Intermittent Contact−Scanning Electrochemical Microscopy (IC−SECM): A New Approach for Tip Positioning and Simultaneous Imaging of Interfacial Topography and Activity
A new scanning electrochemical microscopy (SECM) tip positioning method that allows surface topography and activity to be resolved simultaneously and independently is presented. The tip, controlled by a piezoelectric positioner operated in closed loop, is oscillated normal to the substrate surface....
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Veröffentlicht in: | Analytical chemistry (Washington) 2010-08, Vol.82 (15), p.6334-6337 |
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Sprache: | eng |
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