Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy

Near-field scanning microwave microscopy is employed for quantitative imaging at 4 GHz of the local impedance for monolayer and few-layer graphene. The microwave response of graphene is found to be thickness dependent and determined by the local sheet resistance of the graphene flake. Calibration of...

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Veröffentlicht in:	ACS nano 2010-07, Vol.4 (7), p.3831-3838
Hauptverfasser:	Talanov, Vladimir V., Barga, Christopher Del, Wickey, Lee, Kalichava, Irakli, Gonzales, Edward, Shaner, Eric A., Gin, Aaron V., Kalugin, Nikolai G.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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