Intermittent Contact−Scanning Electrochemical Microscopy (IC−SECM): A New Approach for Tip Positioning and Simultaneous Imaging of Interfacial Topography and Activity

A new scanning electrochemical microscopy (SECM) tip positioning method that allows surface topography and activity to be resolved simultaneously and independently is presented. The tip, controlled by a piezoelectric positioner operated in closed loop, is oscillated normal to the substrate surface....

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Veröffentlicht in:Analytical chemistry (Washington) 2010-08, Vol.82 (15), p.6334-6337
Hauptverfasser: M, Kim, Edwards, Martin A, Unwin, Patrick R
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Sprache:eng
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