Method for measuring the mode-index ratio of two regions in a planar waveguide

Method for measuring the mode-index ratio of two regions in a planar waveguide

A method for measuring the mode-index ratio n of two regions of a planar waveguide with an accuracy of better than 2 in 10(5) is presented. Simple and reliable techniques were utilized to produce two contiguous waveguides, with different refractive indices, on a common substrate. The two waveguiding...

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Veröffentlicht in:Applied Optics 1992-03, Vol.31 (9), p.1257-1260
Hauptverfasser: AGAPIOU, G. S, VERBER, C. M
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Sprache:eng
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Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Optical and optoelectronic circuits
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VERBER, C. M
description A method for measuring the mode-index ratio n of two regions of a planar waveguide with an accuracy of better than 2 in 10(5) is presented. Simple and reliable techniques were utilized to produce two contiguous waveguides, with different refractive indices, on a common substrate. The two waveguiding regions were fabricated both in LiNbO(3) and in BK-7 glass by using titanium indiffusion followed by a proton-exchange (TIPE) process and a two-step Ag(+)/Na(+) ion-exchange technique, respectively. The measured mode-index ratios obtained by our method agreed well with values obtained with the conventional prism-coupling technique.
doi_str_mv 10.1364/AO.31.001257
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source Alma/SFX Local Collection; Optica Publishing Group Journals
subjects Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Optical and optoelectronic circuits
title Method for measuring the mode-index ratio of two regions in a planar waveguide
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