides</topic><topic>Mathematical analysis</topic><topic>Mean square values</topic><topic>Morphology</topic><topic>Optical properties</topic><topic>Oxides</topic><topic>Reflection</topic><topic>Refractive index</topic><topic>Refractivity</topic><topic>Roots</topic><topic>Roughness</topic><topic>Spectrophotometry</topic><topic>Surface chemistry</topic><topic>Thin films</topic><topic>Topography</topic><topic>Transmittance</topic><topic>Wavelengths</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wasiq, M F</creatorcontrib><creatorcontrib>Nadeem, M Y</creatorcontrib><creatorcontrib>Chollet, F</creatorcontrib><creatorcontrib>Atiq, S</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Key engineering materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wasiq, M F</au><au>Nadeem, M Y</au><au>Chollet, F</au><au>Atiq, S</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Substrate Temperature Effect on Optical Constants of Gd(2)O(3) Thin Films</atitle><jtitle>Key engineering materials</jtitle><date>2010-01-01</date><risdate>2010</risdate><volume>442</volume><spage>96</spage><epage>101</epage><pages>96-101</pages><issn>1013-9826</issn><abstract>Effect of substrate temperature on lanthanide oxide material Gd(2)O(3) thin films deposited by e-beam evaporation has been reported in the present work. Optical properties and surface morphology of as deposited films have been measured using spectrophotometry and atomic force microscopy respectively. Optical constants such as refractive index, extinction coefficient, band gap and Urbach energy have been determined by analysis of experimentally recorded absorption, transmittance and reflection data in wavelength range 200-800nm. Optical band gap energy shows decreasing while Urbach energy shows increasing behavior with increasing temperature. Extinction coefficient and refractive index with varying wavelengths are also calculated. Surface topographies of all samples are studied by atomic force microscope (AFM) and root mean square (RMS) value of roughness is observed increasing with increasing substrate temperature.</abstract><doi>10.4028/www.scientific.net/KEM.442.96</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1013-9826 |
| ispartof | Key engineering materials, 2010-01, Vol.442, p.96-101 |
| issn | 1013-9826 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_753686936 |
| source | Scientific.net Journals |
| subjects | Atomic force microscopes Atomic force microscopy Coefficients Constants Deposition Energy gap Energy transmission Evaporation Extinction Lanthanides Mathematical analysis Mean square values Morphology Optical properties Oxides Reflection Refractive index Refractivity Roots Roughness Spectrophotometry Surface chemistry Thin films Topography Transmittance Wavelengths |
| title | Substrate Temperature Effect on Optical Constants of Gd(2)O(3) Thin Films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T20%3A31%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Substrate%20Temperature%20Effect%20on%20Optical%20Constants%20of%20Gd(2)O(3)%20Thin%20Films&rft.jtitle=Key%20engineering%20materials&rft.au=Wasiq,%20M%20F&rft.date=2010-01-01&rft.volume=442&rft.spage=96&rft.epage=101&rft.pages=96-101&rft.issn=1013-9826&rft_id=info:doi/10.4028/www.scientific.net/KEM.442.96&rft_dat=%3Cproquest%3E753686936%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=753686936&rft_id=info:pmid/&rfr_iscdi=true |